A practical guide to surface metrology:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Cham
Springer
[2019]
|
| Schriftenreihe: | Springer series in measurement science and technology
|
| Schlagworte: | |
| Online-Zugang: | DE-1050 DE-91 DE-19 DE-703 DE-706 URL des Erstveröffentlichers |
| Beschreibung: | 1 Online-Ressource (XXV, 230 Seiten) Illustrationen |
| ISBN: | 9783030294540 |
| DOI: | 10.1007/978-3-030-29454-0 |
Internformat
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| 245 | 1 | 0 | |a A practical guide to surface metrology |c Michael Quinten |
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| 650 | 4 | |a Surfaces and Interfaces, Thin Films | |
| 650 | 4 | |a Materials Engineering | |
| 650 | 4 | |a Optics, Lasers, Photonics, Optical Devices | |
| 650 | 4 | |a Physical measurements | |
| 650 | 4 | |a Measurement | |
| 650 | 4 | |a Materials science | |
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| 650 | 4 | |a Interfaces (Physical sciences) | |
| 650 | 4 | |a Thin films | |
| 650 | 4 | |a Materials—Surfaces | |
| 650 | 4 | |a Engineering—Materials | |
| 650 | 4 | |a Lasers | |
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Datensatz im Suchindex
| _version_ | 1823230093897498624 |
|---|---|
| adam_text | |
| any_adam_object | |
| author | Quinten, Michael |
| author_facet | Quinten, Michael |
| author_role | aut |
| author_sort | Quinten, Michael |
| author_variant | m q mq |
| building | Verbundindex |
| bvnumber | BV046403302 |
| classification_tum | PHY 000 |
| collection | ZDB-2-PHA ZDB-30-PQE |
| ctrlnum | (ZDB-2-PHA)9783030294540 (ZDB-30-PQE)6005117 (OCoLC)1140174916 (DE-599)BVBBV046403302 |
| dewey-full | 530.8 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 530 - Physics |
| dewey-raw | 530.8 |
| dewey-search | 530.8 |
| dewey-sort | 3530.8 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| doi_str_mv | 10.1007/978-3-030-29454-0 |
| format | Electronic eBook |
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| id | DE-604.BV046403302 |
| illustrated | Illustrated |
| indexdate | 2025-02-05T15:01:53Z |
| institution | BVB |
| isbn | 9783030294540 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-031816024 |
| oclc_num | 1140174916 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-19 DE-BY-UBM DE-703 DE-706 DE-83 DE-1050 |
| owner_facet | DE-91 DE-BY-TUM DE-19 DE-BY-UBM DE-703 DE-706 DE-83 DE-1050 |
| physical | 1 Online-Ressource (XXV, 230 Seiten) Illustrationen |
| psigel | ZDB-2-PHA ZDB-30-PQE ZDB-2-PHA_2019_Fremddaten ZDB-30-PQE FHD01_PQE_Kauf |
| publishDate | 2019 |
| publishDateSearch | 2019 |
| publishDateSort | 2019 |
| publisher | Springer |
| record_format | marc |
| series2 | Springer series in measurement science and technology |
| spelling | Quinten, Michael Verfasser aut A practical guide to surface metrology Michael Quinten Cham Springer [2019] © 2019 1 Online-Ressource (XXV, 230 Seiten) Illustrationen txt rdacontent c rdamedia cr rdacarrier Springer series in measurement science and technology Measurement Science and Instrumentation Characterization and Evaluation of Materials Surface and Interface Science, Thin Films Surfaces and Interfaces, Thin Films Materials Engineering Optics, Lasers, Photonics, Optical Devices Physical measurements Measurement Materials science Surfaces (Physics) Interfaces (Physical sciences) Thin films Materials—Surfaces Engineering—Materials Lasers Photonics Oberflächenprüfung (DE-588)4172254-1 gnd rswk-swf Oberflächenmessung (DE-588)4172249-8 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 s Oberflächenprüfung (DE-588)4172254-1 s Oberflächenmessung (DE-588)4172249-8 s DE-604 Erscheint auch als Druck-Ausgabe 978-3-030-29453-3 Erscheint auch als Druck-Ausgabe 978-3-030-29455-7 Erscheint auch als Druck-Ausgabe 978-3-030-29456-4 https://doi.org/10.1007/978-3-030-29454-0 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Quinten, Michael A practical guide to surface metrology Measurement Science and Instrumentation Characterization and Evaluation of Materials Surface and Interface Science, Thin Films Surfaces and Interfaces, Thin Films Materials Engineering Optics, Lasers, Photonics, Optical Devices Physical measurements Measurement Materials science Surfaces (Physics) Interfaces (Physical sciences) Thin films Materials—Surfaces Engineering—Materials Lasers Photonics Oberflächenprüfung (DE-588)4172254-1 gnd Oberflächenmessung (DE-588)4172249-8 gnd Oberflächenanalyse (DE-588)4172243-7 gnd |
| subject_GND | (DE-588)4172254-1 (DE-588)4172249-8 (DE-588)4172243-7 |
| title | A practical guide to surface metrology |
| title_auth | A practical guide to surface metrology |
| title_exact_search | A practical guide to surface metrology |
| title_full | A practical guide to surface metrology Michael Quinten |
| title_fullStr | A practical guide to surface metrology Michael Quinten |
| title_full_unstemmed | A practical guide to surface metrology Michael Quinten |
| title_short | A practical guide to surface metrology |
| title_sort | a practical guide to surface metrology |
| topic | Measurement Science and Instrumentation Characterization and Evaluation of Materials Surface and Interface Science, Thin Films Surfaces and Interfaces, Thin Films Materials Engineering Optics, Lasers, Photonics, Optical Devices Physical measurements Measurement Materials science Surfaces (Physics) Interfaces (Physical sciences) Thin films Materials—Surfaces Engineering—Materials Lasers Photonics Oberflächenprüfung (DE-588)4172254-1 gnd Oberflächenmessung (DE-588)4172249-8 gnd Oberflächenanalyse (DE-588)4172243-7 gnd |
| topic_facet | Measurement Science and Instrumentation Characterization and Evaluation of Materials Surface and Interface Science, Thin Films Surfaces and Interfaces, Thin Films Materials Engineering Optics, Lasers, Photonics, Optical Devices Physical measurements Measurement Materials science Surfaces (Physics) Interfaces (Physical sciences) Thin films Materials—Surfaces Engineering—Materials Lasers Photonics Oberflächenprüfung Oberflächenmessung Oberflächenanalyse |
| url | https://doi.org/10.1007/978-3-030-29454-0 |
| work_keys_str_mv | AT quintenmichael apracticalguidetosurfacemetrology |