Verfügbarkeit: Problem-solving with microbeam analysis

Problem-solving with microbeam analysis:

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Bibliographische Detailangaben
1. Verfasser:	Kiss, Klara (VerfasserIn)
Format:	Buch
Sprache:	English
Veröffentlicht:	Amsterdam Elsevier 1988
Schriftenreihe:	Studies in analytical chemistry 7
Schlagworte:	Electron microscopy Microprobe analysis Elektronenmikroskopie Optische Messung Mikroanalyse Mikroskopie Analytische Chemie Sekundärionen-Massenspektrometrie Spektroskopie Strahlung
Beschreibung:	409 S.
ISBN:	0444989498

Internformat

MARC


LEADER	00000nam a2200000 cb4500
001	BV000843921
003	DE-604
005	19960209
007	t
008	881205s1988 \|\|\|\| 00\|\|\| eng d
020			\|a 0444989498 \|9 0-444-98949-8
035			\|a (OCoLC)16131958
035			\|a (DE-599)BVBBV000843921
040			\|a DE-604 \|b ger \|e rakddb
041	0		\|a eng
049			\|a DE-12
050		0	\|a TA417.23
082	0		\|a 620.1/1295 \|2 19
100	1		\|a Kiss, Klara \|e Verfasser \|4 aut
245	1	0	\|a Problem-solving with microbeam analysis
246	1	3	\|a Problem solving with microbeam analysis
264		1	\|a Amsterdam \|b Elsevier \|c 1988
300			\|a 409 S.
336			\|b txt \|2 rdacontent
337			\|b n \|2 rdamedia
338			\|b nc \|2 rdacarrier
490	1		\|a Studies in analytical chemistry \|v 7
650		4	\|a Electron microscopy
650		4	\|a Microprobe analysis
650	0	7	\|a Elektronenmikroskopie \|0 (DE-588)4014327-2 \|2 gnd \|9 rswk-swf
650	0	7	\|a Optische Messung \|0 (DE-588)4121429-8 \|2 gnd \|9 rswk-swf
650	0	7	\|a Mikroanalyse \|0 (DE-588)4169804-6 \|2 gnd \|9 rswk-swf
650	0	7	\|a Mikroskopie \|0 (DE-588)4039238-7 \|2 gnd \|9 rswk-swf
650	0	7	\|a Analytische Chemie \|0 (DE-588)4129906-1 \|2 gnd \|9 rswk-swf
650	0	7	\|a Sekundärionen-Massenspektrometrie \|0 (DE-588)4077346-2 \|2 gnd \|9 rswk-swf
650	0	7	\|a Spektroskopie \|0 (DE-588)4056138-0 \|2 gnd \|9 rswk-swf
650	0	7	\|a Strahlung \|0 (DE-588)4057849-5 \|2 gnd \|9 rswk-swf
689	0	0	\|a Mikroanalyse \|0 (DE-588)4169804-6 \|D s
689	0	1	\|a Mikroskopie \|0 (DE-588)4039238-7 \|D s
689	0		\|5 DE-604
689	1	0	\|a Mikroanalyse \|0 (DE-588)4169804-6 \|D s
689	1	1	\|a Elektronenmikroskopie \|0 (DE-588)4014327-2 \|D s
689	1		\|5 DE-604
689	2	0	\|a Sekundärionen-Massenspektrometrie \|0 (DE-588)4077346-2 \|D s
689	2		\|5 DE-604
689	3	0	\|a Strahlung \|0 (DE-588)4057849-5 \|D s
689	3		\|8 1\p \|5 DE-604
689	4	0	\|a Spektroskopie \|0 (DE-588)4056138-0 \|D s
689	4		\|8 2\p \|5 DE-604
689	5	0	\|a Optische Messung \|0 (DE-588)4121429-8 \|D s
689	5		\|8 3\p \|5 DE-604
689	6	0	\|a Analytische Chemie \|0 (DE-588)4129906-1 \|D s
689	6		\|8 4\p \|5 DE-604
830		0	\|a Studies in analytical chemistry \|v 7 \|w (DE-604)BV000004069 \|9 7
999			\|a oai:aleph.bib-bvb.de:BVB01-000529842
883	1		\|8 1\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 2\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 3\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 4\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk

Datensatz im Suchindex

_version_	1804115298428649472
any_adam_object
author	Kiss, Klara
author_facet	Kiss, Klara
author_role	aut
author_sort	Kiss, Klara
author_variant	k k kk
building	Verbundindex
bvnumber	BV000843921
callnumber-first	T - Technology
callnumber-label	TA417
callnumber-raw	TA417.23
callnumber-search	TA417.23
callnumber-sort	TA 3417.23
callnumber-subject	TA - General and Civil Engineering
ctrlnum	(OCoLC)16131958 (DE-599)BVBBV000843921
dewey-full	620.1/1295
dewey-hundreds	600 - Technology (Applied sciences)
dewey-ones	620 - Engineering and allied operations
dewey-raw	620.1/1295
dewey-search	620.1/1295
dewey-sort	3620.1 41295
dewey-tens	620 - Engineering and allied operations
format	Book
fullrecord	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02539nam a2200673 cb4500</leader><controlfield tag="001">BV000843921</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">19960209 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">881205s1988 \|\|\|\| 00\|\|\| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0444989498</subfield><subfield code="9">0-444-98949-8</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)16131958</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV000843921</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-12</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TA417.23</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">620.1/1295</subfield><subfield code="2">19</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Kiss, Klara</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Problem-solving with microbeam analysis</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Problem solving with microbeam analysis</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Amsterdam</subfield><subfield code="b">Elsevier</subfield><subfield code="c">1988</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">409 S.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Studies in analytical chemistry</subfield><subfield code="v">7</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microprobe analysis</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Optische Messung</subfield><subfield code="0">(DE-588)4121429-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikroanalyse</subfield><subfield code="0">(DE-588)4169804-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikroskopie</subfield><subfield code="0">(DE-588)4039238-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Analytische Chemie</subfield><subfield code="0">(DE-588)4129906-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Sekundärionen-Massenspektrometrie</subfield><subfield code="0">(DE-588)4077346-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Spektroskopie</subfield><subfield code="0">(DE-588)4056138-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Strahlung</subfield><subfield code="0">(DE-588)4057849-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Mikroanalyse</subfield><subfield code="0">(DE-588)4169804-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Mikroskopie</subfield><subfield code="0">(DE-588)4039238-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Mikroanalyse</subfield><subfield code="0">(DE-588)4169804-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Sekundärionen-Massenspektrometrie</subfield><subfield code="0">(DE-588)4077346-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="3" ind2="0"><subfield code="a">Strahlung</subfield><subfield code="0">(DE-588)4057849-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="4" ind2="0"><subfield code="a">Spektroskopie</subfield><subfield code="0">(DE-588)4056138-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="4" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="5" ind2="0"><subfield code="a">Optische Messung</subfield><subfield code="0">(DE-588)4121429-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="5" ind2=" "><subfield code="8">3\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="6" ind2="0"><subfield code="a">Analytische Chemie</subfield><subfield code="0">(DE-588)4129906-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="6" ind2=" "><subfield code="8">4\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Studies in analytical chemistry</subfield><subfield code="v">7</subfield><subfield code="w">(DE-604)BV000004069</subfield><subfield code="9">7</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-000529842</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">3\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">4\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection>
id	DE-604.BV000843921
illustrated	Not Illustrated
indexdate	2024-07-09T15:20:23Z
institution	BVB
isbn	0444989498
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-000529842
oclc_num	16131958
open_access_boolean
owner	DE-12
owner_facet	DE-12
physical	409 S.
publishDate	1988
publishDateSearch	1988
publishDateSort	1988
publisher	Elsevier
record_format	marc
series	Studies in analytical chemistry
series2	Studies in analytical chemistry
spelling	Kiss, Klara Verfasser aut Problem-solving with microbeam analysis Problem solving with microbeam analysis Amsterdam Elsevier 1988 409 S. txt rdacontent n rdamedia nc rdacarrier Studies in analytical chemistry 7 Electron microscopy Microprobe analysis Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Optische Messung (DE-588)4121429-8 gnd rswk-swf Mikroanalyse (DE-588)4169804-6 gnd rswk-swf Mikroskopie (DE-588)4039238-7 gnd rswk-swf Analytische Chemie (DE-588)4129906-1 gnd rswk-swf Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd rswk-swf Spektroskopie (DE-588)4056138-0 gnd rswk-swf Strahlung (DE-588)4057849-5 gnd rswk-swf Mikroanalyse (DE-588)4169804-6 s Mikroskopie (DE-588)4039238-7 s DE-604 Elektronenmikroskopie (DE-588)4014327-2 s Sekundärionen-Massenspektrometrie (DE-588)4077346-2 s Strahlung (DE-588)4057849-5 s 1\p DE-604 Spektroskopie (DE-588)4056138-0 s 2\p DE-604 Optische Messung (DE-588)4121429-8 s 3\p DE-604 Analytische Chemie (DE-588)4129906-1 s 4\p DE-604 Studies in analytical chemistry 7 (DE-604)BV000004069 7 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Kiss, Klara Problem-solving with microbeam analysis Studies in analytical chemistry Electron microscopy Microprobe analysis Elektronenmikroskopie (DE-588)4014327-2 gnd Optische Messung (DE-588)4121429-8 gnd Mikroanalyse (DE-588)4169804-6 gnd Mikroskopie (DE-588)4039238-7 gnd Analytische Chemie (DE-588)4129906-1 gnd Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd Spektroskopie (DE-588)4056138-0 gnd Strahlung (DE-588)4057849-5 gnd
subject_GND	(DE-588)4014327-2 (DE-588)4121429-8 (DE-588)4169804-6 (DE-588)4039238-7 (DE-588)4129906-1 (DE-588)4077346-2 (DE-588)4056138-0 (DE-588)4057849-5
title	Problem-solving with microbeam analysis
title_alt	Problem solving with microbeam analysis
title_auth	Problem-solving with microbeam analysis
title_exact_search	Problem-solving with microbeam analysis
title_full	Problem-solving with microbeam analysis
title_fullStr	Problem-solving with microbeam analysis
title_full_unstemmed	Problem-solving with microbeam analysis
title_short	Problem-solving with microbeam analysis
title_sort	problem solving with microbeam analysis
topic	Electron microscopy Microprobe analysis Elektronenmikroskopie (DE-588)4014327-2 gnd Optische Messung (DE-588)4121429-8 gnd Mikroanalyse (DE-588)4169804-6 gnd Mikroskopie (DE-588)4039238-7 gnd Analytische Chemie (DE-588)4129906-1 gnd Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd Spektroskopie (DE-588)4056138-0 gnd Strahlung (DE-588)4057849-5 gnd
topic_facet	Electron microscopy Microprobe analysis Elektronenmikroskopie Optische Messung Mikroanalyse Mikroskopie Analytische Chemie Sekundärionen-Massenspektrometrie Spektroskopie Strahlung
volume_link	(DE-604)BV000004069
work_keys_str_mv	AT kissklara problemsolvingwithmicrobeamanalysis

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