Recruiting and educating the best teachers :: policy, professionalism and pedagogy /

"What does the best teacher education program look like? How should we look at the area of attracting the best teachers at teacher education program and at the schools? How should we look at the area of recruitment into teacher education at different stages of a teacher's career and into t...

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Bibliographic Details
Other Authors: Madalinska-Michalak, Joanna (Editor), Flores, Maria Assunção (Editor), Low, Ee Ling (Editor), Van Nuland, Shirley (Editor)
Format: Electronic eBook
Language:English
Published: Leiden ; Boston : Brill, [2022]
Series:Key issues in teacher education : policy, research & practice, volume 1
Subjects:
Online Access:DE-862
DE-863
Summary:"What does the best teacher education program look like? How should we look at the area of attracting the best teachers at teacher education program and at the schools? How should we look at the area of recruitment into teacher education at different stages of a teacher's career and into the teaching profession? This book answers these questions, demonstrating that policy, professionalism, and pedagogy are integral to the development of the best teachers that our students deserve. The empirical quantitative and qualitative studies and narratives presented in this volume show that strong analyses are needed to drive decisions on policy and practice. Contributors are: Tania Alonso-Sainz, Satya Samhita Balanagu, Aimie Brennan, Angela Canny, Bee Leng Chua, Stefanie Yen Leng Chye, Kurt Clausen, Melanie Ní Dhuinn, Reina Ferrández-Berrueco, Maria Assunção Flores, Marilde Queiroz Guedes, Rosalyn Hyde, Tandeep Kaur, Mary Knight, Jennifer Liston, Erika Löfström, Ee Ling Low, Joanna Madalinska-Michalak, Suzanne O'Keeffe, Diana Petrarca, Mark Prendergast, Lucía Sánchez-Tarazaga, Paola Sangster, Bianca Thoilliez, Luís Tinoca and Shirley Van Nuland"--
Physical Description:1 online resource : illustrations.
Bibliography:Includes bibliographical references and index.
ISBN:9004506659
9789004506657
ISSN:2772-5979 ;

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