Annealing-Induced Changes in the Nature of Point Defects in Sublimation-Grown Cubic Silicon Carbide:
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Bibliographic Details
Main Authors: Schöler, Michael (Author), Brecht, Clemens (Author), Wellmann, Peter J. (Author)
Format: Electronic eBook
Language:English
Published: Erlangen ; Nürnberg Friedrich-Alexander-Universität Erlangen-Nürnberg 2019
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Physical Description:1 Online-Ressource

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