Proceedings of the 2008 ACM SIGMETRICS international conference on Measurement and modeling of computer systems:
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Bibliographic Details
Main Author: Liu, Zhen (Author)
Corporate Author: SIGMETRICS08: ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems (Author)
Format: Electronic eBook
Language:English
Published: New York,NY,United States Association for Computing Machinery 2008
Series:ACM Conferences
Online Access:UBM01
Volltext
Physical Description:1 Online-Ressource (486 Seiten)
ISBN:9781605580050

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