Gao, W. (2019). Metrology (1st ed. 2019.). Springer Singapore. https://doi.org/10.1007/978-981-10-4938-5
Chicago Style (17th ed.) CitationGao, Wei. Metrology. 1st ed. 2019. Singapore: Springer Singapore, 2019. https://doi.org/10.1007/978-981-10-4938-5.
MLA (9th ed.) CitationGao, Wei. Metrology. 1st ed. 2019. Springer Singapore, 2019. https://doi.org/10.1007/978-981-10-4938-5.
Warning: These citations may not always be 100% accurate.