Practical electron microscopy of lattice defects:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New Jersey ; London ; Singapore ; Beijing ; Shanghai ; Hong Kong ; Taipei ; Chennai ; Tokyo
World Scientific
[2021]
|
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | Literaturverzeichnis: Seite 285-286 |
| Beschreibung: | xiii, 294 Seiten Illustrationen, Diagramme |
| ISBN: | 9789811234699 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV048419198 | ||
| 003 | DE-604 | ||
| 005 | 20221006 | ||
| 007 | t | ||
| 008 | 220824s2021 xxua||| |||| 00||| eng d | ||
| 020 | |a 9789811234699 |c hardcover |9 978-981-123-469-9 | ||
| 035 | |a (OCoLC)1347215509 | ||
| 035 | |a (DE-599)KXP1760812757 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 044 | |a xxu |c XD-US |a xxk |c XA-GB |a si |c XB-SG |a cc |c XB-CN |a cc |c XB-HK |a cc |c XB-TW |a ii |c XB-IN |a ja |c XB-JP | ||
| 049 | |a DE-703 | ||
| 084 | |a 51.30 |2 bkl | ||
| 084 | |a 33.61 |2 bkl | ||
| 100 | 1 | |a Saka, Hiroyasu |e Verfasser |0 (DE-588)1147711194 |4 aut | |
| 245 | 1 | 0 | |a Practical electron microscopy of lattice defects |c Hiroyasu Saka (Aichi Institute of Technology and Nagoya University, Japan) |
| 264 | 1 | |a New Jersey ; London ; Singapore ; Beijing ; Shanghai ; Hong Kong ; Taipei ; Chennai ; Tokyo |b World Scientific |c [2021] | |
| 300 | |a xiii, 294 Seiten |b Illustrationen, Diagramme | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a Literaturverzeichnis: Seite 285-286 | ||
| 650 | 0 | 7 | |a Gitterbaufehler |0 (DE-588)4125030-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Gitterbaufehler |0 (DE-588)4125030-8 |D s |
| 689 | 0 | 1 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
| 689 | 0 | |5 DE-604 | |
| 776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe (ebook for institutions) |z 978-981-123-470-5 |
| 776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe (ebook for individuals) |z 978-981-123-471-2 |
| 856 | 4 | 2 | |m B:DE-89 |m V:DE-601 |q pdf/application |u https://www.gbv.de/dms/tib-ub-hannover/1760812757.pdf |3 Inhaltsverzeichnis |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-033797528 | ||
Datensatz im Suchindex
| _version_ | 1804184334181072896 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author | Saka, Hiroyasu |
| author_GND | (DE-588)1147711194 |
| author_facet | Saka, Hiroyasu |
| author_role | aut |
| author_sort | Saka, Hiroyasu |
| author_variant | h s hs |
| building | Verbundindex |
| bvnumber | BV048419198 |
| ctrlnum | (OCoLC)1347215509 (DE-599)KXP1760812757 |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01720nam a2200397 c 4500</leader><controlfield tag="001">BV048419198</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20221006 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">220824s2021 xxua||| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9789811234699</subfield><subfield code="c">hardcover</subfield><subfield code="9">978-981-123-469-9</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1347215509</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)KXP1760812757</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">xxu</subfield><subfield code="c">XD-US</subfield><subfield code="a">xxk</subfield><subfield code="c">XA-GB</subfield><subfield code="a">si</subfield><subfield code="c">XB-SG</subfield><subfield code="a">cc</subfield><subfield code="c">XB-CN</subfield><subfield code="a">cc</subfield><subfield code="c">XB-HK</subfield><subfield code="a">cc</subfield><subfield code="c">XB-TW</subfield><subfield code="a">ii</subfield><subfield code="c">XB-IN</subfield><subfield code="a">ja</subfield><subfield code="c">XB-JP</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">51.30</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">33.61</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Saka, Hiroyasu</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)1147711194</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Practical electron microscopy of lattice defects</subfield><subfield code="c">Hiroyasu Saka (Aichi Institute of Technology and Nagoya University, Japan)</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New Jersey ; London ; Singapore ; Beijing ; Shanghai ; Hong Kong ; Taipei ; Chennai ; Tokyo</subfield><subfield code="b">World Scientific</subfield><subfield code="c">[2021]</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xiii, 294 Seiten</subfield><subfield code="b">Illustrationen, Diagramme</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Literaturverzeichnis: Seite 285-286</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Gitterbaufehler</subfield><subfield code="0">(DE-588)4125030-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Gitterbaufehler</subfield><subfield code="0">(DE-588)4125030-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Online-Ausgabe (ebook for institutions)</subfield><subfield code="z">978-981-123-470-5</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Online-Ausgabe (ebook for individuals)</subfield><subfield code="z">978-981-123-471-2</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">B:DE-89</subfield><subfield code="m">V:DE-601</subfield><subfield code="q">pdf/application</subfield><subfield code="u">https://www.gbv.de/dms/tib-ub-hannover/1760812757.pdf</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-033797528</subfield></datafield></record></collection> |
| id | DE-604.BV048419198 |
| illustrated | Illustrated |
| index_date | 2024-07-03T20:27:12Z |
| indexdate | 2024-07-10T09:37:41Z |
| institution | BVB |
| isbn | 9789811234699 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-033797528 |
| oclc_num | 1347215509 |
| open_access_boolean | |
| owner | DE-703 |
| owner_facet | DE-703 |
| physical | xiii, 294 Seiten Illustrationen, Diagramme |
| publishDate | 2021 |
| publishDateSearch | 2021 |
| publishDateSort | 2021 |
| publisher | World Scientific |
| record_format | marc |
| spelling | Saka, Hiroyasu Verfasser (DE-588)1147711194 aut Practical electron microscopy of lattice defects Hiroyasu Saka (Aichi Institute of Technology and Nagoya University, Japan) New Jersey ; London ; Singapore ; Beijing ; Shanghai ; Hong Kong ; Taipei ; Chennai ; Tokyo World Scientific [2021] xiii, 294 Seiten Illustrationen, Diagramme txt rdacontent n rdamedia nc rdacarrier Literaturverzeichnis: Seite 285-286 Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Gitterbaufehler (DE-588)4125030-8 s Elektronenmikroskopie (DE-588)4014327-2 s DE-604 Erscheint auch als Online-Ausgabe (ebook for institutions) 978-981-123-470-5 Erscheint auch als Online-Ausgabe (ebook for individuals) 978-981-123-471-2 B:DE-89 V:DE-601 pdf/application https://www.gbv.de/dms/tib-ub-hannover/1760812757.pdf Inhaltsverzeichnis |
| spellingShingle | Saka, Hiroyasu Practical electron microscopy of lattice defects Gitterbaufehler (DE-588)4125030-8 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4125030-8 (DE-588)4014327-2 |
| title | Practical electron microscopy of lattice defects |
| title_auth | Practical electron microscopy of lattice defects |
| title_exact_search | Practical electron microscopy of lattice defects |
| title_exact_search_txtP | Practical electron microscopy of lattice defects |
| title_full | Practical electron microscopy of lattice defects Hiroyasu Saka (Aichi Institute of Technology and Nagoya University, Japan) |
| title_fullStr | Practical electron microscopy of lattice defects Hiroyasu Saka (Aichi Institute of Technology and Nagoya University, Japan) |
| title_full_unstemmed | Practical electron microscopy of lattice defects Hiroyasu Saka (Aichi Institute of Technology and Nagoya University, Japan) |
| title_short | Practical electron microscopy of lattice defects |
| title_sort | practical electron microscopy of lattice defects |
| topic | Gitterbaufehler (DE-588)4125030-8 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Gitterbaufehler Elektronenmikroskopie |
| url | https://www.gbv.de/dms/tib-ub-hannover/1760812757.pdf |
| work_keys_str_mv | AT sakahiroyasu practicalelectronmicroscopyoflatticedefects |