Surface texture: theory and practical use
Saved in:
| Main Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Berlin ; Wien ; Zürich
Beuth Verlag GmbH
2020
|
| Edition: | 1st edition |
| Series: | Beuth Practice
|
| Subjects: | |
| Online Access: | TUM01 |
| Item Description: | Description based on publisher supplied metadata and other sources |
| Physical Description: | 1 Online-Ressource (XII, 185 Seiten) Illustrationen, Diagramme |
| ISBN: | 9783410298144 |
Staff View
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV047441707 | ||
| 003 | DE-604 | ||
| 005 | 20240215 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 210827s2020 |||| o||u| ||||||eng d | ||
| 020 | |a 9783410298144 |9 978-3-410-29814-4 | ||
| 035 | |a (ZDB-30-PQE)EBC6221947 | ||
| 035 | |a (ZDB-30-PAD)EBC6221947 | ||
| 035 | |a (ZDB-89-EBL)EBL6221947 | ||
| 035 | |a (OCoLC)1157957658 | ||
| 035 | |a (DE-599)BVBBV047441707 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-91 | ||
| 082 | 0 | |a 620.44000000000005 | |
| 084 | |a ZQ 3950 |0 (DE-625)158090: |2 rvk | ||
| 084 | |a ZM 7605 |0 (DE-625)157122: |2 rvk | ||
| 084 | |a ZQ 3720 |0 (DE-625)158074: |2 rvk | ||
| 084 | |a FER 800 |2 stub | ||
| 084 | |a MSR 320 |2 stub | ||
| 100 | 1 | |a Volk, Raimund |d 1958- |e Verfasser |0 (DE-588)1162700785 |4 aut | |
| 245 | 1 | 0 | |a Surface texture |b theory and practical use |c Dr. Raimund Volk ; edited by: DINn Deutsches Institut für Normung e.V. |
| 250 | |a 1st edition | ||
| 264 | 1 | |a Berlin ; Wien ; Zürich |b Beuth Verlag GmbH |c 2020 | |
| 264 | 4 | |c © 2020 | |
| 300 | |a 1 Online-Ressource (XII, 185 Seiten) |b Illustrationen, Diagramme | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Beuth Practice | |
| 500 | |a Description based on publisher supplied metadata and other sources | ||
| 505 | 8 | |a Surface texture -- Imprint / Copyright -- About the author -- Foreword -- Contents -- 1 Introduction -- 2 Surfaces -- 2.1 Function of a surface -- 2.2 Influence of the manufacturing process -- 2.3 Testing means for surface roughness -- 2.4 Production of surface -- 2.5 The surface as a complex structure -- 2.6 Differentiation of surface irregularities -- 3 Surface texture parameters -- 3.1 Meaning of the parameters -- 3.1.1 Important current parameters -- 3.1.2 New surface parameters -- 3.1.3 Less common parameters -- 3.2 Danger of confusion -- 3.3 Overview of the parameters -- 3.4 Roughness parameters -- 3.4.1 Ra - Arithmetic mean deviation of the assessed profile -- 3.4.2 Rq - r.m.s. deviation of the assessed profile -- 3.4.3 Rz - Surface roughness -- Rmax - Maximum height of profile -- 3.4.4 R3z - Variant of the surface parameter Rz -- 3.4.5 Rz(ISO) - Ten point height of irregularities -- Ry - Maximum peak-to-dale height (old) -- 3.4.6 Rp - Mean width of profile dale depths -- Rv - Dale depths -- 3.5 Ripple parameters -- 3.5.1 Wt - Total height of profile -- 3.5.2 WDSm - Dominant wavelengths -- 3.6 Surface parameters for the overall profile -- 3.6.1 Pt - Total height of profile -- 3.7 Distance parameters (horizontal parameters ) -- 3.7.1 RPc - Peak count number -- D - Density -- 3.7.2 RSm - Mean value of the profile element widths -- 3.8 Composite parameters (length and depth) -- 3.8.1 Rmr(c), Pmr(c) - Material ratio of the profile -- 3.8.2 Rk - Roughness core profile -- Rpk - Reduced peak height -- Rvk - Reduced dale depths -- Mr1 - Smallest material ration -- Mr2 - Largest material ratio -- 3.8.3 RΔq - Root mean square slope of the assessed profile -- 3.8.4 L0 - Stretched profile length (not standardized) -- 3.8.5 LR - Profile length ratio -- 3.9 Motif parameters -- R - Mean depth of roughness motifs | |
| 505 | 8 | |a Rx - Maximum depth of profile irregularity -- W - Mean depth of waviness motifs -- Wx - Maximum depth of waviness -- AR - Mean spacing of roughness motifs -- AW - Mean spacing of waviness motifs -- Wte - Total depth of waviness -- 3.10 Statistical parameters -- 3.10.1 The surface from a statistical point of view -- 3.10.2 Rsk - Skewness of the profile -- 3.10.3 Rku - Kurtosis of the profile -- 3.10.4 ACF - The autocorrelation function -- 3.10.5 Fourier analysis (not standardized) -- 3.11 Three-dimensional analysis of the surface -- 3.11.1 Twist parameters -- 4 Surface measuring instruments -- 4.1 Surface comparison patterns -- 4.2 Profile method -- 4.2.1 Standards for stylus instruments -- 4.2.2 Pick-up -- 4.2.3 Feed unit -- 4.2.4 Computer -- 4.2.5 Display -- 4.2.6 Documentation -- 4.3 Non-contact measurement -- 4.3.1 White light sensor -- 4.3.2 Alternative methods -- 5 Metrology -- 5.1 Surface metrology with the profile method -- 5.1.1 Setting the traversing length -- 5.1.2 Selection of the cut-off wavelength of the filter -- 5.1.3 Eliminate form deviations -- 5.1.4 Profile alignment -- 5.2 Quality classification -- 5.3 Calibration of stylus instruments -- 5.3.1 Calibration laboratories -- 5.4 Noise, vibrations -- 5.4.1 Skid pick-ups -- 5.4.2 Feed units on measuring columns -- 5.4.3 Measuring tables with vibration damping -- 5.5 Temperature -- 5.6 Influence of draughts -- 5.7 Damage to the work piece -- 5.8 Cleanliness -- 5.9 Influence of magnetism -- 5.10 Surface replica -- 5.11 Statistical analysis of the results -- 5.11.1 "16 % rule" -- 5.11.2 "Maximum value rule" -- 5.12 Statistical Process Control SPC -- 6 Filters -- 6.1 The cut-off wavelength of the filter λc -- 6.2 Gaussian filter according to DIN EN ISO 16610-21:2013-06 -- 6.3 Analogue Filters (2RC-Filter) | |
| 505 | 8 | |a 6.4 Special filter according to DIN EN ISO 13565 (Rk) -- 7 Measurement uncertainty -- 7.1 Theory -- 7.1.1 Mathematical Model -- 7.1.2 Filterfactor c -- 7.1.3 Uncertainty of the average peak-to-dale height Rz -- 7.2 Uncertainty contributions -- 7.2.1 Feed unit and vibration isolation -- 7.2.2 Pick-up -- 7.2.3 Unknown systematic deviations -- 7.2.4 Scattering of the measured values s(Rz) -- 7.3 Measurement uncertainty budget -- 8 Drawing entries -- 8.1 Rules according to DIN EN ISO 1302:2002-08 -- 8.1.1 Symbols for the surface texture -- 8.1.2 Surface finish of the complete symbol -- 8.1.3 Machining method -- 8.1.4 Transmission characteristics and sampling length -- 8.1.5 Surface dale direction -- 8.1.6 Machining allowance -- 8.1.7 Position and orientation of symbols -- 8.1.8 Simplified drawing entry -- 8.1.9 Outlook ISO 21920 - Drawing entries -- 9 DIN Standards and VDI guidelines -- 9.1 Technical surfaces -- 9.1.1 Development -- 9.1.2 Construction -- 9.1.3 Manufacturing -- 9.1.4 Quality inspection -- 9.2 Further development of standardization -- 9.2.1 ISO 21920 profile standard -- 9.2.2 New filter processes -- 9.2.3 Different interpretations for Rmax and Rz1max -- 9.3 Instructions for determining the measurement uncertainty -- 9.4 Standards and guidelines from related areas -- 10 Literature -- 10.1 Development of surface metrology -- 10.2 Standard works -- 10.2.1 Bodschwinna -- Hillmann (1992) -- 10.2.2 Whitehouse (1994) -- 10.2.3 Thomas (1999) -- 10.2.4 Leach (2013) -- List of abbreviations -- Subject index | |
| 650 | 4 | |a Surface roughness | |
| 650 | 0 | 7 | |a Rauigkeitsmessung |0 (DE-588)4177041-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Rauigkeit |0 (DE-588)4128988-2 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Rauigkeitsmessung |0 (DE-588)4177041-9 |D s |
| 689 | 0 | 1 | |a Rauigkeit |0 (DE-588)4128988-2 |D s |
| 689 | 0 | |5 DE-604 | |
| 710 | 2 | |a Deutsches Institut für Normung |0 (DE-588)1030066-1 |4 isb | |
| 776 | 0 | 8 | |i Erscheint auch als |a Volk, Raimund |t Surface texture |d Berlin : Beuth Verlag,c2020 |n Druck-Ausgabe |z 978-3-410-29813-7 |
| 912 | |a ZDB-30-PQE | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-032843859 | ||
| 966 | e | |u https://ebookcentral.proquest.com/lib/munchentech/detail.action?docID=6221947 |l TUM01 |p ZDB-30-PQE |q TUM_PDA_PQE_Kauf |x Aggregator |3 Volltext | |
Record in the Search Index
| _version_ | 1804182734659125248 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author | Volk, Raimund 1958- |
| author_GND | (DE-588)1162700785 |
| author_facet | Volk, Raimund 1958- |
| author_role | aut |
| author_sort | Volk, Raimund 1958- |
| author_variant | r v rv |
| building | Verbundindex |
| bvnumber | BV047441707 |
| classification_rvk | ZQ 3950 ZM 7605 ZQ 3720 |
| classification_tum | FER 800 MSR 320 |
| collection | ZDB-30-PQE |
| contents | Surface texture -- Imprint / Copyright -- About the author -- Foreword -- Contents -- 1 Introduction -- 2 Surfaces -- 2.1 Function of a surface -- 2.2 Influence of the manufacturing process -- 2.3 Testing means for surface roughness -- 2.4 Production of surface -- 2.5 The surface as a complex structure -- 2.6 Differentiation of surface irregularities -- 3 Surface texture parameters -- 3.1 Meaning of the parameters -- 3.1.1 Important current parameters -- 3.1.2 New surface parameters -- 3.1.3 Less common parameters -- 3.2 Danger of confusion -- 3.3 Overview of the parameters -- 3.4 Roughness parameters -- 3.4.1 Ra - Arithmetic mean deviation of the assessed profile -- 3.4.2 Rq - r.m.s. deviation of the assessed profile -- 3.4.3 Rz - Surface roughness -- Rmax - Maximum height of profile -- 3.4.4 R3z - Variant of the surface parameter Rz -- 3.4.5 Rz(ISO) - Ten point height of irregularities -- Ry - Maximum peak-to-dale height (old) -- 3.4.6 Rp - Mean width of profile dale depths -- Rv - Dale depths -- 3.5 Ripple parameters -- 3.5.1 Wt - Total height of profile -- 3.5.2 WDSm - Dominant wavelengths -- 3.6 Surface parameters for the overall profile -- 3.6.1 Pt - Total height of profile -- 3.7 Distance parameters (horizontal parameters ) -- 3.7.1 RPc - Peak count number -- D - Density -- 3.7.2 RSm - Mean value of the profile element widths -- 3.8 Composite parameters (length and depth) -- 3.8.1 Rmr(c), Pmr(c) - Material ratio of the profile -- 3.8.2 Rk - Roughness core profile -- Rpk - Reduced peak height -- Rvk - Reduced dale depths -- Mr1 - Smallest material ration -- Mr2 - Largest material ratio -- 3.8.3 RΔq - Root mean square slope of the assessed profile -- 3.8.4 L0 - Stretched profile length (not standardized) -- 3.8.5 LR - Profile length ratio -- 3.9 Motif parameters -- R - Mean depth of roughness motifs Rx - Maximum depth of profile irregularity -- W - Mean depth of waviness motifs -- Wx - Maximum depth of waviness -- AR - Mean spacing of roughness motifs -- AW - Mean spacing of waviness motifs -- Wte - Total depth of waviness -- 3.10 Statistical parameters -- 3.10.1 The surface from a statistical point of view -- 3.10.2 Rsk - Skewness of the profile -- 3.10.3 Rku - Kurtosis of the profile -- 3.10.4 ACF - The autocorrelation function -- 3.10.5 Fourier analysis (not standardized) -- 3.11 Three-dimensional analysis of the surface -- 3.11.1 Twist parameters -- 4 Surface measuring instruments -- 4.1 Surface comparison patterns -- 4.2 Profile method -- 4.2.1 Standards for stylus instruments -- 4.2.2 Pick-up -- 4.2.3 Feed unit -- 4.2.4 Computer -- 4.2.5 Display -- 4.2.6 Documentation -- 4.3 Non-contact measurement -- 4.3.1 White light sensor -- 4.3.2 Alternative methods -- 5 Metrology -- 5.1 Surface metrology with the profile method -- 5.1.1 Setting the traversing length -- 5.1.2 Selection of the cut-off wavelength of the filter -- 5.1.3 Eliminate form deviations -- 5.1.4 Profile alignment -- 5.2 Quality classification -- 5.3 Calibration of stylus instruments -- 5.3.1 Calibration laboratories -- 5.4 Noise, vibrations -- 5.4.1 Skid pick-ups -- 5.4.2 Feed units on measuring columns -- 5.4.3 Measuring tables with vibration damping -- 5.5 Temperature -- 5.6 Influence of draughts -- 5.7 Damage to the work piece -- 5.8 Cleanliness -- 5.9 Influence of magnetism -- 5.10 Surface replica -- 5.11 Statistical analysis of the results -- 5.11.1 "16 % rule" -- 5.11.2 "Maximum value rule" -- 5.12 Statistical Process Control SPC -- 6 Filters -- 6.1 The cut-off wavelength of the filter λc -- 6.2 Gaussian filter according to DIN EN ISO 16610-21:2013-06 -- 6.3 Analogue Filters (2RC-Filter) 6.4 Special filter according to DIN EN ISO 13565 (Rk) -- 7 Measurement uncertainty -- 7.1 Theory -- 7.1.1 Mathematical Model -- 7.1.2 Filterfactor c -- 7.1.3 Uncertainty of the average peak-to-dale height Rz -- 7.2 Uncertainty contributions -- 7.2.1 Feed unit and vibration isolation -- 7.2.2 Pick-up -- 7.2.3 Unknown systematic deviations -- 7.2.4 Scattering of the measured values s(Rz) -- 7.3 Measurement uncertainty budget -- 8 Drawing entries -- 8.1 Rules according to DIN EN ISO 1302:2002-08 -- 8.1.1 Symbols for the surface texture -- 8.1.2 Surface finish of the complete symbol -- 8.1.3 Machining method -- 8.1.4 Transmission characteristics and sampling length -- 8.1.5 Surface dale direction -- 8.1.6 Machining allowance -- 8.1.7 Position and orientation of symbols -- 8.1.8 Simplified drawing entry -- 8.1.9 Outlook ISO 21920 - Drawing entries -- 9 DIN Standards and VDI guidelines -- 9.1 Technical surfaces -- 9.1.1 Development -- 9.1.2 Construction -- 9.1.3 Manufacturing -- 9.1.4 Quality inspection -- 9.2 Further development of standardization -- 9.2.1 ISO 21920 profile standard -- 9.2.2 New filter processes -- 9.2.3 Different interpretations for Rmax and Rz1max -- 9.3 Instructions for determining the measurement uncertainty -- 9.4 Standards and guidelines from related areas -- 10 Literature -- 10.1 Development of surface metrology -- 10.2 Standard works -- 10.2.1 Bodschwinna -- Hillmann (1992) -- 10.2.2 Whitehouse (1994) -- 10.2.3 Thomas (1999) -- 10.2.4 Leach (2013) -- List of abbreviations -- Subject index |
| ctrlnum | (ZDB-30-PQE)EBC6221947 (ZDB-30-PAD)EBC6221947 (ZDB-89-EBL)EBL6221947 (OCoLC)1157957658 (DE-599)BVBBV047441707 |
| dewey-full | 620.44000000000005 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.44000000000005 |
| dewey-search | 620.44000000000005 |
| dewey-sort | 3620.44000000000005 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Fertigungstechnik Werkstoffwissenschaften / Fertigungstechnik Mess-/Steuerungs-/Regelungs-/Automatisierungstechnik Mess-/Steuerungs-/Regelungs-/Automatisierungstechnik / Mechatronik |
| discipline_str_mv | Fertigungstechnik Werkstoffwissenschaften / Fertigungstechnik Mess-/Steuerungs-/Regelungs-/Automatisierungstechnik Mess-/Steuerungs-/Regelungs-/Automatisierungstechnik / Mechatronik |
| edition | 1st edition |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>07271nmm a2200565zc 4500</leader><controlfield tag="001">BV047441707</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20240215 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">210827s2020 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783410298144</subfield><subfield code="9">978-3-410-29814-4</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-30-PQE)EBC6221947</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-30-PAD)EBC6221947</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-89-EBL)EBL6221947</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1157957658</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV047441707</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">620.44000000000005</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZQ 3950</subfield><subfield code="0">(DE-625)158090:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZM 7605</subfield><subfield code="0">(DE-625)157122:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZQ 3720</subfield><subfield code="0">(DE-625)158074:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">FER 800</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">MSR 320</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Volk, Raimund</subfield><subfield code="d">1958-</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)1162700785</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Surface texture</subfield><subfield code="b">theory and practical use</subfield><subfield code="c">Dr. Raimund Volk ; edited by: DINn Deutsches Institut für Normung e.V.</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1st edition</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Berlin ; Wien ; Zürich</subfield><subfield code="b">Beuth Verlag GmbH</subfield><subfield code="c">2020</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">© 2020</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XII, 185 Seiten)</subfield><subfield code="b">Illustrationen, Diagramme</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Beuth Practice</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Description based on publisher supplied metadata and other sources</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">Surface texture -- Imprint / Copyright -- About the author -- Foreword -- Contents -- 1 Introduction -- 2 Surfaces -- 2.1 Function of a surface -- 2.2 Influence of the manufacturing process -- 2.3 Testing means for surface roughness -- 2.4 Production of surface -- 2.5 The surface as a complex structure -- 2.6 Differentiation of surface irregularities -- 3 Surface texture parameters -- 3.1 Meaning of the parameters -- 3.1.1 Important current parameters -- 3.1.2 New surface parameters -- 3.1.3 Less common parameters -- 3.2 Danger of confusion -- 3.3 Overview of the parameters -- 3.4 Roughness parameters -- 3.4.1 Ra - Arithmetic mean deviation of the assessed profile -- 3.4.2 Rq - r.m.s. deviation of the assessed profile -- 3.4.3 Rz - Surface roughness -- Rmax - Maximum height of profile -- 3.4.4 R3z - Variant of the surface parameter Rz -- 3.4.5 Rz(ISO) - Ten point height of irregularities -- Ry - Maximum peak-to-dale height (old) -- 3.4.6 Rp - Mean width of profile dale depths -- Rv - Dale depths -- 3.5 Ripple parameters -- 3.5.1 Wt - Total height of profile -- 3.5.2 WDSm - Dominant wavelengths -- 3.6 Surface parameters for the overall profile -- 3.6.1 Pt - Total height of profile -- 3.7 Distance parameters (horizontal parameters ) -- 3.7.1 RPc - Peak count number -- D - Density -- 3.7.2 RSm - Mean value of the profile element widths -- 3.8 Composite parameters (length and depth) -- 3.8.1 Rmr(c), Pmr(c) - Material ratio of the profile -- 3.8.2 Rk - Roughness core profile -- Rpk - Reduced peak height -- Rvk - Reduced dale depths -- Mr1 - Smallest material ration -- Mr2 - Largest material ratio -- 3.8.3 RΔq - Root mean square slope of the assessed profile -- 3.8.4 L0 - Stretched profile length (not standardized) -- 3.8.5 LR - Profile length ratio -- 3.9 Motif parameters -- R - Mean depth of roughness motifs</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">Rx - Maximum depth of profile irregularity -- W - Mean depth of waviness motifs -- Wx - Maximum depth of waviness -- AR - Mean spacing of roughness motifs -- AW - Mean spacing of waviness motifs -- Wte - Total depth of waviness -- 3.10 Statistical parameters -- 3.10.1 The surface from a statistical point of view -- 3.10.2 Rsk - Skewness of the profile -- 3.10.3 Rku - Kurtosis of the profile -- 3.10.4 ACF - The autocorrelation function -- 3.10.5 Fourier analysis (not standardized) -- 3.11 Three-dimensional analysis of the surface -- 3.11.1 Twist parameters -- 4 Surface measuring instruments -- 4.1 Surface comparison patterns -- 4.2 Profile method -- 4.2.1 Standards for stylus instruments -- 4.2.2 Pick-up -- 4.2.3 Feed unit -- 4.2.4 Computer -- 4.2.5 Display -- 4.2.6 Documentation -- 4.3 Non-contact measurement -- 4.3.1 White light sensor -- 4.3.2 Alternative methods -- 5 Metrology -- 5.1 Surface metrology with the profile method -- 5.1.1 Setting the traversing length -- 5.1.2 Selection of the cut-off wavelength of the filter -- 5.1.3 Eliminate form deviations -- 5.1.4 Profile alignment -- 5.2 Quality classification -- 5.3 Calibration of stylus instruments -- 5.3.1 Calibration laboratories -- 5.4 Noise, vibrations -- 5.4.1 Skid pick-ups -- 5.4.2 Feed units on measuring columns -- 5.4.3 Measuring tables with vibration damping -- 5.5 Temperature -- 5.6 Influence of draughts -- 5.7 Damage to the work piece -- 5.8 Cleanliness -- 5.9 Influence of magnetism -- 5.10 Surface replica -- 5.11 Statistical analysis of the results -- 5.11.1 "16 % rule" -- 5.11.2 "Maximum value rule" -- 5.12 Statistical Process Control SPC -- 6 Filters -- 6.1 The cut-off wavelength of the filter λc -- 6.2 Gaussian filter according to DIN EN ISO 16610-21:2013-06 -- 6.3 Analogue Filters (2RC-Filter)</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">6.4 Special filter according to DIN EN ISO 13565 (Rk) -- 7 Measurement uncertainty -- 7.1 Theory -- 7.1.1 Mathematical Model -- 7.1.2 Filterfactor c -- 7.1.3 Uncertainty of the average peak-to-dale height Rz -- 7.2 Uncertainty contributions -- 7.2.1 Feed unit and vibration isolation -- 7.2.2 Pick-up -- 7.2.3 Unknown systematic deviations -- 7.2.4 Scattering of the measured values s(Rz) -- 7.3 Measurement uncertainty budget -- 8 Drawing entries -- 8.1 Rules according to DIN EN ISO 1302:2002-08 -- 8.1.1 Symbols for the surface texture -- 8.1.2 Surface finish of the complete symbol -- 8.1.3 Machining method -- 8.1.4 Transmission characteristics and sampling length -- 8.1.5 Surface dale direction -- 8.1.6 Machining allowance -- 8.1.7 Position and orientation of symbols -- 8.1.8 Simplified drawing entry -- 8.1.9 Outlook ISO 21920 - Drawing entries -- 9 DIN Standards and VDI guidelines -- 9.1 Technical surfaces -- 9.1.1 Development -- 9.1.2 Construction -- 9.1.3 Manufacturing -- 9.1.4 Quality inspection -- 9.2 Further development of standardization -- 9.2.1 ISO 21920 profile standard -- 9.2.2 New filter processes -- 9.2.3 Different interpretations for Rmax and Rz1max -- 9.3 Instructions for determining the measurement uncertainty -- 9.4 Standards and guidelines from related areas -- 10 Literature -- 10.1 Development of surface metrology -- 10.2 Standard works -- 10.2.1 Bodschwinna -- Hillmann (1992) -- 10.2.2 Whitehouse (1994) -- 10.2.3 Thomas (1999) -- 10.2.4 Leach (2013) -- List of abbreviations -- Subject index</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Surface roughness</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Rauigkeitsmessung</subfield><subfield code="0">(DE-588)4177041-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Rauigkeit</subfield><subfield code="0">(DE-588)4128988-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Rauigkeitsmessung</subfield><subfield code="0">(DE-588)4177041-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Rauigkeit</subfield><subfield code="0">(DE-588)4128988-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Deutsches Institut für Normung</subfield><subfield code="0">(DE-588)1030066-1</subfield><subfield code="4">isb</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="a">Volk, Raimund</subfield><subfield code="t">Surface texture</subfield><subfield code="d">Berlin : Beuth Verlag,c2020</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-410-29813-7</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-30-PQE</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-032843859</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://ebookcentral.proquest.com/lib/munchentech/detail.action?docID=6221947</subfield><subfield code="l">TUM01</subfield><subfield code="p">ZDB-30-PQE</subfield><subfield code="q">TUM_PDA_PQE_Kauf</subfield><subfield code="x">Aggregator</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV047441707 |
| illustrated | Not Illustrated |
| index_date | 2024-07-03T18:01:23Z |
| indexdate | 2024-07-10T09:12:15Z |
| institution | BVB |
| institution_GND | (DE-588)1030066-1 |
| isbn | 9783410298144 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-032843859 |
| oclc_num | 1157957658 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM |
| owner_facet | DE-91 DE-BY-TUM |
| physical | 1 Online-Ressource (XII, 185 Seiten) Illustrationen, Diagramme |
| psigel | ZDB-30-PQE ZDB-30-PQE TUM_PDA_PQE_Kauf |
| publishDate | 2020 |
| publishDateSearch | 2020 |
| publishDateSort | 2020 |
| publisher | Beuth Verlag GmbH |
| record_format | marc |
| series2 | Beuth Practice |
| spelling | Volk, Raimund 1958- Verfasser (DE-588)1162700785 aut Surface texture theory and practical use Dr. Raimund Volk ; edited by: DINn Deutsches Institut für Normung e.V. 1st edition Berlin ; Wien ; Zürich Beuth Verlag GmbH 2020 © 2020 1 Online-Ressource (XII, 185 Seiten) Illustrationen, Diagramme txt rdacontent c rdamedia cr rdacarrier Beuth Practice Description based on publisher supplied metadata and other sources Surface texture -- Imprint / Copyright -- About the author -- Foreword -- Contents -- 1 Introduction -- 2 Surfaces -- 2.1 Function of a surface -- 2.2 Influence of the manufacturing process -- 2.3 Testing means for surface roughness -- 2.4 Production of surface -- 2.5 The surface as a complex structure -- 2.6 Differentiation of surface irregularities -- 3 Surface texture parameters -- 3.1 Meaning of the parameters -- 3.1.1 Important current parameters -- 3.1.2 New surface parameters -- 3.1.3 Less common parameters -- 3.2 Danger of confusion -- 3.3 Overview of the parameters -- 3.4 Roughness parameters -- 3.4.1 Ra - Arithmetic mean deviation of the assessed profile -- 3.4.2 Rq - r.m.s. deviation of the assessed profile -- 3.4.3 Rz - Surface roughness -- Rmax - Maximum height of profile -- 3.4.4 R3z - Variant of the surface parameter Rz -- 3.4.5 Rz(ISO) - Ten point height of irregularities -- Ry - Maximum peak-to-dale height (old) -- 3.4.6 Rp - Mean width of profile dale depths -- Rv - Dale depths -- 3.5 Ripple parameters -- 3.5.1 Wt - Total height of profile -- 3.5.2 WDSm - Dominant wavelengths -- 3.6 Surface parameters for the overall profile -- 3.6.1 Pt - Total height of profile -- 3.7 Distance parameters (horizontal parameters ) -- 3.7.1 RPc - Peak count number -- D - Density -- 3.7.2 RSm - Mean value of the profile element widths -- 3.8 Composite parameters (length and depth) -- 3.8.1 Rmr(c), Pmr(c) - Material ratio of the profile -- 3.8.2 Rk - Roughness core profile -- Rpk - Reduced peak height -- Rvk - Reduced dale depths -- Mr1 - Smallest material ration -- Mr2 - Largest material ratio -- 3.8.3 RΔq - Root mean square slope of the assessed profile -- 3.8.4 L0 - Stretched profile length (not standardized) -- 3.8.5 LR - Profile length ratio -- 3.9 Motif parameters -- R - Mean depth of roughness motifs Rx - Maximum depth of profile irregularity -- W - Mean depth of waviness motifs -- Wx - Maximum depth of waviness -- AR - Mean spacing of roughness motifs -- AW - Mean spacing of waviness motifs -- Wte - Total depth of waviness -- 3.10 Statistical parameters -- 3.10.1 The surface from a statistical point of view -- 3.10.2 Rsk - Skewness of the profile -- 3.10.3 Rku - Kurtosis of the profile -- 3.10.4 ACF - The autocorrelation function -- 3.10.5 Fourier analysis (not standardized) -- 3.11 Three-dimensional analysis of the surface -- 3.11.1 Twist parameters -- 4 Surface measuring instruments -- 4.1 Surface comparison patterns -- 4.2 Profile method -- 4.2.1 Standards for stylus instruments -- 4.2.2 Pick-up -- 4.2.3 Feed unit -- 4.2.4 Computer -- 4.2.5 Display -- 4.2.6 Documentation -- 4.3 Non-contact measurement -- 4.3.1 White light sensor -- 4.3.2 Alternative methods -- 5 Metrology -- 5.1 Surface metrology with the profile method -- 5.1.1 Setting the traversing length -- 5.1.2 Selection of the cut-off wavelength of the filter -- 5.1.3 Eliminate form deviations -- 5.1.4 Profile alignment -- 5.2 Quality classification -- 5.3 Calibration of stylus instruments -- 5.3.1 Calibration laboratories -- 5.4 Noise, vibrations -- 5.4.1 Skid pick-ups -- 5.4.2 Feed units on measuring columns -- 5.4.3 Measuring tables with vibration damping -- 5.5 Temperature -- 5.6 Influence of draughts -- 5.7 Damage to the work piece -- 5.8 Cleanliness -- 5.9 Influence of magnetism -- 5.10 Surface replica -- 5.11 Statistical analysis of the results -- 5.11.1 "16 % rule" -- 5.11.2 "Maximum value rule" -- 5.12 Statistical Process Control SPC -- 6 Filters -- 6.1 The cut-off wavelength of the filter λc -- 6.2 Gaussian filter according to DIN EN ISO 16610-21:2013-06 -- 6.3 Analogue Filters (2RC-Filter) 6.4 Special filter according to DIN EN ISO 13565 (Rk) -- 7 Measurement uncertainty -- 7.1 Theory -- 7.1.1 Mathematical Model -- 7.1.2 Filterfactor c -- 7.1.3 Uncertainty of the average peak-to-dale height Rz -- 7.2 Uncertainty contributions -- 7.2.1 Feed unit and vibration isolation -- 7.2.2 Pick-up -- 7.2.3 Unknown systematic deviations -- 7.2.4 Scattering of the measured values s(Rz) -- 7.3 Measurement uncertainty budget -- 8 Drawing entries -- 8.1 Rules according to DIN EN ISO 1302:2002-08 -- 8.1.1 Symbols for the surface texture -- 8.1.2 Surface finish of the complete symbol -- 8.1.3 Machining method -- 8.1.4 Transmission characteristics and sampling length -- 8.1.5 Surface dale direction -- 8.1.6 Machining allowance -- 8.1.7 Position and orientation of symbols -- 8.1.8 Simplified drawing entry -- 8.1.9 Outlook ISO 21920 - Drawing entries -- 9 DIN Standards and VDI guidelines -- 9.1 Technical surfaces -- 9.1.1 Development -- 9.1.2 Construction -- 9.1.3 Manufacturing -- 9.1.4 Quality inspection -- 9.2 Further development of standardization -- 9.2.1 ISO 21920 profile standard -- 9.2.2 New filter processes -- 9.2.3 Different interpretations for Rmax and Rz1max -- 9.3 Instructions for determining the measurement uncertainty -- 9.4 Standards and guidelines from related areas -- 10 Literature -- 10.1 Development of surface metrology -- 10.2 Standard works -- 10.2.1 Bodschwinna -- Hillmann (1992) -- 10.2.2 Whitehouse (1994) -- 10.2.3 Thomas (1999) -- 10.2.4 Leach (2013) -- List of abbreviations -- Subject index Surface roughness Rauigkeitsmessung (DE-588)4177041-9 gnd rswk-swf Rauigkeit (DE-588)4128988-2 gnd rswk-swf Rauigkeitsmessung (DE-588)4177041-9 s Rauigkeit (DE-588)4128988-2 s DE-604 Deutsches Institut für Normung (DE-588)1030066-1 isb Erscheint auch als Volk, Raimund Surface texture Berlin : Beuth Verlag,c2020 Druck-Ausgabe 978-3-410-29813-7 |
| spellingShingle | Volk, Raimund 1958- Surface texture theory and practical use Surface texture -- Imprint / Copyright -- About the author -- Foreword -- Contents -- 1 Introduction -- 2 Surfaces -- 2.1 Function of a surface -- 2.2 Influence of the manufacturing process -- 2.3 Testing means for surface roughness -- 2.4 Production of surface -- 2.5 The surface as a complex structure -- 2.6 Differentiation of surface irregularities -- 3 Surface texture parameters -- 3.1 Meaning of the parameters -- 3.1.1 Important current parameters -- 3.1.2 New surface parameters -- 3.1.3 Less common parameters -- 3.2 Danger of confusion -- 3.3 Overview of the parameters -- 3.4 Roughness parameters -- 3.4.1 Ra - Arithmetic mean deviation of the assessed profile -- 3.4.2 Rq - r.m.s. deviation of the assessed profile -- 3.4.3 Rz - Surface roughness -- Rmax - Maximum height of profile -- 3.4.4 R3z - Variant of the surface parameter Rz -- 3.4.5 Rz(ISO) - Ten point height of irregularities -- Ry - Maximum peak-to-dale height (old) -- 3.4.6 Rp - Mean width of profile dale depths -- Rv - Dale depths -- 3.5 Ripple parameters -- 3.5.1 Wt - Total height of profile -- 3.5.2 WDSm - Dominant wavelengths -- 3.6 Surface parameters for the overall profile -- 3.6.1 Pt - Total height of profile -- 3.7 Distance parameters (horizontal parameters ) -- 3.7.1 RPc - Peak count number -- D - Density -- 3.7.2 RSm - Mean value of the profile element widths -- 3.8 Composite parameters (length and depth) -- 3.8.1 Rmr(c), Pmr(c) - Material ratio of the profile -- 3.8.2 Rk - Roughness core profile -- Rpk - Reduced peak height -- Rvk - Reduced dale depths -- Mr1 - Smallest material ration -- Mr2 - Largest material ratio -- 3.8.3 RΔq - Root mean square slope of the assessed profile -- 3.8.4 L0 - Stretched profile length (not standardized) -- 3.8.5 LR - Profile length ratio -- 3.9 Motif parameters -- R - Mean depth of roughness motifs Rx - Maximum depth of profile irregularity -- W - Mean depth of waviness motifs -- Wx - Maximum depth of waviness -- AR - Mean spacing of roughness motifs -- AW - Mean spacing of waviness motifs -- Wte - Total depth of waviness -- 3.10 Statistical parameters -- 3.10.1 The surface from a statistical point of view -- 3.10.2 Rsk - Skewness of the profile -- 3.10.3 Rku - Kurtosis of the profile -- 3.10.4 ACF - The autocorrelation function -- 3.10.5 Fourier analysis (not standardized) -- 3.11 Three-dimensional analysis of the surface -- 3.11.1 Twist parameters -- 4 Surface measuring instruments -- 4.1 Surface comparison patterns -- 4.2 Profile method -- 4.2.1 Standards for stylus instruments -- 4.2.2 Pick-up -- 4.2.3 Feed unit -- 4.2.4 Computer -- 4.2.5 Display -- 4.2.6 Documentation -- 4.3 Non-contact measurement -- 4.3.1 White light sensor -- 4.3.2 Alternative methods -- 5 Metrology -- 5.1 Surface metrology with the profile method -- 5.1.1 Setting the traversing length -- 5.1.2 Selection of the cut-off wavelength of the filter -- 5.1.3 Eliminate form deviations -- 5.1.4 Profile alignment -- 5.2 Quality classification -- 5.3 Calibration of stylus instruments -- 5.3.1 Calibration laboratories -- 5.4 Noise, vibrations -- 5.4.1 Skid pick-ups -- 5.4.2 Feed units on measuring columns -- 5.4.3 Measuring tables with vibration damping -- 5.5 Temperature -- 5.6 Influence of draughts -- 5.7 Damage to the work piece -- 5.8 Cleanliness -- 5.9 Influence of magnetism -- 5.10 Surface replica -- 5.11 Statistical analysis of the results -- 5.11.1 "16 % rule" -- 5.11.2 "Maximum value rule" -- 5.12 Statistical Process Control SPC -- 6 Filters -- 6.1 The cut-off wavelength of the filter λc -- 6.2 Gaussian filter according to DIN EN ISO 16610-21:2013-06 -- 6.3 Analogue Filters (2RC-Filter) 6.4 Special filter according to DIN EN ISO 13565 (Rk) -- 7 Measurement uncertainty -- 7.1 Theory -- 7.1.1 Mathematical Model -- 7.1.2 Filterfactor c -- 7.1.3 Uncertainty of the average peak-to-dale height Rz -- 7.2 Uncertainty contributions -- 7.2.1 Feed unit and vibration isolation -- 7.2.2 Pick-up -- 7.2.3 Unknown systematic deviations -- 7.2.4 Scattering of the measured values s(Rz) -- 7.3 Measurement uncertainty budget -- 8 Drawing entries -- 8.1 Rules according to DIN EN ISO 1302:2002-08 -- 8.1.1 Symbols for the surface texture -- 8.1.2 Surface finish of the complete symbol -- 8.1.3 Machining method -- 8.1.4 Transmission characteristics and sampling length -- 8.1.5 Surface dale direction -- 8.1.6 Machining allowance -- 8.1.7 Position and orientation of symbols -- 8.1.8 Simplified drawing entry -- 8.1.9 Outlook ISO 21920 - Drawing entries -- 9 DIN Standards and VDI guidelines -- 9.1 Technical surfaces -- 9.1.1 Development -- 9.1.2 Construction -- 9.1.3 Manufacturing -- 9.1.4 Quality inspection -- 9.2 Further development of standardization -- 9.2.1 ISO 21920 profile standard -- 9.2.2 New filter processes -- 9.2.3 Different interpretations for Rmax and Rz1max -- 9.3 Instructions for determining the measurement uncertainty -- 9.4 Standards and guidelines from related areas -- 10 Literature -- 10.1 Development of surface metrology -- 10.2 Standard works -- 10.2.1 Bodschwinna -- Hillmann (1992) -- 10.2.2 Whitehouse (1994) -- 10.2.3 Thomas (1999) -- 10.2.4 Leach (2013) -- List of abbreviations -- Subject index Surface roughness Rauigkeitsmessung (DE-588)4177041-9 gnd Rauigkeit (DE-588)4128988-2 gnd |
| subject_GND | (DE-588)4177041-9 (DE-588)4128988-2 |
| title | Surface texture theory and practical use |
| title_auth | Surface texture theory and practical use |
| title_exact_search | Surface texture theory and practical use |
| title_exact_search_txtP | Surface texture theory and practical use |
| title_full | Surface texture theory and practical use Dr. Raimund Volk ; edited by: DINn Deutsches Institut für Normung e.V. |
| title_fullStr | Surface texture theory and practical use Dr. Raimund Volk ; edited by: DINn Deutsches Institut für Normung e.V. |
| title_full_unstemmed | Surface texture theory and practical use Dr. Raimund Volk ; edited by: DINn Deutsches Institut für Normung e.V. |
| title_short | Surface texture |
| title_sort | surface texture theory and practical use |
| title_sub | theory and practical use |
| topic | Surface roughness Rauigkeitsmessung (DE-588)4177041-9 gnd Rauigkeit (DE-588)4128988-2 gnd |
| topic_facet | Surface roughness Rauigkeitsmessung Rauigkeit |
| work_keys_str_mv | AT volkraimund surfacetexturetheoryandpracticaluse AT deutschesinstitutfurnormung surfacetexturetheoryandpracticaluse |