Recent Advances in PMOS Negative Bias Temperature Instability: Characterization and Modeling of Device Architecture, Material and Process Impact
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Singapore
Springer Singapore
2022
Singapore Springer |
| Ausgabe: | 1st ed. 2022 |
| Schlagworte: | |
| Online-Zugang: | BTU01 FAB01 FAW01 FHA01 FHD01 FHI01 FHM01 FHN01 FHR01 FKE01 FLA01 FRO01 FWS01 FWS02 HTW01 TUM01 UBY01 UER01 URL des Erstveröffentlichers |
| Beschreibung: | 1 Online-Ressource (XXIII, 311 p. 213 illus., 189 illus. in color) |
| ISBN: | 9789811661204 |
| DOI: | 10.1007/978-981-16-6120-4 |
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| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik Maschinenbau |
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| edition | 1st ed. 2022 |
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| spellingShingle | Recent Advances in PMOS Negative Bias Temperature Instability Characterization and Modeling of Device Architecture, Material and Process Impact Electronic Circuits and Systems Electronics and Microelectronics, Instrumentation Electronic Devices Electronic circuits Electronics Solid state physics |
| title | Recent Advances in PMOS Negative Bias Temperature Instability Characterization and Modeling of Device Architecture, Material and Process Impact |
| title_auth | Recent Advances in PMOS Negative Bias Temperature Instability Characterization and Modeling of Device Architecture, Material and Process Impact |
| title_exact_search | Recent Advances in PMOS Negative Bias Temperature Instability Characterization and Modeling of Device Architecture, Material and Process Impact |
| title_exact_search_txtP | Recent Advances in PMOS Negative Bias Temperature Instability Characterization and Modeling of Device Architecture, Material and Process Impact |
| title_full | Recent Advances in PMOS Negative Bias Temperature Instability Characterization and Modeling of Device Architecture, Material and Process Impact edited by Souvik Mahapatra |
| title_fullStr | Recent Advances in PMOS Negative Bias Temperature Instability Characterization and Modeling of Device Architecture, Material and Process Impact edited by Souvik Mahapatra |
| title_full_unstemmed | Recent Advances in PMOS Negative Bias Temperature Instability Characterization and Modeling of Device Architecture, Material and Process Impact edited by Souvik Mahapatra |
| title_short | Recent Advances in PMOS Negative Bias Temperature Instability |
| title_sort | recent advances in pmos negative bias temperature instability characterization and modeling of device architecture material and process impact |
| title_sub | Characterization and Modeling of Device Architecture, Material and Process Impact |
| topic | Electronic Circuits and Systems Electronics and Microelectronics, Instrumentation Electronic Devices Electronic circuits Electronics Solid state physics |
| topic_facet | Electronic Circuits and Systems Electronics and Microelectronics, Instrumentation Electronic Devices Electronic circuits Electronics Solid state physics |
| url | https://doi.org/10.1007/978-981-16-6120-4 |
| work_keys_str_mv | AT mahapatrasouvik recentadvancesinpmosnegativebiastemperatureinstabilitycharacterizationandmodelingofdevicearchitecturematerialandprocessimpact |