Material characterization using electron holography:
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Weinheim, Germany
Wiley-VCH
[2023]
|
| Schlagworte: | |
| Online-Zugang: | DE-703 Volltext |
| Beschreibung: | 1 Online-Ressource (240 Seiten) Illustrationen |
| ISBN: | 9783527829699 9783527829705 9783527829712 |
| DOI: | 10.1002/9783527829712 |
Internformat
MARC
| LEADER | 00000nam a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV049032373 | ||
| 003 | DE-604 | ||
| 005 | 20241113 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 230704s2023 gw a||| o|||| 00||| eng d | ||
| 016 | 7 | |a 1267827319 |2 DE-101 | |
| 020 | |a 9783527829699 |c Online, PDF |9 978-3-527-82969-9 | ||
| 020 | |a 9783527829705 |c Online, EPUB |9 978-3-527-82970-5 | ||
| 020 | |a 9783527829712 |c Online, oBook |9 978-3-527-82971-2 | ||
| 024 | 7 | |a 10.1002/9783527829712 |2 doi | |
| 035 | |a (OCoLC)1392144021 | ||
| 035 | |a (DE-599)DNB1267827319 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 044 | |a gw |c XA-DE-BW | ||
| 049 | |a DE-83 |a DE-703 | ||
| 084 | |a UH 5450 |0 (DE-625)145662: |2 rvk | ||
| 084 | |a UQ 8010 |0 (DE-625)146585: |2 rvk | ||
| 100 | 1 | |a Shindo, Daisuke |d 1953- |e Verfasser |0 (DE-588)120559463 |4 aut | |
| 245 | 1 | 0 | |a Material characterization using electron holography |c Daisuke Shindo, Takeshi Tomita |
| 264 | 1 | |a Weinheim, Germany |b Wiley-VCH |c [2023] | |
| 300 | |a 1 Online-Ressource (240 Seiten) |b Illustrationen | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 650 | 0 | 7 | |a Durchstrahlungselektronenmikroskopie |0 (DE-588)4215608-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektromagnetische Eigenschaft |0 (DE-588)4624011-1 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronenholografie |0 (DE-588)4218195-1 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Maxwellsche Gleichungen |0 (DE-588)4221398-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Hochleistungswerkstoff |0 (DE-588)4312250-4 |2 gnd |9 rswk-swf |
| 653 | |a Chemie | ||
| 653 | |a Chemistry | ||
| 653 | |a Electrical & Electronics Engineering | ||
| 653 | |a Electronic Materials | ||
| 653 | |a Elektronenholographie | ||
| 653 | |a Elektronische Materialien | ||
| 653 | |a Elektrotechnik u. Elektronik | ||
| 653 | |a Materials Characterization | ||
| 653 | |a Materials Science | ||
| 653 | |a Materialwissenschaften | ||
| 653 | |a Microscopy | ||
| 653 | |a Mikroskopie | ||
| 653 | |a Werkstoffprüfung | ||
| 653 | |a CH1A: Mikroskopie | ||
| 653 | |a EEB0: Elektronische Materialien | ||
| 653 | |a MSA0: Werkstoffprüfung | ||
| 689 | 0 | 0 | |a Elektromagnetische Eigenschaft |0 (DE-588)4624011-1 |D s |
| 689 | 0 | 1 | |a Maxwellsche Gleichungen |0 (DE-588)4221398-8 |D s |
| 689 | 0 | 2 | |a Elektronenholografie |0 (DE-588)4218195-1 |D s |
| 689 | 0 | 3 | |a Hochleistungswerkstoff |0 (DE-588)4312250-4 |D s |
| 689 | 0 | 4 | |a Durchstrahlungselektronenmikroskopie |0 (DE-588)4215608-7 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Tomita, Takeshi |e Verfasser |0 (DE-588)1274695724 |4 aut | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-3-527-34804-6 |
| 856 | 4 | 0 | |u https://doi.org/10.1002/9783527829712 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-35-WIC | ||
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-034295049 | |
| 966 | e | |u https://doi.org/10.1002/9783527829712 |l DE-703 |p ZDB-35-WIC |q UBT_Einzelkauf_2023 |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1815619893922365440 |
|---|---|
| adam_text | |
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author | Shindo, Daisuke 1953- Tomita, Takeshi |
| author_GND | (DE-588)120559463 (DE-588)1274695724 |
| author_facet | Shindo, Daisuke 1953- Tomita, Takeshi |
| author_role | aut aut |
| author_sort | Shindo, Daisuke 1953- |
| author_variant | d s ds t t tt |
| building | Verbundindex |
| bvnumber | BV049032373 |
| classification_rvk | UH 5450 UQ 8010 |
| collection | ZDB-35-WIC |
| ctrlnum | (OCoLC)1392144021 (DE-599)DNB1267827319 |
| discipline | Physik |
| discipline_str_mv | Physik |
| doi_str_mv | 10.1002/9783527829712 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nam a2200000zc 4500</leader><controlfield tag="001">BV049032373</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20241113</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">230704s2023 gw a||| o|||| 00||| eng d</controlfield><datafield tag="016" ind1="7" ind2=" "><subfield code="a">1267827319</subfield><subfield code="2">DE-101</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783527829699</subfield><subfield code="c">Online, PDF</subfield><subfield code="9">978-3-527-82969-9</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783527829705</subfield><subfield code="c">Online, EPUB</subfield><subfield code="9">978-3-527-82970-5</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783527829712</subfield><subfield code="c">Online, oBook</subfield><subfield code="9">978-3-527-82971-2</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1002/9783527829712</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1392144021</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)DNB1267827319</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">gw</subfield><subfield code="c">XA-DE-BW</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-83</subfield><subfield code="a">DE-703</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 5450</subfield><subfield code="0">(DE-625)145662:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UQ 8010</subfield><subfield code="0">(DE-625)146585:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Shindo, Daisuke</subfield><subfield code="d">1953-</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)120559463</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Material characterization using electron holography</subfield><subfield code="c">Daisuke Shindo, Takeshi Tomita</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Weinheim, Germany</subfield><subfield code="b">Wiley-VCH</subfield><subfield code="c">[2023]</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (240 Seiten)</subfield><subfield code="b">Illustrationen</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Durchstrahlungselektronenmikroskopie</subfield><subfield code="0">(DE-588)4215608-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektromagnetische Eigenschaft</subfield><subfield code="0">(DE-588)4624011-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenholografie</subfield><subfield code="0">(DE-588)4218195-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Maxwellsche Gleichungen</subfield><subfield code="0">(DE-588)4221398-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Hochleistungswerkstoff</subfield><subfield code="0">(DE-588)4312250-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Chemie</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Chemistry</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Electrical & Electronics Engineering</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Electronic Materials</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Elektronenholographie</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Elektronische Materialien</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Elektrotechnik u. Elektronik</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Materials Characterization</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Materials Science</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Materialwissenschaften</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Microscopy</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Mikroskopie</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Werkstoffprüfung</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">CH1A: Mikroskopie</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">EEB0: Elektronische Materialien</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">MSA0: Werkstoffprüfung</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektromagnetische Eigenschaft</subfield><subfield code="0">(DE-588)4624011-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Maxwellsche Gleichungen</subfield><subfield code="0">(DE-588)4221398-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Elektronenholografie</subfield><subfield code="0">(DE-588)4218195-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="3"><subfield code="a">Hochleistungswerkstoff</subfield><subfield code="0">(DE-588)4312250-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="4"><subfield code="a">Durchstrahlungselektronenmikroskopie</subfield><subfield code="0">(DE-588)4215608-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Tomita, Takeshi</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)1274695724</subfield><subfield code="4">aut</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-527-34804-6</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1002/9783527829712</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-35-WIC</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-034295049</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1002/9783527829712</subfield><subfield code="l">DE-703</subfield><subfield code="p">ZDB-35-WIC</subfield><subfield code="q">UBT_Einzelkauf_2023</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV049032373 |
| illustrated | Illustrated |
| index_date | 2024-07-03T22:17:02Z |
| indexdate | 2024-11-13T15:01:01Z |
| institution | BVB |
| isbn | 9783527829699 9783527829705 9783527829712 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-034295049 |
| oclc_num | 1392144021 |
| open_access_boolean | |
| owner | DE-83 DE-703 |
| owner_facet | DE-83 DE-703 |
| physical | 1 Online-Ressource (240 Seiten) Illustrationen |
| psigel | ZDB-35-WIC ZDB-35-WIC UBT_Einzelkauf_2023 |
| publishDate | 2023 |
| publishDateSearch | 2023 |
| publishDateSort | 2023 |
| publisher | Wiley-VCH |
| record_format | marc |
| spelling | Shindo, Daisuke 1953- Verfasser (DE-588)120559463 aut Material characterization using electron holography Daisuke Shindo, Takeshi Tomita Weinheim, Germany Wiley-VCH [2023] 1 Online-Ressource (240 Seiten) Illustrationen txt rdacontent c rdamedia cr rdacarrier Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd rswk-swf Elektromagnetische Eigenschaft (DE-588)4624011-1 gnd rswk-swf Elektronenholografie (DE-588)4218195-1 gnd rswk-swf Maxwellsche Gleichungen (DE-588)4221398-8 gnd rswk-swf Hochleistungswerkstoff (DE-588)4312250-4 gnd rswk-swf Chemie Chemistry Electrical & Electronics Engineering Electronic Materials Elektronenholographie Elektronische Materialien Elektrotechnik u. Elektronik Materials Characterization Materials Science Materialwissenschaften Microscopy Mikroskopie Werkstoffprüfung CH1A: Mikroskopie EEB0: Elektronische Materialien MSA0: Werkstoffprüfung Elektromagnetische Eigenschaft (DE-588)4624011-1 s Maxwellsche Gleichungen (DE-588)4221398-8 s Elektronenholografie (DE-588)4218195-1 s Hochleistungswerkstoff (DE-588)4312250-4 s Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 s DE-604 Tomita, Takeshi Verfasser (DE-588)1274695724 aut Erscheint auch als Druck-Ausgabe 978-3-527-34804-6 https://doi.org/10.1002/9783527829712 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Shindo, Daisuke 1953- Tomita, Takeshi Material characterization using electron holography Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Elektromagnetische Eigenschaft (DE-588)4624011-1 gnd Elektronenholografie (DE-588)4218195-1 gnd Maxwellsche Gleichungen (DE-588)4221398-8 gnd Hochleistungswerkstoff (DE-588)4312250-4 gnd |
| subject_GND | (DE-588)4215608-7 (DE-588)4624011-1 (DE-588)4218195-1 (DE-588)4221398-8 (DE-588)4312250-4 |
| title | Material characterization using electron holography |
| title_auth | Material characterization using electron holography |
| title_exact_search | Material characterization using electron holography |
| title_exact_search_txtP | Material characterization using electron holography |
| title_full | Material characterization using electron holography Daisuke Shindo, Takeshi Tomita |
| title_fullStr | Material characterization using electron holography Daisuke Shindo, Takeshi Tomita |
| title_full_unstemmed | Material characterization using electron holography Daisuke Shindo, Takeshi Tomita |
| title_short | Material characterization using electron holography |
| title_sort | material characterization using electron holography |
| topic | Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Elektromagnetische Eigenschaft (DE-588)4624011-1 gnd Elektronenholografie (DE-588)4218195-1 gnd Maxwellsche Gleichungen (DE-588)4221398-8 gnd Hochleistungswerkstoff (DE-588)4312250-4 gnd |
| topic_facet | Durchstrahlungselektronenmikroskopie Elektromagnetische Eigenschaft Elektronenholografie Maxwellsche Gleichungen Hochleistungswerkstoff |
| url | https://doi.org/10.1002/9783527829712 |
| work_keys_str_mv | AT shindodaisuke materialcharacterizationusingelectronholography AT tomitatakeshi materialcharacterizationusingelectronholography |