Understanding faults: detecting, dating, and modeling
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Bibliographic Details
Other Authors: Tanner, David (Editor), Brandes, Christian 1975- (Editor)
Format: Book
Language:English
Published: Amsterdam Elsevier [2020]
Subjects:
Online Access:Umschlagbild
Inhaltsverzeichnis
Item Description:Enthält Literaturangaben
Physical Description:xiii, 366 Seiten Illustrationen, Diagramme
ISBN:9780128159859

There is no print copy available.

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