Wee, A. T. S., Yin, X., & Tang, C. S. (2022). Introduction to spectroscopic ellipsometry of thin film materials: Instrumentation, data analysis, and applications. Wiley-VCH.
Chicago Style (17th ed.) CitationWee, Andrew T. S., Xinmao Yin, and Chi Sin Tang. Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis, and Applications. Weinheim: Wiley-VCH, 2022.
MLA (9th ed.) CitationWee, Andrew T. S., et al. Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis, and Applications. Wiley-VCH, 2022.
Warning: These citations may not always be 100% accurate.