Scanning electron microscopy: physics of image formation and microanalysis
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Berlin [u.a.]
Springer
1985
|
| Schriftenreihe: | Springer series in optical sciences
45 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | XVIII, 457 S. Ill., graph. Darst. |
| ISBN: | 3540135308 0387135308 |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV000437612 | ||
| 003 | DE-604 | ||
| 005 | 20220121 | ||
| 007 | t | ||
| 008 | 870612s1985 ad|| |||| 00||| eng d | ||
| 020 | |a 3540135308 |9 3-540-13530-8 | ||
| 020 | |a 0387135308 |9 0-387-13530-8 | ||
| 035 | |a (OCoLC)720973288 | ||
| 035 | |a (DE-599)BVBBV000437612 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-12 |a DE-384 |a DE-703 |a DE-898 |a DE-355 |a DE-522 |a DE-526 |a DE-634 |a DE-11 |a DE-188 |a DE-B768 |a DE-83 |a DE-29T | ||
| 050 | 0 | |a QH212.S3 | |
| 082 | 0 | |a 535/.3325 |2 19 | |
| 084 | |a UH 5100 |0 (DE-625)145654: |2 rvk | ||
| 084 | |a UH 6300 |0 (DE-625)159498: |2 rvk | ||
| 084 | |a UH 6310 |0 (DE-625)159500: |2 rvk | ||
| 084 | |a PHY 135f |2 stub | ||
| 100 | 1 | |a Reimer, Ludwig |d 1928- |e Verfasser |0 (DE-588)13230130X |4 aut | |
| 245 | 1 | 0 | |a Scanning electron microscopy |b physics of image formation and microanalysis |c Ludwig Reimer |
| 264 | 1 | |a Berlin [u.a.] |b Springer |c 1985 | |
| 300 | |a XVIII, 457 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Springer series in optical sciences |v 45 | |
| 650 | 4 | |a Microscopy, Electron, Scanning | |
| 650 | 4 | |a Scanning electron microscopy | |
| 650 | 0 | 7 | |a Rasterelektronenmikroskopie |0 (DE-588)4048455-5 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Rasterelektronenmikroskopie |0 (DE-588)4048455-5 |D s |
| 689 | 0 | |5 DE-604 | |
| 776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe |z 978-3-662-13562-4 |
| 830 | 0 | |a Springer series in optical sciences |v 45 |w (DE-604)BV000000237 |9 45 | |
| 856 | 4 | |u http://www3.ub.tu-berlin.de/ihv/000007425.pdf |3 Inhaltsverzeichnis | |
Datensatz im Suchindex
| _version_ | 1805082624419430400 |
|---|---|
| adam_text | |
| any_adam_object | |
| author | Reimer, Ludwig 1928- |
| author_GND | (DE-588)13230130X |
| author_facet | Reimer, Ludwig 1928- |
| author_role | aut |
| author_sort | Reimer, Ludwig 1928- |
| author_variant | l r lr |
| building | Verbundindex |
| bvnumber | BV000437612 |
| callnumber-first | Q - Science |
| callnumber-label | QH212 |
| callnumber-raw | QH212.S3 |
| callnumber-search | QH212.S3 |
| callnumber-sort | QH 3212 S3 |
| callnumber-subject | QH - Natural History and Biology |
| classification_rvk | UH 5100 UH 6300 UH 6310 |
| classification_tum | PHY 135f |
| ctrlnum | (OCoLC)720973288 (DE-599)BVBBV000437612 |
| dewey-full | 535/.3325 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 535 - Light and related radiation |
| dewey-raw | 535/.3325 |
| dewey-search | 535/.3325 |
| dewey-sort | 3535 43325 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nam a2200000 cb4500</leader><controlfield tag="001">BV000437612</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20220121</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">870612s1985 ad|| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">3540135308</subfield><subfield code="9">3-540-13530-8</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0387135308</subfield><subfield code="9">0-387-13530-8</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)720973288</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV000437612</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-12</subfield><subfield code="a">DE-384</subfield><subfield code="a">DE-703</subfield><subfield code="a">DE-898</subfield><subfield code="a">DE-355</subfield><subfield code="a">DE-522</subfield><subfield code="a">DE-526</subfield><subfield code="a">DE-634</subfield><subfield code="a">DE-11</subfield><subfield code="a">DE-188</subfield><subfield code="a">DE-B768</subfield><subfield code="a">DE-83</subfield><subfield code="a">DE-29T</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QH212.S3</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">535/.3325</subfield><subfield code="2">19</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 5100</subfield><subfield code="0">(DE-625)145654:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6300</subfield><subfield code="0">(DE-625)159498:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6310</subfield><subfield code="0">(DE-625)159500:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 135f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Reimer, Ludwig</subfield><subfield code="d">1928-</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)13230130X</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Scanning electron microscopy</subfield><subfield code="b">physics of image formation and microanalysis</subfield><subfield code="c">Ludwig Reimer</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Berlin [u.a.]</subfield><subfield code="b">Springer</subfield><subfield code="c">1985</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XVIII, 457 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Springer series in optical sciences</subfield><subfield code="v">45</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microscopy, Electron, Scanning</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Scanning electron microscopy</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Rasterelektronenmikroskopie</subfield><subfield code="0">(DE-588)4048455-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Rasterelektronenmikroskopie</subfield><subfield code="0">(DE-588)4048455-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Online-Ausgabe</subfield><subfield code="z">978-3-662-13562-4</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Springer series in optical sciences</subfield><subfield code="v">45</subfield><subfield code="w">(DE-604)BV000000237</subfield><subfield code="9">45</subfield></datafield><datafield tag="856" ind1="4" ind2=" "><subfield code="u">http://www3.ub.tu-berlin.de/ihv/000007425.pdf</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield></record></collection> |
| id | DE-604.BV000437612 |
| illustrated | Illustrated |
| indexdate | 2024-07-20T07:35:37Z |
| institution | BVB |
| isbn | 3540135308 0387135308 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-000271057 |
| oclc_num | 720973288 |
| open_access_boolean | |
| owner | DE-12 DE-384 DE-703 DE-898 DE-BY-UBR DE-355 DE-BY-UBR DE-522 DE-526 DE-634 DE-11 DE-188 DE-B768 DE-83 DE-29T |
| owner_facet | DE-12 DE-384 DE-703 DE-898 DE-BY-UBR DE-355 DE-BY-UBR DE-522 DE-526 DE-634 DE-11 DE-188 DE-B768 DE-83 DE-29T |
| physical | XVIII, 457 S. Ill., graph. Darst. |
| publishDate | 1985 |
| publishDateSearch | 1985 |
| publishDateSort | 1985 |
| publisher | Springer |
| record_format | marc |
| series | Springer series in optical sciences |
| series2 | Springer series in optical sciences |
| spelling | Reimer, Ludwig 1928- Verfasser (DE-588)13230130X aut Scanning electron microscopy physics of image formation and microanalysis Ludwig Reimer Berlin [u.a.] Springer 1985 XVIII, 457 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Springer series in optical sciences 45 Microscopy, Electron, Scanning Scanning electron microscopy Rasterelektronenmikroskopie (DE-588)4048455-5 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 s DE-604 Erscheint auch als Online-Ausgabe 978-3-662-13562-4 Springer series in optical sciences 45 (DE-604)BV000000237 45 http://www3.ub.tu-berlin.de/ihv/000007425.pdf Inhaltsverzeichnis |
| spellingShingle | Reimer, Ludwig 1928- Scanning electron microscopy physics of image formation and microanalysis Springer series in optical sciences Microscopy, Electron, Scanning Scanning electron microscopy Rasterelektronenmikroskopie (DE-588)4048455-5 gnd |
| subject_GND | (DE-588)4048455-5 |
| title | Scanning electron microscopy physics of image formation and microanalysis |
| title_auth | Scanning electron microscopy physics of image formation and microanalysis |
| title_exact_search | Scanning electron microscopy physics of image formation and microanalysis |
| title_full | Scanning electron microscopy physics of image formation and microanalysis Ludwig Reimer |
| title_fullStr | Scanning electron microscopy physics of image formation and microanalysis Ludwig Reimer |
| title_full_unstemmed | Scanning electron microscopy physics of image formation and microanalysis Ludwig Reimer |
| title_short | Scanning electron microscopy |
| title_sort | scanning electron microscopy physics of image formation and microanalysis |
| title_sub | physics of image formation and microanalysis |
| topic | Microscopy, Electron, Scanning Scanning electron microscopy Rasterelektronenmikroskopie (DE-588)4048455-5 gnd |
| topic_facet | Microscopy, Electron, Scanning Scanning electron microscopy Rasterelektronenmikroskopie |
| url | http://www3.ub.tu-berlin.de/ihv/000007425.pdf |
| volume_link | (DE-604)BV000000237 |
| work_keys_str_mv | AT reimerludwig scanningelectronmicroscopyphysicsofimageformationandmicroanalysis |