Artificial Intelligence and Machine Learning: 32nd Benelux Conference, BNAIC/Benelearn 2020, Leiden, The Netherlands, November 19–20, 2020, Revised Selected Papers
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Bibliographic Details
Other Authors: Baratchi, Mitra (Editor), Cao, Lu (Editor), Kosters, Walter A. (Editor), Lijffijt, Jefrey (Editor), van Rijn, Jan N. (Editor), Takes, Frank W. (Editor)
Format: Electronic eBook
Language:English
Published: Cham Springer International Publishing 2021
Cham Springer
Edition:1st ed. 2021
Series:Communications in Computer and Information Science 1398
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Physical Description:1 Online-Ressource (X, 203 p. 73 illus., 51 illus. in color)
ISBN:9783030766405
ISSN:1865-0929
DOI:10.1007/978-3-030-76640-5