APA (7th ed.) Citation

Baratchi, M., Cao, L., Kosters, W. A., Lijffijt, J., van Rijn, J. N., & Takes, F. W. (2021). Artificial Intelligence and Machine Learning: 32nd Benelux Conference, BNAIC/Benelearn 2020, Leiden, The Netherlands, November 19–20, 2020, Revised Selected Papers (1st ed. 2021.). Springer International Publishing. https://doi.org/10.1007/978-3-030-76640-5

Chicago Style (17th ed.) Citation

Baratchi, Mitra, Lu Cao, Walter A. Kosters, Jefrey Lijffijt, Jan N. van Rijn, and Frank W. Takes. Artificial Intelligence and Machine Learning: 32nd Benelux Conference, BNAIC/Benelearn 2020, Leiden, The Netherlands, November 19–20, 2020, Revised Selected Papers. 1st ed. 2021. Cham: Springer International Publishing, 2021. https://doi.org/10.1007/978-3-030-76640-5.

MLA (9th ed.) Citation

Baratchi, Mitra, et al. Artificial Intelligence and Machine Learning: 32nd Benelux Conference, BNAIC/Benelearn 2020, Leiden, The Netherlands, November 19–20, 2020, Revised Selected Papers. 1st ed. 2021. Springer International Publishing, 2021. https://doi.org/10.1007/978-3-030-76640-5.