Atomic Force Microscopy: A New Look at Microbes
Saved in:
| Main Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Cham
Springer International Publishing
2020
Cham Springer |
| Edition: | 1st ed. 2020 |
| Series: | Synthesis Lectures on Materials and Optics
|
| Subjects: | |
| Online Access: | FHI01 Volltext |
| Physical Description: | 1 Online-Ressource (1 Online-Ressource (XIV, 97 Seiten)) |
| ISBN: | 9783031023859 |
| ISSN: | 2691-1949 |
| DOI: | 10.1007/978-3-031-02385-9 |
Staff View
MARC
| LEADER | 00000nmm a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV048595141 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 221206s2020 |||| o||u| ||||||eng d | ||
| 020 | |a 9783031023859 |c Online |9 978-3-031-02385-9 | ||
| 024 | 7 | |a 10.1007/978-3-031-02385-9 |2 doi | |
| 035 | |a (ZDB-2-SXSC)9783031023859 | ||
| 035 | |a (OCoLC)1354309104 | ||
| 035 | |a (DE-599)BVBBV048595141 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-573 | ||
| 082 | 0 | |a 621.366 |2 23 | |
| 100 | 1 | |a Touhami, Ahmed |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Atomic Force Microscopy |b A New Look at Microbes |c by Ahmed Touhami |
| 250 | |a 1st ed. 2020 | ||
| 264 | 1 | |a Cham |b Springer International Publishing |c 2020 | |
| 264 | 1 | |a Cham |b Springer | |
| 300 | |a 1 Online-Ressource (1 Online-Ressource (XIV, 97 Seiten)) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Synthesis Lectures on Materials and Optics |x 2691-1949 | |
| 650 | 4 | |a Laser | |
| 650 | 4 | |a Materials Science | |
| 650 | 4 | |a Lasers | |
| 650 | 4 | |a Materials science | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-3-031-00249-6 |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-3-031-01257-0 |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-3-031-03513-5 |
| 856 | 4 | 0 | |u https://doi.org/10.1007/978-3-031-02385-9 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-2-SXSC | ||
| 940 | 1 | |q ZDB-2-SXSC_2020 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-033970777 | ||
| 966 | e | |u https://doi.org/10.1007/978-3-031-02385-9 |l FHI01 |p ZDB-2-SXSC |x Verlag |3 Volltext | |
Record in the Search Index
| _version_ | 1804184636232826880 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author | Touhami, Ahmed |
| author_facet | Touhami, Ahmed |
| author_role | aut |
| author_sort | Touhami, Ahmed |
| author_variant | a t at |
| building | Verbundindex |
| bvnumber | BV048595141 |
| collection | ZDB-2-SXSC |
| ctrlnum | (ZDB-2-SXSC)9783031023859 (OCoLC)1354309104 (DE-599)BVBBV048595141 |
| dewey-full | 621.366 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.366 |
| dewey-search | 621.366 |
| dewey-sort | 3621.366 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| discipline_str_mv | Elektrotechnik / Elektronik / Nachrichtentechnik |
| doi_str_mv | 10.1007/978-3-031-02385-9 |
| edition | 1st ed. 2020 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01620nmm a2200457zcb4500</leader><controlfield tag="001">BV048595141</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">221206s2020 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783031023859</subfield><subfield code="c">Online</subfield><subfield code="9">978-3-031-02385-9</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-3-031-02385-9</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-2-SXSC)9783031023859</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1354309104</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV048595141</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-573</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.366</subfield><subfield code="2">23</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Touhami, Ahmed</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Atomic Force Microscopy</subfield><subfield code="b">A New Look at Microbes</subfield><subfield code="c">by Ahmed Touhami</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1st ed. 2020</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cham</subfield><subfield code="b">Springer International Publishing</subfield><subfield code="c">2020</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cham</subfield><subfield code="b">Springer</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (1 Online-Ressource (XIV, 97 Seiten))</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Synthesis Lectures on Materials and Optics</subfield><subfield code="x">2691-1949</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Laser</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Materials Science</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Lasers</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Materials science</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-031-00249-6</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-031-01257-0</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-031-03513-5</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-3-031-02385-9</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-SXSC</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-SXSC_2020</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-033970777</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-02385-9</subfield><subfield code="l">FHI01</subfield><subfield code="p">ZDB-2-SXSC</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV048595141 |
| illustrated | Not Illustrated |
| index_date | 2024-07-03T21:08:29Z |
| indexdate | 2024-07-10T09:42:29Z |
| institution | BVB |
| isbn | 9783031023859 |
| issn | 2691-1949 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-033970777 |
| oclc_num | 1354309104 |
| open_access_boolean | |
| owner | DE-573 |
| owner_facet | DE-573 |
| physical | 1 Online-Ressource (1 Online-Ressource (XIV, 97 Seiten)) |
| psigel | ZDB-2-SXSC ZDB-2-SXSC_2020 |
| publishDate | 2020 |
| publishDateSearch | 2020 |
| publishDateSort | 2020 |
| publisher | Springer International Publishing Springer |
| record_format | marc |
| series2 | Synthesis Lectures on Materials and Optics |
| spelling | Touhami, Ahmed Verfasser aut Atomic Force Microscopy A New Look at Microbes by Ahmed Touhami 1st ed. 2020 Cham Springer International Publishing 2020 Cham Springer 1 Online-Ressource (1 Online-Ressource (XIV, 97 Seiten)) txt rdacontent c rdamedia cr rdacarrier Synthesis Lectures on Materials and Optics 2691-1949 Laser Materials Science Lasers Materials science Erscheint auch als Druck-Ausgabe 978-3-031-00249-6 Erscheint auch als Druck-Ausgabe 978-3-031-01257-0 Erscheint auch als Druck-Ausgabe 978-3-031-03513-5 https://doi.org/10.1007/978-3-031-02385-9 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Touhami, Ahmed Atomic Force Microscopy A New Look at Microbes Laser Materials Science Lasers Materials science |
| title | Atomic Force Microscopy A New Look at Microbes |
| title_auth | Atomic Force Microscopy A New Look at Microbes |
| title_exact_search | Atomic Force Microscopy A New Look at Microbes |
| title_exact_search_txtP | Atomic Force Microscopy A New Look at Microbes |
| title_full | Atomic Force Microscopy A New Look at Microbes by Ahmed Touhami |
| title_fullStr | Atomic Force Microscopy A New Look at Microbes by Ahmed Touhami |
| title_full_unstemmed | Atomic Force Microscopy A New Look at Microbes by Ahmed Touhami |
| title_short | Atomic Force Microscopy |
| title_sort | atomic force microscopy a new look at microbes |
| title_sub | A New Look at Microbes |
| topic | Laser Materials Science Lasers Materials science |
| topic_facet | Laser Materials Science Lasers Materials science |
| url | https://doi.org/10.1007/978-3-031-02385-9 |
| work_keys_str_mv | AT touhamiahmed atomicforcemicroscopyanewlookatmicrobes |