Scanning electron microscopy: physics of image formation and microanalysis
Saved in:
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Berlin [u.a.]
Springer
1985
|
| Series: | Springer series in optical sciences
45 |
| Subjects: | |
| Online Access: | Inhaltsverzeichnis |
| Physical Description: | XVIII, 457 S. Ill., graph. Darst. |
| ISBN: | 3540135308 0387135308 |
Staff View
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| id | DE-604.BV000437612 |
| illustrated | Illustrated |
| indexdate | 2025-05-20T10:00:34Z |
| institution | BVB |
| isbn | 3540135308 0387135308 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-000271057 |
| oclc_num | 720973288 |
| open_access_boolean | |
| owner | DE-12 DE-384 DE-703 DE-898 DE-BY-UBR DE-355 DE-BY-UBR DE-522 DE-526 DE-634 DE-11 DE-188 DE-83 DE-29T |
| owner_facet | DE-12 DE-384 DE-703 DE-898 DE-BY-UBR DE-355 DE-BY-UBR DE-522 DE-526 DE-634 DE-11 DE-188 DE-83 DE-29T |
| physical | XVIII, 457 S. Ill., graph. Darst. |
| publishDate | 1985 |
| publishDateSearch | 1985 |
| publishDateSort | 1985 |
| publisher | Springer |
| record_format | marc |
| series | Springer series in optical sciences |
| series2 | Springer series in optical sciences |
| spelling | Reimer, Ludwig 1928- Verfasser (DE-588)13230130X aut Scanning electron microscopy physics of image formation and microanalysis Ludwig Reimer Berlin [u.a.] Springer 1985 XVIII, 457 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Springer series in optical sciences 45 Microscopy, Electron, Scanning Scanning electron microscopy Rasterelektronenmikroskopie (DE-588)4048455-5 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 s DE-604 Erscheint auch als Online-Ausgabe 978-3-662-13562-4 Springer series in optical sciences 45 (DE-604)BV000000237 45 http://www3.ub.tu-berlin.de/ihv/000007425.pdf Inhaltsverzeichnis |
| spellingShingle | Reimer, Ludwig 1928- Scanning electron microscopy physics of image formation and microanalysis Springer series in optical sciences Microscopy, Electron, Scanning Scanning electron microscopy Rasterelektronenmikroskopie (DE-588)4048455-5 gnd |
| subject_GND | (DE-588)4048455-5 |
| title | Scanning electron microscopy physics of image formation and microanalysis |
| title_auth | Scanning electron microscopy physics of image formation and microanalysis |
| title_exact_search | Scanning electron microscopy physics of image formation and microanalysis |
| title_full | Scanning electron microscopy physics of image formation and microanalysis Ludwig Reimer |
| title_fullStr | Scanning electron microscopy physics of image formation and microanalysis Ludwig Reimer |
| title_full_unstemmed | Scanning electron microscopy physics of image formation and microanalysis Ludwig Reimer |
| title_short | Scanning electron microscopy |
| title_sort | scanning electron microscopy physics of image formation and microanalysis |
| title_sub | physics of image formation and microanalysis |
| topic | Microscopy, Electron, Scanning Scanning electron microscopy Rasterelektronenmikroskopie (DE-588)4048455-5 gnd |
| topic_facet | Microscopy, Electron, Scanning Scanning electron microscopy Rasterelektronenmikroskopie |
| url | http://www3.ub.tu-berlin.de/ihv/000007425.pdf |
| volume_link | (DE-604)BV000000237 |
| work_keys_str_mv | AT reimerludwig scanningelectronmicroscopyphysicsofimageformationandmicroanalysis |