Quantum metrology with photoelectrons: Volume 1 Foundations

Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelect...

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Bibliographic Details
Main Author: Hockett, Paul (Author)
Format: Electronic eBook
Language:English
Published: San Rafael, CA Morgan & Claypool Publishers [2018]
Bristol IOP Publishing [2018]
Edition:Version: 20180401
Series:IOP concise physics
IOP concise physics
Online Access:UBT01
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Summary:Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 1: Foundations discusses the fundamental concepts along with recent and emerging applications
Physical Description:1 Online-Ressource (getrennte Zählung) Illustrationen
ISBN:9781681746845
9781681746869
DOI:10.1088/978-1-6817-4684-5

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