Structural, syntactic, and statistical pattern recognition: Joint IAPR international workshops, S+SSPR 2020, Padua, Italy, January 21-22, 2021 : proceedings
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Bibliographic Details
Corporate Author: S+SSPR Online (Author)
Other Authors: Torsello, Andrea (Editor)
Format: Conference Proceeding Book
Language:English
Published: Cham Springer [2021]
Series:Lecture notes in computer science 12644
Subjects:
Physical Description:xii, 378 Seiten Illustrationen, Diagramme
ISBN:9783030739720

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Interlibrary loan Place Request Caution: Not in THWS collection!