Mikroprozessorsysteme: Zuverlässigkeit, Testverfahren, Fehlertoleranz
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | German |
| Veröffentlicht: |
Berlin u.a.
Springer
1984
|
| Schlagworte: | |
| Beschreibung: | 203 S. |
| ISBN: | 3540129960 0387129960 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV000228592 | ||
| 003 | DE-604 | ||
| 005 | 20231020 | ||
| 007 | t | ||
| 008 | 870612s1984 |||| 00||| ger d | ||
| 020 | |a 3540129960 |9 3-540-12996-0 | ||
| 020 | |a 0387129960 |9 0-387-12996-0 | ||
| 035 | |a (OCoLC)12668060 | ||
| 035 | |a (DE-599)BVBBV000228592 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a ger | |
| 049 | |a DE-12 |a DE-19 |a DE-91 |a DE-91G |a DE-861 |a DE-858 |a DE-739 |a DE-29T |a DE-706 |a DE-523 |a DE-634 |a DE-83 |a DE-188 | ||
| 050 | 0 | |a QA76.5 | |
| 082 | 0 | |a 001.64 |2 19 | |
| 084 | |a ST 160 |0 (DE-625)143599: |2 rvk | ||
| 084 | |a ST 170 |0 (DE-625)143602: |2 rvk | ||
| 100 | 1 | |a Hedtke, Rolf |d 1949- |e Verfasser |0 (DE-588)132801159 |4 aut | |
| 245 | 1 | 0 | |a Mikroprozessorsysteme |b Zuverlässigkeit, Testverfahren, Fehlertoleranz |c R. Hedtke |
| 264 | 1 | |a Berlin u.a. |b Springer |c 1984 | |
| 300 | |a 203 S. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Microprocessors | |
| 650 | 0 | 7 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Mikroprozessor |0 (DE-588)4039232-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Mikrocomputer |0 (DE-588)4039206-5 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Mikrocomputer |0 (DE-588)4039206-5 |D s |
| 689 | 0 | 1 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Mikroprozessor |0 (DE-588)4039232-6 |D s |
| 689 | 1 | 1 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |D s |
| 689 | 1 | |5 DE-604 | |
| 940 | 1 | |q TUB-nveb | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-000136891 | ||
Datensatz im Suchindex
| _version_ | 1804114691601989632 |
|---|---|
| any_adam_object | |
| author | Hedtke, Rolf 1949- |
| author_GND | (DE-588)132801159 |
| author_facet | Hedtke, Rolf 1949- |
| author_role | aut |
| author_sort | Hedtke, Rolf 1949- |
| author_variant | r h rh |
| building | Verbundindex |
| bvnumber | BV000228592 |
| callnumber-first | Q - Science |
| callnumber-label | QA76 |
| callnumber-raw | QA76.5 |
| callnumber-search | QA76.5 |
| callnumber-sort | QA 276.5 |
| callnumber-subject | QA - Mathematics |
| classification_rvk | ST 160 ST 170 |
| ctrlnum | (OCoLC)12668060 (DE-599)BVBBV000228592 |
| dewey-full | 001.64 |
| dewey-hundreds | 000 - Computer science, information, general works |
| dewey-ones | 001 - Knowledge |
| dewey-raw | 001.64 |
| dewey-search | 001.64 |
| dewey-sort | 11.64 |
| dewey-tens | 000 - Computer science, information, general works |
| discipline | Allgemeines Informatik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01525nam a2200445 c 4500</leader><controlfield tag="001">BV000228592</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20231020 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">870612s1984 |||| 00||| ger d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">3540129960</subfield><subfield code="9">3-540-12996-0</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0387129960</subfield><subfield code="9">0-387-12996-0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)12668060</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV000228592</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">ger</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-12</subfield><subfield code="a">DE-19</subfield><subfield code="a">DE-91</subfield><subfield code="a">DE-91G</subfield><subfield code="a">DE-861</subfield><subfield code="a">DE-858</subfield><subfield code="a">DE-739</subfield><subfield code="a">DE-29T</subfield><subfield code="a">DE-706</subfield><subfield code="a">DE-523</subfield><subfield code="a">DE-634</subfield><subfield code="a">DE-83</subfield><subfield code="a">DE-188</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QA76.5</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">001.64</subfield><subfield code="2">19</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ST 160</subfield><subfield code="0">(DE-625)143599:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ST 170</subfield><subfield code="0">(DE-625)143602:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Hedtke, Rolf</subfield><subfield code="d">1949-</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)132801159</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Mikroprozessorsysteme</subfield><subfield code="b">Zuverlässigkeit, Testverfahren, Fehlertoleranz</subfield><subfield code="c">R. Hedtke</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Berlin u.a.</subfield><subfield code="b">Springer</subfield><subfield code="c">1984</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">203 S.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microprocessors</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikroprozessor</subfield><subfield code="0">(DE-588)4039232-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikrocomputer</subfield><subfield code="0">(DE-588)4039206-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Mikrocomputer</subfield><subfield code="0">(DE-588)4039206-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Mikroprozessor</subfield><subfield code="0">(DE-588)4039232-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">TUB-nveb</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-000136891</subfield></datafield></record></collection> |
| id | DE-604.BV000228592 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T15:10:45Z |
| institution | BVB |
| isbn | 3540129960 0387129960 |
| language | German |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-000136891 |
| oclc_num | 12668060 |
| open_access_boolean | |
| owner | DE-12 DE-19 DE-BY-UBM DE-91 DE-BY-TUM DE-91G DE-BY-TUM DE-861 DE-858 DE-739 DE-29T DE-706 DE-523 DE-634 DE-83 DE-188 |
| owner_facet | DE-12 DE-19 DE-BY-UBM DE-91 DE-BY-TUM DE-91G DE-BY-TUM DE-861 DE-858 DE-739 DE-29T DE-706 DE-523 DE-634 DE-83 DE-188 |
| physical | 203 S. |
| psigel | TUB-nveb |
| publishDate | 1984 |
| publishDateSearch | 1984 |
| publishDateSort | 1984 |
| publisher | Springer |
| record_format | marc |
| spelling | Hedtke, Rolf 1949- Verfasser (DE-588)132801159 aut Mikroprozessorsysteme Zuverlässigkeit, Testverfahren, Fehlertoleranz R. Hedtke Berlin u.a. Springer 1984 203 S. txt rdacontent n rdamedia nc rdacarrier Microprocessors Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf Mikroprozessor (DE-588)4039232-6 gnd rswk-swf Mikrocomputer (DE-588)4039206-5 gnd rswk-swf Mikrocomputer (DE-588)4039206-5 s Zuverlässigkeit (DE-588)4059245-5 s DE-604 Mikroprozessor (DE-588)4039232-6 s |
| spellingShingle | Hedtke, Rolf 1949- Mikroprozessorsysteme Zuverlässigkeit, Testverfahren, Fehlertoleranz Microprocessors Zuverlässigkeit (DE-588)4059245-5 gnd Mikroprozessor (DE-588)4039232-6 gnd Mikrocomputer (DE-588)4039206-5 gnd |
| subject_GND | (DE-588)4059245-5 (DE-588)4039232-6 (DE-588)4039206-5 |
| title | Mikroprozessorsysteme Zuverlässigkeit, Testverfahren, Fehlertoleranz |
| title_auth | Mikroprozessorsysteme Zuverlässigkeit, Testverfahren, Fehlertoleranz |
| title_exact_search | Mikroprozessorsysteme Zuverlässigkeit, Testverfahren, Fehlertoleranz |
| title_full | Mikroprozessorsysteme Zuverlässigkeit, Testverfahren, Fehlertoleranz R. Hedtke |
| title_fullStr | Mikroprozessorsysteme Zuverlässigkeit, Testverfahren, Fehlertoleranz R. Hedtke |
| title_full_unstemmed | Mikroprozessorsysteme Zuverlässigkeit, Testverfahren, Fehlertoleranz R. Hedtke |
| title_short | Mikroprozessorsysteme |
| title_sort | mikroprozessorsysteme zuverlassigkeit testverfahren fehlertoleranz |
| title_sub | Zuverlässigkeit, Testverfahren, Fehlertoleranz |
| topic | Microprocessors Zuverlässigkeit (DE-588)4059245-5 gnd Mikroprozessor (DE-588)4039232-6 gnd Mikrocomputer (DE-588)4039206-5 gnd |
| topic_facet | Microprocessors Zuverlässigkeit Mikroprozessor Mikrocomputer |
| work_keys_str_mv | AT hedtkerolf mikroprozessorsystemezuverlassigkeittestverfahrenfehlertoleranz |