A practical guide to surface metrology:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Cham
Springer
[2019]
|
| Schriftenreihe: | Springer series in measurement science and technology
|
| Schlagworte: | |
| Online-Zugang: | TUM01 UBM01 UBT01 UBY01 Volltext |
| Beschreibung: | 1 Online-Ressource (XXV, 230 Seiten) Illustrationen |
| ISBN: | 9783030294540 |
| DOI: | 10.1007/978-3-030-29454-0 |
Internformat
MARC
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| 245 | 1 | 0 | |a A practical guide to surface metrology |c Michael Quinten |
| 264 | 1 | |a Cham |b Springer |c [2019] | |
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| 650 | 4 | |a Measurement Science and Instrumentation | |
| 650 | 4 | |a Characterization and Evaluation of Materials | |
| 650 | 4 | |a Surface and Interface Science, Thin Films | |
| 650 | 4 | |a Surfaces and Interfaces, Thin Films | |
| 650 | 4 | |a Materials Engineering | |
| 650 | 4 | |a Optics, Lasers, Photonics, Optical Devices | |
| 650 | 4 | |a Physical measurements | |
| 650 | 4 | |a Measurement | |
| 650 | 4 | |a Materials science | |
| 650 | 4 | |a Surfaces (Physics) | |
| 650 | 4 | |a Interfaces (Physical sciences) | |
| 650 | 4 | |a Thin films | |
| 650 | 4 | |a Materials—Surfaces | |
| 650 | 4 | |a Engineering—Materials | |
| 650 | 4 | |a Lasers | |
| 650 | 4 | |a Photonics | |
| 650 | 0 | 7 | |a Oberflächenprüfung |0 (DE-588)4172254-1 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Oberflächenanalyse |0 (DE-588)4172243-7 |2 gnd |9 rswk-swf |
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Datensatz im Suchindex
| _version_ | 1804180935718993920 |
|---|---|
| any_adam_object | |
| author | Quinten, Michael |
| author_facet | Quinten, Michael |
| author_role | aut |
| author_sort | Quinten, Michael |
| author_variant | m q mq |
| building | Verbundindex |
| bvnumber | BV046403302 |
| classification_tum | PHY 000 |
| collection | ZDB-2-PHA ZDB-30-PQE |
| ctrlnum | (ZDB-2-PHA)9783030294540 (ZDB-30-PQE)6005117 (OCoLC)1140174916 (DE-599)BVBBV046403302 |
| dewey-full | 530.8 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 530 - Physics |
| dewey-raw | 530.8 |
| dewey-search | 530.8 |
| dewey-sort | 3530.8 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| doi_str_mv | 10.1007/978-3-030-29454-0 |
| format | Electronic eBook |
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| id | DE-604.BV046403302 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:43:40Z |
| institution | BVB |
| isbn | 9783030294540 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-031816024 |
| oclc_num | 1140174916 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-19 DE-BY-UBM DE-703 DE-706 DE-83 |
| owner_facet | DE-91 DE-BY-TUM DE-19 DE-BY-UBM DE-703 DE-706 DE-83 |
| physical | 1 Online-Ressource (XXV, 230 Seiten) Illustrationen |
| psigel | ZDB-2-PHA ZDB-30-PQE ZDB-2-PHA_2019_Fremddaten |
| publishDate | 2019 |
| publishDateSearch | 2019 |
| publishDateSort | 2019 |
| publisher | Springer |
| record_format | marc |
| series2 | Springer series in measurement science and technology |
| spelling | Quinten, Michael Verfasser aut A practical guide to surface metrology Michael Quinten Cham Springer [2019] © 2019 1 Online-Ressource (XXV, 230 Seiten) Illustrationen txt rdacontent c rdamedia cr rdacarrier Springer series in measurement science and technology Measurement Science and Instrumentation Characterization and Evaluation of Materials Surface and Interface Science, Thin Films Surfaces and Interfaces, Thin Films Materials Engineering Optics, Lasers, Photonics, Optical Devices Physical measurements Measurement Materials science Surfaces (Physics) Interfaces (Physical sciences) Thin films Materials—Surfaces Engineering—Materials Lasers Photonics Oberflächenprüfung (DE-588)4172254-1 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 gnd rswk-swf Oberflächenmessung (DE-588)4172249-8 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 s Oberflächenprüfung (DE-588)4172254-1 s Oberflächenmessung (DE-588)4172249-8 s DE-604 Erscheint auch als Druck-Ausgabe 978-3-030-29453-3 Erscheint auch als Druck-Ausgabe 978-3-030-29455-7 Erscheint auch als Druck-Ausgabe 978-3-030-29456-4 https://doi.org/10.1007/978-3-030-29454-0 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Quinten, Michael A practical guide to surface metrology Measurement Science and Instrumentation Characterization and Evaluation of Materials Surface and Interface Science, Thin Films Surfaces and Interfaces, Thin Films Materials Engineering Optics, Lasers, Photonics, Optical Devices Physical measurements Measurement Materials science Surfaces (Physics) Interfaces (Physical sciences) Thin films Materials—Surfaces Engineering—Materials Lasers Photonics Oberflächenprüfung (DE-588)4172254-1 gnd Oberflächenanalyse (DE-588)4172243-7 gnd Oberflächenmessung (DE-588)4172249-8 gnd |
| subject_GND | (DE-588)4172254-1 (DE-588)4172243-7 (DE-588)4172249-8 |
| title | A practical guide to surface metrology |
| title_auth | A practical guide to surface metrology |
| title_exact_search | A practical guide to surface metrology |
| title_full | A practical guide to surface metrology Michael Quinten |
| title_fullStr | A practical guide to surface metrology Michael Quinten |
| title_full_unstemmed | A practical guide to surface metrology Michael Quinten |
| title_short | A practical guide to surface metrology |
| title_sort | a practical guide to surface metrology |
| topic | Measurement Science and Instrumentation Characterization and Evaluation of Materials Surface and Interface Science, Thin Films Surfaces and Interfaces, Thin Films Materials Engineering Optics, Lasers, Photonics, Optical Devices Physical measurements Measurement Materials science Surfaces (Physics) Interfaces (Physical sciences) Thin films Materials—Surfaces Engineering—Materials Lasers Photonics Oberflächenprüfung (DE-588)4172254-1 gnd Oberflächenanalyse (DE-588)4172243-7 gnd Oberflächenmessung (DE-588)4172249-8 gnd |
| topic_facet | Measurement Science and Instrumentation Characterization and Evaluation of Materials Surface and Interface Science, Thin Films Surfaces and Interfaces, Thin Films Materials Engineering Optics, Lasers, Photonics, Optical Devices Physical measurements Measurement Materials science Surfaces (Physics) Interfaces (Physical sciences) Thin films Materials—Surfaces Engineering—Materials Lasers Photonics Oberflächenprüfung Oberflächenanalyse Oberflächenmessung |
| url | https://doi.org/10.1007/978-3-030-29454-0 |
| work_keys_str_mv | AT quintenmichael apracticalguidetosurfacemetrology |