Semiconductor strain metrology :: principles and applications /
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
[Saif Zone, Sharjah, U.A.E] ; Oak Park, IL :
Bentham Science,
[2012]
|
Schlagworte: | |
Online-Zugang: | Volltext |
Beschreibung: | 1 online resource (136 pages) : illustrations |
Bibliographie: | Includes bibliographical references and index. |
ISBN: | 9781608053599 1608053598 |
Internformat
MARC
LEADER | 00000cam a2200000Ma 4500 | ||
---|---|---|---|
001 | ZDB-4-EBA-ocn811371628 | ||
003 | OCoLC | ||
005 | 20241004212047.0 | ||
006 | m o d | ||
007 | cr cn||||||||| | ||
008 | 120813s2012 ts a ob 001 0 eng d | ||
040 | |a E7B |b eng |e pn |c E7B |d OCLCO |d N$T |d OCLCQ |d AZK |d MOR |d PIFAG |d OCLCQ |d OCLCF |d STF |d WRM |d VTS |d NRAMU |d VT2 |d OCLCQ |d UKCRE |d AJS |d OCLCO |d OCLCQ |d OCLCO |d OCLCL |d S2H | ||
019 | |a 961627080 |a 962695752 |a 1081284389 |a 1086980933 |a 1153523035 |a 1228608873 |a 1289521207 | ||
020 | |a 9781608053599 |q (electronic bk.) | ||
020 | |a 1608053598 |q (electronic bk.) | ||
035 | |a (OCoLC)811371628 |z (OCoLC)961627080 |z (OCoLC)962695752 |z (OCoLC)1081284389 |z (OCoLC)1086980933 |z (OCoLC)1153523035 |z (OCoLC)1228608873 |z (OCoLC)1289521207 | ||
050 | 4 | |a TK7871.85 |b .W65 2012eb | |
072 | 7 | |a TEC |x 008010 |2 bisacsh | |
072 | 7 | |a TEC |x 008020 |2 bisacsh | |
082 | 7 | |a 621.3815 | |
049 | |a MAIN | ||
100 | 1 | |a Wong, Terence K. S. | |
245 | 1 | 0 | |a Semiconductor strain metrology : |b principles and applications / |c Terence K.S. Wong. |
260 | |a [Saif Zone, Sharjah, U.A.E] ; |a Oak Park, IL : |b Bentham Science, |c [2012] | ||
300 | |a 1 online resource (136 pages) : |b illustrations | ||
336 | |a text |b txt |2 rdacontent | ||
337 | |a computer |b c |2 rdamedia | ||
338 | |a online resource |b cr |2 rdacarrier | ||
347 | |a data file |2 rda | ||
504 | |a Includes bibliographical references and index. | ||
650 | 0 | |a Semiconductors |x Design and construction |x Materials. | |
650 | 0 | |a Compound semiconductors |x Design and construction |x Materials. | |
650 | 0 | |a Silicon-on-insulator technology. |0 http://id.loc.gov/authorities/subjects/sh89003063 | |
650 | 6 | |a Silicium sur isolant. | |
650 | 7 | |a TECHNOLOGY & ENGINEERING |x Electronics |x Circuits |x General. |2 bisacsh | |
650 | 7 | |a TECHNOLOGY & ENGINEERING |x Electronics |x Circuits |x Integrated. |2 bisacsh | |
650 | 7 | |a Silicon-on-insulator technology |2 fast | |
758 | |i has work: |a Semiconductor strain metrology (Text) |1 https://id.oclc.org/worldcat/entity/E39PCXpTmXtf9yqQJGw74PKQJC |4 https://id.oclc.org/worldcat/ontology/hasWork | ||
856 | 4 | 0 | |l FWS01 |p ZDB-4-EBA |q FWS_PDA_EBA |u https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=500610 |3 Volltext |
938 | |a ebrary |b EBRY |n ebr10570978 | ||
938 | |a EBSCOhost |b EBSC |n 500610 | ||
994 | |a 92 |b GEBAY | ||
912 | |a ZDB-4-EBA | ||
049 | |a DE-863 |
Datensatz im Suchindex
DE-BY-FWS_katkey | ZDB-4-EBA-ocn811371628 |
---|---|
_version_ | 1816882208210681857 |
adam_text | |
any_adam_object | |
author | Wong, Terence K. S. |
author_facet | Wong, Terence K. S. |
author_role | |
author_sort | Wong, Terence K. S. |
author_variant | t k s w tks tksw |
building | Verbundindex |
bvnumber | localFWS |
callnumber-first | T - Technology |
callnumber-label | TK7871 |
callnumber-raw | TK7871.85 .W65 2012eb |
callnumber-search | TK7871.85 .W65 2012eb |
callnumber-sort | TK 47871.85 W65 42012EB |
callnumber-subject | TK - Electrical and Nuclear Engineering |
collection | ZDB-4-EBA |
ctrlnum | (OCoLC)811371628 |
dewey-full | 621.3815 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.3815 |
dewey-search | 621.3815 |
dewey-sort | 3621.3815 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
format | Electronic eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02278cam a2200469Ma 4500</leader><controlfield tag="001">ZDB-4-EBA-ocn811371628</controlfield><controlfield tag="003">OCoLC</controlfield><controlfield tag="005">20241004212047.0</controlfield><controlfield tag="006">m o d </controlfield><controlfield tag="007">cr cn|||||||||</controlfield><controlfield tag="008">120813s2012 ts a ob 001 0 eng d</controlfield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">E7B</subfield><subfield code="b">eng</subfield><subfield code="e">pn</subfield><subfield code="c">E7B</subfield><subfield code="d">OCLCO</subfield><subfield code="d">N$T</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">AZK</subfield><subfield code="d">MOR</subfield><subfield code="d">PIFAG</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">OCLCF</subfield><subfield code="d">STF</subfield><subfield code="d">WRM</subfield><subfield code="d">VTS</subfield><subfield code="d">NRAMU</subfield><subfield code="d">VT2</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">UKCRE</subfield><subfield code="d">AJS</subfield><subfield code="d">OCLCO</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">OCLCO</subfield><subfield code="d">OCLCL</subfield><subfield code="d">S2H</subfield></datafield><datafield tag="019" ind1=" " ind2=" "><subfield code="a">961627080</subfield><subfield code="a">962695752</subfield><subfield code="a">1081284389</subfield><subfield code="a">1086980933</subfield><subfield code="a">1153523035</subfield><subfield code="a">1228608873</subfield><subfield code="a">1289521207</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781608053599</subfield><subfield code="q">(electronic bk.)</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1608053598</subfield><subfield code="q">(electronic bk.)</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)811371628</subfield><subfield code="z">(OCoLC)961627080</subfield><subfield code="z">(OCoLC)962695752</subfield><subfield code="z">(OCoLC)1081284389</subfield><subfield code="z">(OCoLC)1086980933</subfield><subfield code="z">(OCoLC)1153523035</subfield><subfield code="z">(OCoLC)1228608873</subfield><subfield code="z">(OCoLC)1289521207</subfield></datafield><datafield tag="050" ind1=" " ind2="4"><subfield code="a">TK7871.85</subfield><subfield code="b">.W65 2012eb</subfield></datafield><datafield tag="072" ind1=" " ind2="7"><subfield code="a">TEC</subfield><subfield code="x">008010</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="072" ind1=" " ind2="7"><subfield code="a">TEC</subfield><subfield code="x">008020</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="082" ind1="7" ind2=" "><subfield code="a">621.3815</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">MAIN</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Wong, Terence K. S.</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Semiconductor strain metrology :</subfield><subfield code="b">principles and applications /</subfield><subfield code="c">Terence K.S. Wong.</subfield></datafield><datafield tag="260" ind1=" " ind2=" "><subfield code="a">[Saif Zone, Sharjah, U.A.E] ;</subfield><subfield code="a">Oak Park, IL :</subfield><subfield code="b">Bentham Science,</subfield><subfield code="c">[2012]</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (136 pages) :</subfield><subfield code="b">illustrations</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">computer</subfield><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">online resource</subfield><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="347" ind1=" " ind2=" "><subfield code="a">data file</subfield><subfield code="2">rda</subfield></datafield><datafield tag="504" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Semiconductors</subfield><subfield code="x">Design and construction</subfield><subfield code="x">Materials.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Compound semiconductors</subfield><subfield code="x">Design and construction</subfield><subfield code="x">Materials.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Silicon-on-insulator technology.</subfield><subfield code="0">http://id.loc.gov/authorities/subjects/sh89003063</subfield></datafield><datafield tag="650" ind1=" " ind2="6"><subfield code="a">Silicium sur isolant.</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY & ENGINEERING</subfield><subfield code="x">Electronics</subfield><subfield code="x">Circuits</subfield><subfield code="x">General.</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY & ENGINEERING</subfield><subfield code="x">Electronics</subfield><subfield code="x">Circuits</subfield><subfield code="x">Integrated.</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Silicon-on-insulator technology</subfield><subfield code="2">fast</subfield></datafield><datafield tag="758" ind1=" " ind2=" "><subfield code="i">has work:</subfield><subfield code="a">Semiconductor strain metrology (Text)</subfield><subfield code="1">https://id.oclc.org/worldcat/entity/E39PCXpTmXtf9yqQJGw74PKQJC</subfield><subfield code="4">https://id.oclc.org/worldcat/ontology/hasWork</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="l">FWS01</subfield><subfield code="p">ZDB-4-EBA</subfield><subfield code="q">FWS_PDA_EBA</subfield><subfield code="u">https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=500610</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="938" ind1=" " ind2=" "><subfield code="a">ebrary</subfield><subfield code="b">EBRY</subfield><subfield code="n">ebr10570978</subfield></datafield><datafield tag="938" ind1=" " ind2=" "><subfield code="a">EBSCOhost</subfield><subfield code="b">EBSC</subfield><subfield code="n">500610</subfield></datafield><datafield tag="994" ind1=" " ind2=" "><subfield code="a">92</subfield><subfield code="b">GEBAY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-4-EBA</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-863</subfield></datafield></record></collection> |
id | ZDB-4-EBA-ocn811371628 |
illustrated | Illustrated |
indexdate | 2024-11-27T13:24:57Z |
institution | BVB |
isbn | 9781608053599 1608053598 |
language | English |
oclc_num | 811371628 |
open_access_boolean | |
owner | MAIN DE-863 DE-BY-FWS |
owner_facet | MAIN DE-863 DE-BY-FWS |
physical | 1 online resource (136 pages) : illustrations |
psigel | ZDB-4-EBA |
publishDate | 2012 |
publishDateSearch | 2012 |
publishDateSort | 2012 |
publisher | Bentham Science, |
record_format | marc |
spelling | Wong, Terence K. S. Semiconductor strain metrology : principles and applications / Terence K.S. Wong. [Saif Zone, Sharjah, U.A.E] ; Oak Park, IL : Bentham Science, [2012] 1 online resource (136 pages) : illustrations text txt rdacontent computer c rdamedia online resource cr rdacarrier data file rda Includes bibliographical references and index. Semiconductors Design and construction Materials. Compound semiconductors Design and construction Materials. Silicon-on-insulator technology. http://id.loc.gov/authorities/subjects/sh89003063 Silicium sur isolant. TECHNOLOGY & ENGINEERING Electronics Circuits General. bisacsh TECHNOLOGY & ENGINEERING Electronics Circuits Integrated. bisacsh Silicon-on-insulator technology fast has work: Semiconductor strain metrology (Text) https://id.oclc.org/worldcat/entity/E39PCXpTmXtf9yqQJGw74PKQJC https://id.oclc.org/worldcat/ontology/hasWork FWS01 ZDB-4-EBA FWS_PDA_EBA https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=500610 Volltext |
spellingShingle | Wong, Terence K. S. Semiconductor strain metrology : principles and applications / Semiconductors Design and construction Materials. Compound semiconductors Design and construction Materials. Silicon-on-insulator technology. http://id.loc.gov/authorities/subjects/sh89003063 Silicium sur isolant. TECHNOLOGY & ENGINEERING Electronics Circuits General. bisacsh TECHNOLOGY & ENGINEERING Electronics Circuits Integrated. bisacsh Silicon-on-insulator technology fast |
subject_GND | http://id.loc.gov/authorities/subjects/sh89003063 |
title | Semiconductor strain metrology : principles and applications / |
title_auth | Semiconductor strain metrology : principles and applications / |
title_exact_search | Semiconductor strain metrology : principles and applications / |
title_full | Semiconductor strain metrology : principles and applications / Terence K.S. Wong. |
title_fullStr | Semiconductor strain metrology : principles and applications / Terence K.S. Wong. |
title_full_unstemmed | Semiconductor strain metrology : principles and applications / Terence K.S. Wong. |
title_short | Semiconductor strain metrology : |
title_sort | semiconductor strain metrology principles and applications |
title_sub | principles and applications / |
topic | Semiconductors Design and construction Materials. Compound semiconductors Design and construction Materials. Silicon-on-insulator technology. http://id.loc.gov/authorities/subjects/sh89003063 Silicium sur isolant. TECHNOLOGY & ENGINEERING Electronics Circuits General. bisacsh TECHNOLOGY & ENGINEERING Electronics Circuits Integrated. bisacsh Silicon-on-insulator technology fast |
topic_facet | Semiconductors Design and construction Materials. Compound semiconductors Design and construction Materials. Silicon-on-insulator technology. Silicium sur isolant. TECHNOLOGY & ENGINEERING Electronics Circuits General. TECHNOLOGY & ENGINEERING Electronics Circuits Integrated. Silicon-on-insulator technology |
url | https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=500610 |
work_keys_str_mv | AT wongterenceks semiconductorstrainmetrologyprinciplesandapplications |