Dual Port SRAM Bit Line Coupling Between Ports:
Course content reaffirmed: 06/2015--The influence that one port can have on the other port bit line can be a subtle, yet costly problem if not fully evaluated, and can in fact result in the design not working. Capacitive coupling between neighboring bit lines must be properly modeled and evaluated t...
Saved in:
| Main Author: | |
|---|---|
| Format: | Electronic Video |
| Language: | English |
| Published: |
United States
IEEE
2012
|
| Subjects: | |
| Online Access: | FHN01 TUM01 |
| Summary: | Course content reaffirmed: 06/2015--The influence that one port can have on the other port bit line can be a subtle, yet costly problem if not fully evaluated, and can in fact result in the design not working. Capacitive coupling between neighboring bit lines must be properly modeled and evaluated to determine their impact based on the different conditions that can occur in a dual port. This tutorial evaluates the worst case circumstances that can cause the differential during a read to be degraded - such as writing from one port while reading from the other, data dependency and bit cell location |
| Item Description: | Description based on online resource; title from title screen (IEEE Xplore Digital Library, viewed November 17, 2020) |
| Physical Description: | 1 Online-Resource (1 Videodatei, 60 Minuten) color illustrations |
| ISBN: | 9781467306201 |
Staff View
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV047477181 | ||
| 003 | DE-604 | ||
| 005 | 20220216 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 210921s2012 |||| o||u| ||||||eng d | ||
| 020 | |a 9781467306201 |9 978-1-4673-0620-1 | ||
| 035 | |a (ZDB-37-ICG)EDP263 | ||
| 035 | |a (OCoLC)1269391281 | ||
| 035 | |a (DE-599)BVBBV047477181 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-91 |a DE-92 | ||
| 082 | 0 | |a 621.38195833 |2 23 | |
| 100 | 1 | |a Sheppard, Doug |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Dual Port SRAM Bit Line Coupling Between Ports |c Doug Sheppard |
| 264 | 1 | |a United States |b IEEE |c 2012 | |
| 300 | |a 1 Online-Resource (1 Videodatei, 60 Minuten) |b color illustrations | ||
| 336 | |b tdi |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Description based on online resource; title from title screen (IEEE Xplore Digital Library, viewed November 17, 2020) | ||
| 520 | |a Course content reaffirmed: 06/2015--The influence that one port can have on the other port bit line can be a subtle, yet costly problem if not fully evaluated, and can in fact result in the design not working. Capacitive coupling between neighboring bit lines must be properly modeled and evaluated to determine their impact based on the different conditions that can occur in a dual port. This tutorial evaluates the worst case circumstances that can cause the differential during a read to be degraded - such as writing from one port while reading from the other, data dependency and bit cell location | ||
| 650 | 4 | |a Random access memory | |
| 655 | 7 | |0 (DE-588)4017102-4 |a Film |2 gnd-content | |
| 912 | |a ZDB-37-ICG | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-032878742 | ||
| 966 | e | |u https://ieeexplore.ieee.org/courses/details/EDP263 |l FHN01 |p ZDB-37-ICG |x Verlag |3 Volltext | |
| 966 | e | |u https://ieeexplore.ieee.org/courses/details/EDP263 |l TUM01 |p ZDB-37-ICG |x Verlag |3 Volltext | |
Record in the Search Index
| _version_ | 1804182793178054656 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author | Sheppard, Doug |
| author_facet | Sheppard, Doug |
| author_role | aut |
| author_sort | Sheppard, Doug |
| author_variant | d s ds |
| building | Verbundindex |
| bvnumber | BV047477181 |
| collection | ZDB-37-ICG |
| ctrlnum | (ZDB-37-ICG)EDP263 (OCoLC)1269391281 (DE-599)BVBBV047477181 |
| dewey-full | 621.38195833 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.38195833 |
| dewey-search | 621.38195833 |
| dewey-sort | 3621.38195833 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| discipline_str_mv | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic Video |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01922nmm a2200361zc 4500</leader><controlfield tag="001">BV047477181</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20220216 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">210921s2012 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781467306201</subfield><subfield code="9">978-1-4673-0620-1</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-37-ICG)EDP263</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1269391281</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV047477181</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield><subfield code="a">DE-92</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.38195833</subfield><subfield code="2">23</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Sheppard, Doug</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Dual Port SRAM Bit Line Coupling Between Ports</subfield><subfield code="c">Doug Sheppard</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">United States</subfield><subfield code="b">IEEE</subfield><subfield code="c">2012</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Resource (1 Videodatei, 60 Minuten)</subfield><subfield code="b">color illustrations</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">tdi</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Description based on online resource; title from title screen (IEEE Xplore Digital Library, viewed November 17, 2020)</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Course content reaffirmed: 06/2015--The influence that one port can have on the other port bit line can be a subtle, yet costly problem if not fully evaluated, and can in fact result in the design not working. Capacitive coupling between neighboring bit lines must be properly modeled and evaluated to determine their impact based on the different conditions that can occur in a dual port. This tutorial evaluates the worst case circumstances that can cause the differential during a read to be degraded - such as writing from one port while reading from the other, data dependency and bit cell location</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Random access memory</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)4017102-4</subfield><subfield code="a">Film</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-37-ICG</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-032878742</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://ieeexplore.ieee.org/courses/details/EDP263</subfield><subfield code="l">FHN01</subfield><subfield code="p">ZDB-37-ICG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://ieeexplore.ieee.org/courses/details/EDP263</subfield><subfield code="l">TUM01</subfield><subfield code="p">ZDB-37-ICG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| genre | (DE-588)4017102-4 Film gnd-content |
| genre_facet | Film |
| id | DE-604.BV047477181 |
| illustrated | Illustrated |
| index_date | 2024-07-03T18:11:31Z |
| indexdate | 2024-07-10T09:13:11Z |
| institution | BVB |
| isbn | 9781467306201 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-032878742 |
| oclc_num | 1269391281 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-92 |
| owner_facet | DE-91 DE-BY-TUM DE-92 |
| physical | 1 Online-Resource (1 Videodatei, 60 Minuten) color illustrations |
| psigel | ZDB-37-ICG |
| publishDate | 2012 |
| publishDateSearch | 2012 |
| publishDateSort | 2012 |
| publisher | IEEE |
| record_format | marc |
| spelling | Sheppard, Doug Verfasser aut Dual Port SRAM Bit Line Coupling Between Ports Doug Sheppard United States IEEE 2012 1 Online-Resource (1 Videodatei, 60 Minuten) color illustrations tdi rdacontent c rdamedia cr rdacarrier Description based on online resource; title from title screen (IEEE Xplore Digital Library, viewed November 17, 2020) Course content reaffirmed: 06/2015--The influence that one port can have on the other port bit line can be a subtle, yet costly problem if not fully evaluated, and can in fact result in the design not working. Capacitive coupling between neighboring bit lines must be properly modeled and evaluated to determine their impact based on the different conditions that can occur in a dual port. This tutorial evaluates the worst case circumstances that can cause the differential during a read to be degraded - such as writing from one port while reading from the other, data dependency and bit cell location Random access memory (DE-588)4017102-4 Film gnd-content |
| spellingShingle | Sheppard, Doug Dual Port SRAM Bit Line Coupling Between Ports Random access memory |
| subject_GND | (DE-588)4017102-4 |
| title | Dual Port SRAM Bit Line Coupling Between Ports |
| title_auth | Dual Port SRAM Bit Line Coupling Between Ports |
| title_exact_search | Dual Port SRAM Bit Line Coupling Between Ports |
| title_exact_search_txtP | Dual Port SRAM Bit Line Coupling Between Ports |
| title_full | Dual Port SRAM Bit Line Coupling Between Ports Doug Sheppard |
| title_fullStr | Dual Port SRAM Bit Line Coupling Between Ports Doug Sheppard |
| title_full_unstemmed | Dual Port SRAM Bit Line Coupling Between Ports Doug Sheppard |
| title_short | Dual Port SRAM Bit Line Coupling Between Ports |
| title_sort | dual port sram bit line coupling between ports |
| topic | Random access memory |
| topic_facet | Random access memory Film |
| work_keys_str_mv | AT shepparddoug dualportsrambitlinecouplingbetweenports |