The practice of TOF-SIMS: time of flight secondary ion mass spectrometry
Saved in:
Bibliographic Details
Main Author: Spool, Alan M. ca. 20./21. Jh (Author)
Format: Electronic eBook
Language:English
Published: New York, NY Momentum Press [2016]
Series:Materials characterization and analysis collection
Subjects:
Online Access:FWS01
FWS02
Item Description:Literaturangaben
Physical Description:1 Online-Ressource (192 Seiten) Illustrationen, Diagramme
ISBN:9781606507742