The Use of Patent Statistics for International Comparisons and Analysis of Narrow Technological Fields:
Patent data provide an increasingly used means to analyse innovation performance worldwide including in countries with incomplete data coverage, such as some developing countries. This paper discusses the specific issues associated with using patent data for measuring and analysing innovation in nar...
Gespeichert in:
| 1. Verfasser: | |
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| Weitere Verfasser: | , |
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Paris
OECD Publishing
2015
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| Schriftenreihe: | OECD Science, Technology and Industry Working Papers
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| Schlagworte: | |
| Online-Zugang: | Volltext |
| Zusammenfassung: | Patent data provide an increasingly used means to analyse innovation performance worldwide including in countries with incomplete data coverage, such as some developing countries. This paper discusses the specific issues associated with using patent data for measuring and analysing innovation in narrow technological fields, such as many environment-related technologies. To improve cross-country comparability of patent statistics, the paper advocates the use of indicators based on patent family size because they are more flexible and can be adapted to various applications. The paper also examines certain idiosyncratic characteristics of patent databases and proposes approaches to mitigate potential biases in empirical cross-country analyses. While doing so is particularly important for analyses of narrow technological fields such as many environment- and climate-related technologies, some of these issues are relevant for patent analysis more broadly |
| Beschreibung: | 1 Online-Ressource (41 Seiten) 21 x 29.7cm |
| DOI: | 10.1787/5js03z98mvr7-en |
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| spelling | Haščič, Ivan Verfasser aut The Use of Patent Statistics for International Comparisons and Analysis of Narrow Technological Fields Ivan Haščič, Jérôme Silva and Nick Johnstone Paris OECD Publishing 2015 1 Online-Ressource (41 Seiten) 21 x 29.7cm txt rdacontent c rdamedia cr rdacarrier OECD Science, Technology and Industry Working Papers Patent data provide an increasingly used means to analyse innovation performance worldwide including in countries with incomplete data coverage, such as some developing countries. This paper discusses the specific issues associated with using patent data for measuring and analysing innovation in narrow technological fields, such as many environment-related technologies. To improve cross-country comparability of patent statistics, the paper advocates the use of indicators based on patent family size because they are more flexible and can be adapted to various applications. The paper also examines certain idiosyncratic characteristics of patent databases and proposes approaches to mitigate potential biases in empirical cross-country analyses. While doing so is particularly important for analyses of narrow technological fields such as many environment- and climate-related technologies, some of these issues are relevant for patent analysis more broadly Science and Technology Industry and Services Silva, Jérôme ctb Johnstone, Nick ctb https://doi.org/10.1787/5js03z98mvr7-en Verlag kostenfrei Volltext |
| spellingShingle | Haščič, Ivan The Use of Patent Statistics for International Comparisons and Analysis of Narrow Technological Fields Science and Technology Industry and Services |
| title | The Use of Patent Statistics for International Comparisons and Analysis of Narrow Technological Fields |
| title_auth | The Use of Patent Statistics for International Comparisons and Analysis of Narrow Technological Fields |
| title_exact_search | The Use of Patent Statistics for International Comparisons and Analysis of Narrow Technological Fields |
| title_exact_search_txtP | The Use of Patent Statistics for International Comparisons and Analysis of Narrow Technological Fields |
| title_full | The Use of Patent Statistics for International Comparisons and Analysis of Narrow Technological Fields Ivan Haščič, Jérôme Silva and Nick Johnstone |
| title_fullStr | The Use of Patent Statistics for International Comparisons and Analysis of Narrow Technological Fields Ivan Haščič, Jérôme Silva and Nick Johnstone |
| title_full_unstemmed | The Use of Patent Statistics for International Comparisons and Analysis of Narrow Technological Fields Ivan Haščič, Jérôme Silva and Nick Johnstone |
| title_short | The Use of Patent Statistics for International Comparisons and Analysis of Narrow Technological Fields |
| title_sort | the use of patent statistics for international comparisons and analysis of narrow technological fields |
| topic | Science and Technology Industry and Services |
| topic_facet | Science and Technology Industry and Services |
| url | https://doi.org/10.1787/5js03z98mvr7-en |
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