Practical electron microscopy of lattice defects:
"This unique reference text provides those who are studying crystal lattice defects using a transmission electron microscope (TEM) with a basic knowledge of transmission electron microscopy. As it has been written for beginners, the principles of both transmission electron microscopy and crysta...
Saved in:
| Main Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Singapore
World Scientific
©2021
|
| Subjects: | |
| Online Access: | Volltext |
| Summary: | "This unique reference text provides those who are studying crystal lattice defects using a transmission electron microscope (TEM) with a basic knowledge of transmission electron microscopy. As it has been written for beginners, the principles of both transmission electron microscopy and crystallography have been clearly and simply explained, with the use of many figures and photographs to aid understanding. Mathematics is avoided where possible, and problems and exercises are amply provided."-- |
| Item Description: | Includes bibliographical references and index |
| Physical Description: | 1 online resource (308 p.) |
| ISBN: | 9789811234705 9811234701 |
Staff View
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| 650 | 4 | |a Crystals |x Defects | |
| 650 | 4 | |a Crystal lattices | |
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Record in the Search Index
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| author | Saka, H. |
| author_facet | Saka, H. |
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| author_sort | Saka, H. |
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| ctrlnum | (ZDB-124-WOP)00012221 (OCoLC)1256430637 (DE-599)BVBBV047321174 |
| dewey-full | 548.8 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 548 - Crystallography |
| dewey-raw | 548.8 |
| dewey-search | 548.8 |
| dewey-sort | 3548.8 |
| dewey-tens | 540 - Chemistry and allied sciences |
| discipline | Chemie / Pharmazie |
| discipline_str_mv | Chemie / Pharmazie |
| format | Electronic eBook |
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| id | DE-604.BV047321174 |
| illustrated | Not Illustrated |
| index_date | 2024-07-03T17:29:14Z |
| indexdate | 2024-07-10T09:08:50Z |
| institution | BVB |
| isbn | 9789811234705 9811234701 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-032723921 |
| oclc_num | 1256430637 |
| open_access_boolean | |
| physical | 1 online resource (308 p.) |
| psigel | ZDB-124-WOP |
| publishDate | 2021 |
| publishDateSearch | 2021 |
| publishDateSort | 2021 |
| publisher | World Scientific |
| record_format | marc |
| spelling | Saka, H. Verfasser aut Practical electron microscopy of lattice defects Hiroyasu Saka Singapore World Scientific ©2021 1 online resource (308 p.) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index "This unique reference text provides those who are studying crystal lattice defects using a transmission electron microscope (TEM) with a basic knowledge of transmission electron microscopy. As it has been written for beginners, the principles of both transmission electron microscopy and crystallography have been clearly and simply explained, with the use of many figures and photographs to aid understanding. Mathematics is avoided where possible, and problems and exercises are amply provided."-- Crystals Defects Crystal lattices Electron microscopy Crystallography Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf Electronic books Gitterbaufehler (DE-588)4125030-8 s Elektronenmikroskopie (DE-588)4014327-2 s DE-604 Erscheint auch als Druck-Ausgabe 9789811234699 Erscheint auch als Druck-Ausgabe 9811234698 https://www.worldscientific.com/worldscibooks/10.1142/12221#t=toc Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Saka, H. Practical electron microscopy of lattice defects Crystals Defects Crystal lattices Electron microscopy Crystallography Elektronenmikroskopie (DE-588)4014327-2 gnd Gitterbaufehler (DE-588)4125030-8 gnd |
| subject_GND | (DE-588)4014327-2 (DE-588)4125030-8 |
| title | Practical electron microscopy of lattice defects |
| title_auth | Practical electron microscopy of lattice defects |
| title_exact_search | Practical electron microscopy of lattice defects |
| title_exact_search_txtP | Practical electron microscopy of lattice defects |
| title_full | Practical electron microscopy of lattice defects Hiroyasu Saka |
| title_fullStr | Practical electron microscopy of lattice defects Hiroyasu Saka |
| title_full_unstemmed | Practical electron microscopy of lattice defects Hiroyasu Saka |
| title_short | Practical electron microscopy of lattice defects |
| title_sort | practical electron microscopy of lattice defects |
| topic | Crystals Defects Crystal lattices Electron microscopy Crystallography Elektronenmikroskopie (DE-588)4014327-2 gnd Gitterbaufehler (DE-588)4125030-8 gnd |
| topic_facet | Crystals Defects Crystal lattices Electron microscopy Crystallography Elektronenmikroskopie Gitterbaufehler |
| url | https://www.worldscientific.com/worldscibooks/10.1142/12221#t=toc |
| work_keys_str_mv | AT sakah practicalelectronmicroscopyoflatticedefects |