APA (7th ed.) Citation

ICPRAI Online, Lu, Y., Vincent, N., Yuen, P. C., Zheng, W., Cheriet, F., & Suen, C. Y. (2020). Pattern recognition and artificial intelligence: International conference, ICPRAI 2020, Zhongshan, China, October 19–23, 2020, proceedings. Springer. https://doi.org/10.1007/978-3-030-59830-3

Chicago Style (17th ed.) Citation

ICPRAI Online, Yue Lu, Nicole Vincent, Pong Chi Yuen, Wei-Shi Zheng, Farida Cheriet, and Ching Y. Suen. Pattern Recognition and Artificial Intelligence: International Conference, ICPRAI 2020, Zhongshan, China, October 19–23, 2020, Proceedings. Cham, Switzerland: Springer, 2020. https://doi.org/10.1007/978-3-030-59830-3.

MLA (9th ed.) Citation

ICPRAI Online, et al. Pattern Recognition and Artificial Intelligence: International Conference, ICPRAI 2020, Zhongshan, China, October 19–23, 2020, Proceedings. Springer, 2020. https://doi.org/10.1007/978-3-030-59830-3.