The practice of TOF-SIMS: time of flight secondary ion mass spectrometry
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
New York, NY
Momentum Press
[2016]
|
| Schriftenreihe: | Materials characterization and analysis collection
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| Schlagworte: | |
| Online-Zugang: | FWS01 FWS02 |
| Beschreibung: | Literaturangaben |
| Beschreibung: | 1 Online-Ressource (192 Seiten) Illustrationen, Diagramme |
| ISBN: | 9781606507742 |
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Datensatz im Suchindex
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| id | DE-604.BV046200834 |
| illustrated | Not Illustrated |
| indexdate | 2024-08-01T14:52:49Z |
| institution | BVB |
| isbn | 9781606507742 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-031579978 |
| oclc_num | 1124789541 |
| open_access_boolean | |
| owner | DE-863 DE-BY-FWS DE-862 DE-BY-FWS |
| owner_facet | DE-863 DE-BY-FWS DE-862 DE-BY-FWS |
| physical | 1 Online-Ressource (192 Seiten) Illustrationen, Diagramme |
| psigel | ZDB-190-EDL |
| publishDate | 2016 |
| publishDateSearch | 2016 |
| publishDateSort | 2016 |
| publisher | Momentum Press |
| record_format | marc |
| series2 | Materials characterization and analysis collection |
| spellingShingle | Spool, Alan M. ca. 20./21. Jh The practice of TOF-SIMS time of flight secondary ion mass spectrometry Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
| subject_GND | (DE-588)4077346-2 |
| title | The practice of TOF-SIMS time of flight secondary ion mass spectrometry |
| title_auth | The practice of TOF-SIMS time of flight secondary ion mass spectrometry |
| title_exact_search | The practice of TOF-SIMS time of flight secondary ion mass spectrometry |
| title_full | The practice of TOF-SIMS time of flight secondary ion mass spectrometry Alan M. Spool |
| title_fullStr | The practice of TOF-SIMS time of flight secondary ion mass spectrometry Alan M. Spool |
| title_full_unstemmed | The practice of TOF-SIMS time of flight secondary ion mass spectrometry Alan M. Spool |
| title_short | The practice of TOF-SIMS |
| title_sort | the practice of tof sims time of flight secondary ion mass spectrometry |
| title_sub | time of flight secondary ion mass spectrometry |
| topic | Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
| topic_facet | Sekundärionen-Massenspektrometrie |
| work_keys_str_mv | AT spoolalanm thepracticeoftofsimstimeofflightsecondaryionmassspectrometry |