Systematic analysis of the impact of line-edge roughness on the X-ray scattering pattern:
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Bibliographic Details
Main Author: Fernández Herrero, Analía (Author)
Format: Thesis Electronic eBook
Language:English
Published: Berlin 2021
Subjects:
Online Access:Volltext
Physical Description:1 Online-Ressource (vi, 138 Seiten) Illustrationen, Diagramme
DOI:10.14279/depositonce-12320

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