Advanced Measurement and Test IV /:

Collection of selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China. The 37 papers are grouped as follows: Chapter 1: Materials Science; Chapter 2: Material Processing and Testing Technology; Chapter 3...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Körperschaft: International Conference on Advanced Measurement and Test Wuhan, China
Weitere Verfasser: Parvel, Ankdrew (HerausgeberIn), Wu, Andy (HerausgeberIn)
Format: Elektronisch Tagungsbericht E-Book
Sprache:English
Veröffentlicht: Zurich : Trans Tech Publications, ©2015.
Schriftenreihe:Advanced materials research ; v. 1083.
Schlagworte:
Online-Zugang:Volltext
Zusammenfassung:Collection of selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China. The 37 papers are grouped as follows: Chapter 1: Materials Science; Chapter 2: Material Processing and Testing Technology; Chapter 3: Monitoring, Detection, Testing and Measurement Systems and Technologies.
Beschreibung:Testing Level Measurement Devices by Imitating Sensor Signals.
Beschreibung:1 online resource (224 pages) : illustrations (some color)
Bibliographie:Includes bibliographical references and index.
ISBN:9783038267591
3038267597