Indexing of Crystal Diffraction Patterns: From Crystallography Basics to Methods of Automatic Indexing
Saved in:
| Main Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Cham
Springer International Publishing
2022
Cham Springer |
| Edition: | 1st ed. 2022 |
| Series: | Springer Series in Materials Science
326 |
| Subjects: | |
| Online Access: | BFB01 FKE01 TUM01 UBM01 UBT01 UBY01 Volltext |
| Physical Description: | 1 Online-Ressource (XX, 418 p. 148 illus) |
| ISBN: | 9783031110771 |
| ISSN: | 2196-2812 |
| DOI: | 10.1007/978-3-031-11077-1 |
Staff View
MARC
| LEADER | 00000nmm a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV048496036 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 221004s2022 |||| o||u| ||||||eng d | ||
| 020 | |a 9783031110771 |c Online |9 978-3-031-11077-1 | ||
| 024 | 7 | |a 10.1007/978-3-031-11077-1 |2 doi | |
| 035 | |a (ZDB-2-PHA)9783031110771 | ||
| 035 | |a (OCoLC)1347213129 | ||
| 035 | |a (DE-599)BVBBV048496036 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-91 |a DE-19 |a DE-706 |a DE-522 |a DE-859 |a DE-703 | ||
| 082 | 0 | |a 548 |2 23 | |
| 084 | |a PHY 000 |2 stub | ||
| 100 | 1 | |a Morawiec, Adam |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Indexing of Crystal Diffraction Patterns |b From Crystallography Basics to Methods of Automatic Indexing |c by Adam Morawiec |
| 250 | |a 1st ed. 2022 | ||
| 264 | 1 | |a Cham |b Springer International Publishing |c 2022 | |
| 264 | 1 | |a Cham |b Springer | |
| 300 | |a 1 Online-Ressource (XX, 418 p. 148 illus) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Springer Series in Materials Science |v 326 |x 2196-2812 | |
| 650 | 4 | |a Crystallography and Scattering Methods | |
| 650 | 4 | |a Metals and Alloys | |
| 650 | 4 | |a Computational Materials Science | |
| 650 | 4 | |a Diffraction | |
| 650 | 4 | |a X-Ray Spectroscopy | |
| 650 | 4 | |a Microscopy | |
| 650 | 4 | |a Crystallography | |
| 650 | 4 | |a Metals | |
| 650 | 4 | |a Materials science—Data processing | |
| 650 | 4 | |a Electrons—Diffraction | |
| 650 | 4 | |a Instrumental analysis | |
| 650 | 4 | |a X-ray spectroscopy | |
| 650 | 4 | |a Materials—Microscopy | |
| 650 | 0 | 7 | |a Streifenbild |0 (DE-588)4225653-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Kristall |0 (DE-588)4033209-3 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Kristall |0 (DE-588)4033209-3 |D s |
| 689 | 0 | 1 | |a Streifenbild |0 (DE-588)4225653-7 |D s |
| 689 | 0 | |5 DE-604 | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-3-031-11076-4 |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-3-031-11078-8 |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-3-031-11079-5 |
| 856 | 4 | 0 | |u https://doi.org/10.1007/978-3-031-11077-1 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-2-PHA | ||
| 940 | 1 | |q ZDB-2-PHA_2022 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-033873391 | ||
| 966 | e | |u https://doi.org/10.1007/978-3-031-11077-1 |l BFB01 |p ZDB-2-PHA |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-031-11077-1 |l FKE01 |p ZDB-2-PHA |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-031-11077-1 |l TUM01 |p ZDB-2-PHA |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-031-11077-1 |l UBM01 |p ZDB-2-PHA |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-031-11077-1 |l UBT01 |p ZDB-2-PHA |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-031-11077-1 |l UBY01 |p ZDB-2-PHA |x Verlag |3 Volltext | |
Record in the Search Index
| _version_ | 1804184460117147648 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author | Morawiec, Adam |
| author_facet | Morawiec, Adam |
| author_role | aut |
| author_sort | Morawiec, Adam |
| author_variant | a m am |
| building | Verbundindex |
| bvnumber | BV048496036 |
| classification_tum | PHY 000 |
| collection | ZDB-2-PHA |
| ctrlnum | (ZDB-2-PHA)9783031110771 (OCoLC)1347213129 (DE-599)BVBBV048496036 |
| dewey-full | 548 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 548 - Crystallography |
| dewey-raw | 548 |
| dewey-search | 548 |
| dewey-sort | 3548 |
| dewey-tens | 540 - Chemistry and allied sciences |
| discipline | Chemie / Pharmazie Physik |
| discipline_str_mv | Chemie / Pharmazie Physik |
| doi_str_mv | 10.1007/978-3-031-11077-1 |
| edition | 1st ed. 2022 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02805nmm a2200697zcb4500</leader><controlfield tag="001">BV048496036</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">221004s2022 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783031110771</subfield><subfield code="c">Online</subfield><subfield code="9">978-3-031-11077-1</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-3-031-11077-1</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-2-PHA)9783031110771</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1347213129</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV048496036</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield><subfield code="a">DE-19</subfield><subfield code="a">DE-706</subfield><subfield code="a">DE-522</subfield><subfield code="a">DE-859</subfield><subfield code="a">DE-703</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">548</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Morawiec, Adam</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Indexing of Crystal Diffraction Patterns</subfield><subfield code="b">From Crystallography Basics to Methods of Automatic Indexing</subfield><subfield code="c">by Adam Morawiec</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1st ed. 2022</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cham</subfield><subfield code="b">Springer International Publishing</subfield><subfield code="c">2022</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cham</subfield><subfield code="b">Springer</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XX, 418 p. 148 illus)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Springer Series in Materials Science</subfield><subfield code="v">326</subfield><subfield code="x">2196-2812</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Crystallography and Scattering Methods</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Metals and Alloys</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Computational Materials Science</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Diffraction</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">X-Ray Spectroscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Crystallography</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Metals</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Materials science—Data processing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electrons—Diffraction</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Instrumental analysis</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">X-ray spectroscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Materials—Microscopy</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Streifenbild</subfield><subfield code="0">(DE-588)4225653-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Kristall</subfield><subfield code="0">(DE-588)4033209-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Kristall</subfield><subfield code="0">(DE-588)4033209-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Streifenbild</subfield><subfield code="0">(DE-588)4225653-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-031-11076-4</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-031-11078-8</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-031-11079-5</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-3-031-11077-1</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-PHA</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-PHA_2022</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-033873391</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-11077-1</subfield><subfield code="l">BFB01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-11077-1</subfield><subfield code="l">FKE01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-11077-1</subfield><subfield code="l">TUM01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-11077-1</subfield><subfield code="l">UBM01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-11077-1</subfield><subfield code="l">UBT01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-11077-1</subfield><subfield code="l">UBY01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV048496036 |
| illustrated | Not Illustrated |
| index_date | 2024-07-03T20:43:18Z |
| indexdate | 2024-07-10T09:39:41Z |
| institution | BVB |
| isbn | 9783031110771 |
| issn | 2196-2812 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-033873391 |
| oclc_num | 1347213129 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-19 DE-BY-UBM DE-706 DE-522 DE-859 DE-703 |
| owner_facet | DE-91 DE-BY-TUM DE-19 DE-BY-UBM DE-706 DE-522 DE-859 DE-703 |
| physical | 1 Online-Ressource (XX, 418 p. 148 illus) |
| psigel | ZDB-2-PHA ZDB-2-PHA_2022 |
| publishDate | 2022 |
| publishDateSearch | 2022 |
| publishDateSort | 2022 |
| publisher | Springer International Publishing Springer |
| record_format | marc |
| series2 | Springer Series in Materials Science |
| spelling | Morawiec, Adam Verfasser aut Indexing of Crystal Diffraction Patterns From Crystallography Basics to Methods of Automatic Indexing by Adam Morawiec 1st ed. 2022 Cham Springer International Publishing 2022 Cham Springer 1 Online-Ressource (XX, 418 p. 148 illus) txt rdacontent c rdamedia cr rdacarrier Springer Series in Materials Science 326 2196-2812 Crystallography and Scattering Methods Metals and Alloys Computational Materials Science Diffraction X-Ray Spectroscopy Microscopy Crystallography Metals Materials science—Data processing Electrons—Diffraction Instrumental analysis X-ray spectroscopy Materials—Microscopy Streifenbild (DE-588)4225653-7 gnd rswk-swf Kristall (DE-588)4033209-3 gnd rswk-swf Kristall (DE-588)4033209-3 s Streifenbild (DE-588)4225653-7 s DE-604 Erscheint auch als Druck-Ausgabe 978-3-031-11076-4 Erscheint auch als Druck-Ausgabe 978-3-031-11078-8 Erscheint auch als Druck-Ausgabe 978-3-031-11079-5 https://doi.org/10.1007/978-3-031-11077-1 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Morawiec, Adam Indexing of Crystal Diffraction Patterns From Crystallography Basics to Methods of Automatic Indexing Crystallography and Scattering Methods Metals and Alloys Computational Materials Science Diffraction X-Ray Spectroscopy Microscopy Crystallography Metals Materials science—Data processing Electrons—Diffraction Instrumental analysis X-ray spectroscopy Materials—Microscopy Streifenbild (DE-588)4225653-7 gnd Kristall (DE-588)4033209-3 gnd |
| subject_GND | (DE-588)4225653-7 (DE-588)4033209-3 |
| title | Indexing of Crystal Diffraction Patterns From Crystallography Basics to Methods of Automatic Indexing |
| title_auth | Indexing of Crystal Diffraction Patterns From Crystallography Basics to Methods of Automatic Indexing |
| title_exact_search | Indexing of Crystal Diffraction Patterns From Crystallography Basics to Methods of Automatic Indexing |
| title_exact_search_txtP | Indexing of Crystal Diffraction Patterns From Crystallography Basics to Methods of Automatic Indexing |
| title_full | Indexing of Crystal Diffraction Patterns From Crystallography Basics to Methods of Automatic Indexing by Adam Morawiec |
| title_fullStr | Indexing of Crystal Diffraction Patterns From Crystallography Basics to Methods of Automatic Indexing by Adam Morawiec |
| title_full_unstemmed | Indexing of Crystal Diffraction Patterns From Crystallography Basics to Methods of Automatic Indexing by Adam Morawiec |
| title_short | Indexing of Crystal Diffraction Patterns |
| title_sort | indexing of crystal diffraction patterns from crystallography basics to methods of automatic indexing |
| title_sub | From Crystallography Basics to Methods of Automatic Indexing |
| topic | Crystallography and Scattering Methods Metals and Alloys Computational Materials Science Diffraction X-Ray Spectroscopy Microscopy Crystallography Metals Materials science—Data processing Electrons—Diffraction Instrumental analysis X-ray spectroscopy Materials—Microscopy Streifenbild (DE-588)4225653-7 gnd Kristall (DE-588)4033209-3 gnd |
| topic_facet | Crystallography and Scattering Methods Metals and Alloys Computational Materials Science Diffraction X-Ray Spectroscopy Microscopy Crystallography Metals Materials science—Data processing Electrons—Diffraction Instrumental analysis X-ray spectroscopy Materials—Microscopy Streifenbild Kristall |
| url | https://doi.org/10.1007/978-3-031-11077-1 |
| work_keys_str_mv | AT morawiecadam indexingofcrystaldiffractionpatternsfromcrystallographybasicstomethodsofautomaticindexing |