Engineering materials characterization:
Materials Science today is the base for all technological and industrial developments. The book provides the understanding of the advanced spectroscopic and microscopic instruments used for material characterization. The main issues addressed are 1) a detailed understanding of the instrument, includ...
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Berlin ; Boston
De Gruyter
[2023]
|
| Schriftenreihe: | De Gruyter STEM
|
| Schlagworte: | |
| Online-Zugang: | DE-634 DE-1043 DE-1046 DE-858 DE-Aug4 DE-859 DE-860 DE-91 DE-706 DE-739 Volltext |
| Zusammenfassung: | Materials Science today is the base for all technological and industrial developments. The book provides the understanding of the advanced spectroscopic and microscopic instruments used for material characterization. The main issues addressed are 1) a detailed understanding of the instrument, including working and handling, 2) sample preparation, and 3) data analysis and interpretation. The book is divided in two parts i.e., Part A discusses microscopic instruments, consisting of Optical Microscope, Scanning Electron Microscopy, Atomic Force Microscopy, Field Emission Scanning Electron Microscope and X-Ray Diffraction. Part B is on spectroscopic instruments and covers FTIR Spectrometer, Raman Spectrometer, X-ray Photoelectron Spectroscopy, Ultraviolet Photoelectron Spectroscopy, Fluorescence Spectroscopy, and Nuclear Magnetic Resonance Spectroscopy |
| Beschreibung: | 1 Online-Ressource (XVIII, 252 Seiten) |
| ISBN: | 9783110997590 |
| DOI: | 10.1515/9783110997590 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV049581001 | ||
| 003 | DE-604 | ||
| 005 | 20240829 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 240222s2023 |||| o||u| ||||||eng d | ||
| 020 | |a 9783110997590 |9 978-3-11-099759-0 | ||
| 024 | 7 | |a 10.1515/9783110997590 |2 doi | |
| 035 | |a (ZDB-23-DGG)9783110997590 | ||
| 035 | |a (OCoLC)1409699677 | ||
| 035 | |a (DE-599)BVBBV049581001 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-1043 |a DE-1046 |a DE-858 |a DE-Aug4 |a DE-859 |a DE-860 |a DE-739 |a DE-91 |a DE-11 |a DE-706 |a DE-634 | ||
| 084 | |a TEC 000 |2 stub | ||
| 084 | |a DAT 000 |2 stub | ||
| 100 | 1 | |a Kumar, Kaushik |d 1968- |e Verfasser |0 (DE-588)1155134354 |4 aut | |
| 245 | 1 | 0 | |a Engineering materials characterization |c Kaushik Kumar, Divya Zindani |
| 264 | 1 | |a Berlin ; Boston |b De Gruyter |c [2023] | |
| 264 | 4 | |c 2024 | |
| 300 | |a 1 Online-Ressource (XVIII, 252 Seiten) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a De Gruyter STEM | |
| 520 | |a Materials Science today is the base for all technological and industrial developments. The book provides the understanding of the advanced spectroscopic and microscopic instruments used for material characterization. The main issues addressed are 1) a detailed understanding of the instrument, including working and handling, 2) sample preparation, and 3) data analysis and interpretation. The book is divided in two parts i.e., Part A discusses microscopic instruments, consisting of Optical Microscope, Scanning Electron Microscopy, Atomic Force Microscopy, Field Emission Scanning Electron Microscope and X-Ray Diffraction. Part B is on spectroscopic instruments and covers FTIR Spectrometer, Raman Spectrometer, X-ray Photoelectron Spectroscopy, Ultraviolet Photoelectron Spectroscopy, Fluorescence Spectroscopy, and Nuclear Magnetic Resonance Spectroscopy | ||
| 650 | 4 | |a Analyrische Chemie | |
| 650 | 4 | |a Materialwissenschaften | |
| 650 | 4 | |a Spektroskopie | |
| 650 | 4 | |a Werkstoffwissenschaften | |
| 650 | 7 | |a Technology & Engineering / Materials Science / General |2 bisacsh | |
| 650 | 0 | 7 | |a Zerstörungsfreie Werkstoffprüfung |0 (DE-588)4067689-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Mikroskop |0 (DE-588)4039237-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Mikroskopie |0 (DE-588)4039238-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Spektroskop |0 (DE-588)4829268-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Spektroskopie |0 (DE-588)4056138-0 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Zerstörungsfreie Werkstoffprüfung |0 (DE-588)4067689-4 |D s |
| 689 | 0 | 1 | |a Mikroskopie |0 (DE-588)4039238-7 |D s |
| 689 | 0 | 2 | |a Spektroskopie |0 (DE-588)4056138-0 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Mikroskop |0 (DE-588)4039237-5 |D s |
| 689 | 1 | |5 DE-604 | |
| 689 | 2 | 0 | |a Spektroskop |0 (DE-588)4829268-0 |D s |
| 689 | 2 | |5 DE-604 | |
| 700 | 1 | |a Zindani, Divya |d 1989- |e Verfasser |0 (DE-588)1182605788 |4 aut | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 9783110997606 |
| 856 | 4 | 0 | |u https://doi.org/10.1515/9783110997590?locatt=mode:legacy |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-23-DGG |a ZDB-23-DEI | ||
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-034925932 | |
| 966 | e | |u https://doi.org/10.1515/9783110997590 |l DE-634 |p ZDB-23-DGG |q BTU_Kauf |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1515/9783110997590?locatt=mode:legacy |l DE-1043 |p ZDB-23-DGG |q FAB_PDA_DGG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1515/9783110997590?locatt=mode:legacy |l DE-1046 |p ZDB-23-DGG |q FAW_PDA_DGG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1515/9783110997590?locatt=mode:legacy |l DE-858 |p ZDB-23-DGG |q FCO_PDA_DGG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1515/9783110997590?locatt=mode:legacy |l DE-Aug4 |p ZDB-23-DGG |q FHA_PDA_DGG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1515/9783110997590?locatt=mode:legacy |l DE-859 |p ZDB-23-DGG |q FKE_PDA_DGG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1515/9783110997590?locatt=mode:legacy |l DE-860 |p ZDB-23-DGG |q FLA_PDA_DGG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1515/9783110997590?locatt=mode:legacy |l DE-91 |p ZDB-23-DEI |q TUM_Paketkauf_2023 |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1515/9783110997590?locatt=mode:legacy |l DE-706 |p ZDB-23-DEI |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1515/9783110997590?locatt=mode:legacy |l DE-739 |p ZDB-23-DGG |q UPA_PDA_DGG |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1808770196803944448 |
|---|---|
| adam_text | |
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author | Kumar, Kaushik 1968- Zindani, Divya 1989- |
| author_GND | (DE-588)1155134354 (DE-588)1182605788 |
| author_facet | Kumar, Kaushik 1968- Zindani, Divya 1989- |
| author_role | aut aut |
| author_sort | Kumar, Kaushik 1968- |
| author_variant | k k kk d z dz |
| building | Verbundindex |
| bvnumber | BV049581001 |
| classification_tum | TEC 000 DAT 000 |
| collection | ZDB-23-DGG ZDB-23-DEI |
| ctrlnum | (ZDB-23-DGG)9783110997590 (OCoLC)1409699677 (DE-599)BVBBV049581001 |
| discipline | Technik Informatik |
| doi_str_mv | 10.1515/9783110997590 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nmm a2200000zc 4500</leader><controlfield tag="001">BV049581001</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20240829</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">240222s2023 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783110997590</subfield><subfield code="9">978-3-11-099759-0</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1515/9783110997590</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-23-DGG)9783110997590</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1409699677</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV049581001</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-1043</subfield><subfield code="a">DE-1046</subfield><subfield code="a">DE-858</subfield><subfield code="a">DE-Aug4</subfield><subfield code="a">DE-859</subfield><subfield code="a">DE-860</subfield><subfield code="a">DE-739</subfield><subfield code="a">DE-91</subfield><subfield code="a">DE-11</subfield><subfield code="a">DE-706</subfield><subfield code="a">DE-634</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">TEC 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">DAT 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Kumar, Kaushik</subfield><subfield code="d">1968-</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)1155134354</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Engineering materials characterization</subfield><subfield code="c">Kaushik Kumar, Divya Zindani</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Berlin ; Boston</subfield><subfield code="b">De Gruyter</subfield><subfield code="c">[2023]</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">2024</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XVIII, 252 Seiten)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">De Gruyter STEM</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Materials Science today is the base for all technological and industrial developments. The book provides the understanding of the advanced spectroscopic and microscopic instruments used for material characterization. The main issues addressed are 1) a detailed understanding of the instrument, including working and handling, 2) sample preparation, and 3) data analysis and interpretation. The book is divided in two parts i.e., Part A discusses microscopic instruments, consisting of Optical Microscope, Scanning Electron Microscopy, Atomic Force Microscopy, Field Emission Scanning Electron Microscope and X-Ray Diffraction. Part B is on spectroscopic instruments and covers FTIR Spectrometer, Raman Spectrometer, X-ray Photoelectron Spectroscopy, Ultraviolet Photoelectron Spectroscopy, Fluorescence Spectroscopy, and Nuclear Magnetic Resonance Spectroscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Analyrische Chemie</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Materialwissenschaften</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Spektroskopie</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Werkstoffwissenschaften</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Technology & Engineering / Materials Science / General</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Zerstörungsfreie Werkstoffprüfung</subfield><subfield code="0">(DE-588)4067689-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikroskop</subfield><subfield code="0">(DE-588)4039237-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikroskopie</subfield><subfield code="0">(DE-588)4039238-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Spektroskop</subfield><subfield code="0">(DE-588)4829268-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Spektroskopie</subfield><subfield code="0">(DE-588)4056138-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Zerstörungsfreie Werkstoffprüfung</subfield><subfield code="0">(DE-588)4067689-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Mikroskopie</subfield><subfield code="0">(DE-588)4039238-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Spektroskopie</subfield><subfield code="0">(DE-588)4056138-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Mikroskop</subfield><subfield code="0">(DE-588)4039237-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Spektroskop</subfield><subfield code="0">(DE-588)4829268-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Zindani, Divya</subfield><subfield code="d">1989-</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)1182605788</subfield><subfield code="4">aut</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">9783110997606</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1515/9783110997590?locatt=mode:legacy</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-23-DGG</subfield><subfield code="a">ZDB-23-DEI</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-034925932</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1515/9783110997590</subfield><subfield code="l">DE-634</subfield><subfield code="p">ZDB-23-DGG</subfield><subfield code="q">BTU_Kauf</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1515/9783110997590?locatt=mode:legacy</subfield><subfield code="l">DE-1043</subfield><subfield code="p">ZDB-23-DGG</subfield><subfield code="q">FAB_PDA_DGG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1515/9783110997590?locatt=mode:legacy</subfield><subfield code="l">DE-1046</subfield><subfield code="p">ZDB-23-DGG</subfield><subfield code="q">FAW_PDA_DGG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1515/9783110997590?locatt=mode:legacy</subfield><subfield code="l">DE-858</subfield><subfield code="p">ZDB-23-DGG</subfield><subfield code="q">FCO_PDA_DGG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1515/9783110997590?locatt=mode:legacy</subfield><subfield code="l">DE-Aug4</subfield><subfield code="p">ZDB-23-DGG</subfield><subfield code="q">FHA_PDA_DGG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1515/9783110997590?locatt=mode:legacy</subfield><subfield code="l">DE-859</subfield><subfield code="p">ZDB-23-DGG</subfield><subfield code="q">FKE_PDA_DGG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1515/9783110997590?locatt=mode:legacy</subfield><subfield code="l">DE-860</subfield><subfield code="p">ZDB-23-DGG</subfield><subfield code="q">FLA_PDA_DGG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1515/9783110997590?locatt=mode:legacy</subfield><subfield code="l">DE-91</subfield><subfield code="p">ZDB-23-DEI</subfield><subfield code="q">TUM_Paketkauf_2023</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1515/9783110997590?locatt=mode:legacy</subfield><subfield code="l">DE-706</subfield><subfield code="p">ZDB-23-DEI</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1515/9783110997590?locatt=mode:legacy</subfield><subfield code="l">DE-739</subfield><subfield code="p">ZDB-23-DGG</subfield><subfield code="q">UPA_PDA_DGG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV049581001 |
| illustrated | Not Illustrated |
| index_date | 2024-07-03T23:32:02Z |
| indexdate | 2024-08-30T00:28:00Z |
| institution | BVB |
| isbn | 9783110997590 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-034925932 |
| oclc_num | 1409699677 |
| open_access_boolean | |
| owner | DE-1043 DE-1046 DE-858 DE-Aug4 DE-859 DE-860 DE-739 DE-91 DE-BY-TUM DE-11 DE-706 DE-634 |
| owner_facet | DE-1043 DE-1046 DE-858 DE-Aug4 DE-859 DE-860 DE-739 DE-91 DE-BY-TUM DE-11 DE-706 DE-634 |
| physical | 1 Online-Ressource (XVIII, 252 Seiten) |
| psigel | ZDB-23-DGG ZDB-23-DEI ZDB-23-DGG BTU_Kauf ZDB-23-DGG FAB_PDA_DGG ZDB-23-DGG FAW_PDA_DGG ZDB-23-DGG FCO_PDA_DGG ZDB-23-DGG FHA_PDA_DGG ZDB-23-DGG FKE_PDA_DGG ZDB-23-DGG FLA_PDA_DGG ZDB-23-DEI TUM_Paketkauf_2023 ZDB-23-DGG UPA_PDA_DGG |
| publishDate | 2023 |
| publishDateSearch | 2023 |
| publishDateSort | 2023 |
| publisher | De Gruyter |
| record_format | marc |
| series2 | De Gruyter STEM |
| spelling | Kumar, Kaushik 1968- Verfasser (DE-588)1155134354 aut Engineering materials characterization Kaushik Kumar, Divya Zindani Berlin ; Boston De Gruyter [2023] 2024 1 Online-Ressource (XVIII, 252 Seiten) txt rdacontent c rdamedia cr rdacarrier De Gruyter STEM Materials Science today is the base for all technological and industrial developments. The book provides the understanding of the advanced spectroscopic and microscopic instruments used for material characterization. The main issues addressed are 1) a detailed understanding of the instrument, including working and handling, 2) sample preparation, and 3) data analysis and interpretation. The book is divided in two parts i.e., Part A discusses microscopic instruments, consisting of Optical Microscope, Scanning Electron Microscopy, Atomic Force Microscopy, Field Emission Scanning Electron Microscope and X-Ray Diffraction. Part B is on spectroscopic instruments and covers FTIR Spectrometer, Raman Spectrometer, X-ray Photoelectron Spectroscopy, Ultraviolet Photoelectron Spectroscopy, Fluorescence Spectroscopy, and Nuclear Magnetic Resonance Spectroscopy Analyrische Chemie Materialwissenschaften Spektroskopie Werkstoffwissenschaften Technology & Engineering / Materials Science / General bisacsh Zerstörungsfreie Werkstoffprüfung (DE-588)4067689-4 gnd rswk-swf Mikroskop (DE-588)4039237-5 gnd rswk-swf Mikroskopie (DE-588)4039238-7 gnd rswk-swf Spektroskop (DE-588)4829268-0 gnd rswk-swf Spektroskopie (DE-588)4056138-0 gnd rswk-swf Zerstörungsfreie Werkstoffprüfung (DE-588)4067689-4 s Mikroskopie (DE-588)4039238-7 s Spektroskopie (DE-588)4056138-0 s DE-604 Mikroskop (DE-588)4039237-5 s Spektroskop (DE-588)4829268-0 s Zindani, Divya 1989- Verfasser (DE-588)1182605788 aut Erscheint auch als Druck-Ausgabe 9783110997606 https://doi.org/10.1515/9783110997590?locatt=mode:legacy Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Kumar, Kaushik 1968- Zindani, Divya 1989- Engineering materials characterization Analyrische Chemie Materialwissenschaften Spektroskopie Werkstoffwissenschaften Technology & Engineering / Materials Science / General bisacsh Zerstörungsfreie Werkstoffprüfung (DE-588)4067689-4 gnd Mikroskop (DE-588)4039237-5 gnd Mikroskopie (DE-588)4039238-7 gnd Spektroskop (DE-588)4829268-0 gnd Spektroskopie (DE-588)4056138-0 gnd |
| subject_GND | (DE-588)4067689-4 (DE-588)4039237-5 (DE-588)4039238-7 (DE-588)4829268-0 (DE-588)4056138-0 |
| title | Engineering materials characterization |
| title_auth | Engineering materials characterization |
| title_exact_search | Engineering materials characterization |
| title_exact_search_txtP | Engineering Materials Characterization |
| title_full | Engineering materials characterization Kaushik Kumar, Divya Zindani |
| title_fullStr | Engineering materials characterization Kaushik Kumar, Divya Zindani |
| title_full_unstemmed | Engineering materials characterization Kaushik Kumar, Divya Zindani |
| title_short | Engineering materials characterization |
| title_sort | engineering materials characterization |
| topic | Analyrische Chemie Materialwissenschaften Spektroskopie Werkstoffwissenschaften Technology & Engineering / Materials Science / General bisacsh Zerstörungsfreie Werkstoffprüfung (DE-588)4067689-4 gnd Mikroskop (DE-588)4039237-5 gnd Mikroskopie (DE-588)4039238-7 gnd Spektroskop (DE-588)4829268-0 gnd Spektroskopie (DE-588)4056138-0 gnd |
| topic_facet | Analyrische Chemie Materialwissenschaften Spektroskopie Werkstoffwissenschaften Technology & Engineering / Materials Science / General Zerstörungsfreie Werkstoffprüfung Mikroskop Mikroskopie Spektroskop |
| url | https://doi.org/10.1515/9783110997590?locatt=mode:legacy |
| work_keys_str_mv | AT kumarkaushik engineeringmaterialscharacterization AT zindanidivya engineeringmaterialscharacterization |