Electron Nano-imaging: Basics of Imaging and Diffraction for TEM and STEM
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Tokyo
Springer Japan
2024
Tokyo Springer |
| Ausgabe: | 2nd ed. 2024 |
| Schlagworte: | |
| Online-Zugang: | DE-634 DE-1028 DE-1050 Volltext |
| Beschreibung: | 1 Online-Ressource (XXX, 384 p. 142 illus., 13 illus. in color) |
| ISBN: | 9784431569404 |
| DOI: | 10.1007/978-4-431-56940-4 |
Internformat
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| 245 | 1 | 0 | |a Electron Nano-imaging |b Basics of Imaging and Diffraction for TEM and STEM |c by Nobuo Tanaka |
| 250 | |a 2nd ed. 2024 | ||
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| 650 | 4 | |a Microscopy | |
| 650 | 4 | |a Imaging Techniques | |
| 650 | 4 | |a Characterization and Analytical Technique | |
| 650 | 4 | |a Spectroscopy | |
| 650 | 4 | |a Nanophysics | |
| 650 | 4 | |a Materials / Microscopy | |
| 650 | 4 | |a Materials / Analysis | |
| 650 | 4 | |a Imaging systems | |
| 650 | 4 | |a Spectrum analysis | |
| 650 | 4 | |a Nanoscience | |
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Datensatz im Suchindex
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| adam_text | |
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| author | Tanaka, Nobuo |
| author_facet | Tanaka, Nobuo |
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| author_variant | n t nt |
| building | Verbundindex |
| bvnumber | BV049847141 |
| classification_tum | CHE 000 |
| collection | ZDB-2-CMS |
| ctrlnum | (ZDB-2-CMS)9784431569404 (OCoLC)1454750979 (DE-599)BVBBV049847141 |
| dewey-full | 620.112 502.82 |
| dewey-hundreds | 600 - Technology (Applied sciences) 500 - Natural sciences and mathematics |
| dewey-ones | 620 - Engineering and allied operations 502 - Miscellany |
| dewey-raw | 620.112 502.82 |
| dewey-search | 620.112 502.82 |
| dewey-sort | 3620.112 |
| dewey-tens | 620 - Engineering and allied operations 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft Chemie |
| doi_str_mv | 10.1007/978-4-431-56940-4 |
| edition | 2nd ed. 2024 |
| format | Electronic eBook |
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| id | DE-604.BV049847141 |
| illustrated | Not Illustrated |
| indexdate | 2024-09-10T00:51:01Z |
| institution | BVB |
| isbn | 9784431569404 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-035187016 |
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| owner_facet | DE-634 DE-1028 DE-1050 |
| physical | 1 Online-Ressource (XXX, 384 p. 142 illus., 13 illus. in color) |
| psigel | ZDB-2-CMS ZDB-2-CMS_2024 |
| publishDate | 2024 |
| publishDateSearch | 2024 |
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| publisher | Springer Japan Springer |
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| spelling | Tanaka, Nobuo Verfasser aut Electron Nano-imaging Basics of Imaging and Diffraction for TEM and STEM by Nobuo Tanaka 2nd ed. 2024 Tokyo Springer Japan 2024 Tokyo Springer 1 Online-Ressource (XXX, 384 p. 142 illus., 13 illus. in color) txt rdacontent c rdamedia cr rdacarrier Microscopy Imaging Techniques Characterization and Analytical Technique Spectroscopy Nanophysics Materials / Microscopy Materials / Analysis Imaging systems Spectrum analysis Nanoscience Erscheint auch als Druck-Ausgabe 978-4-431-56939-8 Erscheint auch als Druck-Ausgabe 978-4-431-56941-1 https://doi.org/10.1007/978-4-431-56940-4 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Tanaka, Nobuo Electron Nano-imaging Basics of Imaging and Diffraction for TEM and STEM Microscopy Imaging Techniques Characterization and Analytical Technique Spectroscopy Nanophysics Materials / Microscopy Materials / Analysis Imaging systems Spectrum analysis Nanoscience |
| title | Electron Nano-imaging Basics of Imaging and Diffraction for TEM and STEM |
| title_auth | Electron Nano-imaging Basics of Imaging and Diffraction for TEM and STEM |
| title_exact_search | Electron Nano-imaging Basics of Imaging and Diffraction for TEM and STEM |
| title_full | Electron Nano-imaging Basics of Imaging and Diffraction for TEM and STEM by Nobuo Tanaka |
| title_fullStr | Electron Nano-imaging Basics of Imaging and Diffraction for TEM and STEM by Nobuo Tanaka |
| title_full_unstemmed | Electron Nano-imaging Basics of Imaging and Diffraction for TEM and STEM by Nobuo Tanaka |
| title_short | Electron Nano-imaging |
| title_sort | electron nano imaging basics of imaging and diffraction for tem and stem |
| title_sub | Basics of Imaging and Diffraction for TEM and STEM |
| topic | Microscopy Imaging Techniques Characterization and Analytical Technique Spectroscopy Nanophysics Materials / Microscopy Materials / Analysis Imaging systems Spectrum analysis Nanoscience |
| topic_facet | Microscopy Imaging Techniques Characterization and Analytical Technique Spectroscopy Nanophysics Materials / Microscopy Materials / Analysis Imaging systems Spectrum analysis Nanoscience |
| url | https://doi.org/10.1007/978-4-431-56940-4 |
| work_keys_str_mv | AT tanakanobuo electronnanoimagingbasicsofimaginganddiffractionfortemandstem |