Müller, J. (2024). Transmission diffraction in a scanning electron microscope with pixelated detectors: Development and applications.
Chicago-Zitierstil (17. Ausg.)Müller, Johannes. Transmission Diffraction in a Scanning Electron Microscope with Pixelated Detectors: Development and Applications. Berlin, 2024.
MLA-Zitierstil (9. Ausg.)Müller, Johannes. Transmission Diffraction in a Scanning Electron Microscope with Pixelated Detectors: Development and Applications. 2024.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.