Peng, Y., & Dong, X. (2020). Proceedings of 2018 International Conference on Optoelectronics and Measurement (1st ed. 2020.). Springer Singapore. https://doi.org/10.1007/978-981-13-8595-7
Chicago Style (17th ed.) CitationPeng, Yingquan, and Xinyong Dong. Proceedings of 2018 International Conference on Optoelectronics and Measurement. 1st ed. 2020. Singapore: Springer Singapore, 2020. https://doi.org/10.1007/978-981-13-8595-7.
MLA (9th ed.) CitationPeng, Yingquan, and Xinyong Dong. Proceedings of 2018 International Conference on Optoelectronics and Measurement. 1st ed. 2020. Springer Singapore, 2020. https://doi.org/10.1007/978-981-13-8595-7.
Warning: These citations may not always be 100% accurate.