Principles of materials characterization and metrology:
Saved in:
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Oxford
Oxford University Press
[2021]
|
| Edition: | First edition |
| Subjects: | |
| Physical Description: | xx, 846 Seiten Illustrationen, Diagramme (teilweise farbig) |
| ISBN: | 9780198830269 9780198830252 |
Staff View
MARC
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| 100 | 1 | |a Krishnan, Kannan M. |e Verfasser |0 (DE-588)1113116331 |4 aut | |
| 245 | 1 | 0 | |a Principles of materials characterization and metrology |c Kannan M. Krishnan, University of Washington, Seattle |
| 250 | |a First edition | ||
| 264 | 1 | |a Oxford |b Oxford University Press |c [2021] | |
| 264 | 4 | |c © 2021 | |
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Record in the Search Index
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| author | Krishnan, Kannan M. |
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| bvnumber | BV047285806 |
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| contents | Characterization enables a microscopic understanding of the fundamental properties of materials (Science) to predict their macroscopic behaviour (Engineering). With this focus, Principles of Materials Characterization and Metrology presents a comprehensive discussion of the principles of materials characterization and metrology. Characterization techniques are introduced through elementary concepts of bonding, electronic structure of molecules and solids,and the arrangement of atoms in crystals. Then, the range of electrons, photons, ions, neutrons and scanning probes, used in characterization, including their generation and related beam-solid interactions that determine or limit their use, is presented. This is followed by ion-scattering methods, optics,optical diffraction, microscopy, and ellipsometry. Generalization of Fraunhofer diffraction to scattering by a three-dimensional arrangement of atoms in crystals leads to X-ray, electron, and neutron diffraction methods, both from surfaces and the bulk. |
| ctrlnum | (OCoLC)1257815621 (DE-599)BVBBV047285806 |
| discipline | Physik Werkstoffwissenschaften / Fertigungstechnik |
| discipline_str_mv | Physik Werkstoffwissenschaften / Fertigungstechnik |
| edition | First edition |
| format | Book |
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| id | DE-604.BV047285806 |
| illustrated | Illustrated |
| index_date | 2024-07-03T17:18:35Z |
| indexdate | 2024-11-05T15:20:32Z |
| institution | BVB |
| isbn | 9780198830269 9780198830252 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-032689267 |
| oclc_num | 1257815621 |
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| owner | DE-706 DE-83 DE-11 DE-703 DE-188 DE-20 |
| owner_facet | DE-706 DE-83 DE-11 DE-703 DE-188 DE-20 |
| physical | xx, 846 Seiten Illustrationen, Diagramme (teilweise farbig) |
| publishDate | 2021 |
| publishDateSearch | 2021 |
| publishDateSort | 2021 |
| publisher | Oxford University Press |
| record_format | marc |
| spelling | Krishnan, Kannan M. Verfasser (DE-588)1113116331 aut Principles of materials characterization and metrology Kannan M. Krishnan, University of Washington, Seattle First edition Oxford Oxford University Press [2021] © 2021 xx, 846 Seiten Illustrationen, Diagramme (teilweise farbig) txt rdacontent n rdamedia nc rdacarrier Mikrostruktur (DE-588)4131028-7 gnd rswk-swf Werkstoffkunde (DE-588)4079184-1 gnd rswk-swf Festkörperphysik (DE-588)4016921-2 gnd rswk-swf Materialcharakterisierung (DE-588)4720368-7 gnd rswk-swf Festkörperspektroskopie (DE-588)4226322-0 gnd rswk-swf Materials / Analysis Werkstoffkunde (DE-588)4079184-1 s Festkörperphysik (DE-588)4016921-2 s Festkörperspektroskopie (DE-588)4226322-0 s DE-604 Materialcharakterisierung (DE-588)4720368-7 s Mikrostruktur (DE-588)4131028-7 s Erscheint auch als Online-Ausgabe 978-0-19-256608-9 Erscheint auch als Online-Ausgabe 978-0-19-186866-5 |
| spellingShingle | Krishnan, Kannan M. Principles of materials characterization and metrology Characterization enables a microscopic understanding of the fundamental properties of materials (Science) to predict their macroscopic behaviour (Engineering). With this focus, Principles of Materials Characterization and Metrology presents a comprehensive discussion of the principles of materials characterization and metrology. Characterization techniques are introduced through elementary concepts of bonding, electronic structure of molecules and solids,and the arrangement of atoms in crystals. Then, the range of electrons, photons, ions, neutrons and scanning probes, used in characterization, including their generation and related beam-solid interactions that determine or limit their use, is presented. This is followed by ion-scattering methods, optics,optical diffraction, microscopy, and ellipsometry. Generalization of Fraunhofer diffraction to scattering by a three-dimensional arrangement of atoms in crystals leads to X-ray, electron, and neutron diffraction methods, both from surfaces and the bulk. Mikrostruktur (DE-588)4131028-7 gnd Werkstoffkunde (DE-588)4079184-1 gnd Festkörperphysik (DE-588)4016921-2 gnd Materialcharakterisierung (DE-588)4720368-7 gnd Festkörperspektroskopie (DE-588)4226322-0 gnd |
| subject_GND | (DE-588)4131028-7 (DE-588)4079184-1 (DE-588)4016921-2 (DE-588)4720368-7 (DE-588)4226322-0 |
| title | Principles of materials characterization and metrology |
| title_auth | Principles of materials characterization and metrology |
| title_exact_search | Principles of materials characterization and metrology |
| title_exact_search_txtP | Principles of materials characterization and metrology |
| title_full | Principles of materials characterization and metrology Kannan M. Krishnan, University of Washington, Seattle |
| title_fullStr | Principles of materials characterization and metrology Kannan M. Krishnan, University of Washington, Seattle |
| title_full_unstemmed | Principles of materials characterization and metrology Kannan M. Krishnan, University of Washington, Seattle |
| title_short | Principles of materials characterization and metrology |
| title_sort | principles of materials characterization and metrology |
| topic | Mikrostruktur (DE-588)4131028-7 gnd Werkstoffkunde (DE-588)4079184-1 gnd Festkörperphysik (DE-588)4016921-2 gnd Materialcharakterisierung (DE-588)4720368-7 gnd Festkörperspektroskopie (DE-588)4226322-0 gnd |
| topic_facet | Mikrostruktur Werkstoffkunde Festkörperphysik Materialcharakterisierung Festkörperspektroskopie |
| work_keys_str_mv | AT krishnankannanm principlesofmaterialscharacterizationandmetrology |