Software defect localization using explainable deep learning:
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Bibliographic Details
Main Author: Ganz, Tom (Author)
Format: Thesis Electronic eBook
Language:English
Published: Berlin Technische Universität Berlin 2024
Subjects:
Online Access:Volltext
Item Description:Enthält 5 Sonderdrucke aus verschiedenen Zeitschriften
Physical Description:1 Online-Ressource (ix, 159 Seiten) Illustrationen, Diagramme
DOI:10.14279/depositonce-20402

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