Proceedings of the ACM SIGKDD Workshop on Useful Patterns:
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Bibliographic Details
Main Author: Goethals, Bart (Author)
Corporate Author: KDD '10: The 16th ACM SIGKDD International Conference on Knowledge Discovery and Data Mining (Author)
Format: Electronic eBook
Language:English
Published: New York,NY,United States Association for Computing Machinery 2010
Series:ACM Conferences
Online Access:UBM01
Volltext
Physical Description:1 Online-Ressource (82 Seiten)
ISBN:9781450302166

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