Savoy, J. (2020). Machine Learning Methods for Stylometry: Authorship Attribution and Author Profiling (1st ed. 2020.). Springer International Publishing. https://doi.org/10.1007/978-3-030-53360-1
Chicago-Zitierstil (17. Ausg.)Savoy, Jacques. Machine Learning Methods for Stylometry: Authorship Attribution and Author Profiling. 1st ed. 2020. Cham: Springer International Publishing, 2020. https://doi.org/10.1007/978-3-030-53360-1.
MLA-Zitierstil (9. Ausg.)Savoy, Jacques. Machine Learning Methods for Stylometry: Authorship Attribution and Author Profiling. 1st ed. 2020. Springer International Publishing, 2020. https://doi.org/10.1007/978-3-030-53360-1.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.