Practical applications of Bayesian reliability:
Saved in:
| Main Authors: | , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Hoboken
Wiley
2019
|
| Edition: | First edition |
| Series: | Wiley series in quality & reliability engineering
|
| Subjects: | |
| Physical Description: | xvii, 300 Seiten Diagramme |
| ISBN: | 9781119287971 |
Staff View
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV046035896 | ||
| 003 | DE-604 | ||
| 005 | 20190926 | ||
| 007 | t | ||
| 008 | 190705s2019 |||| |||| 00||| eng d | ||
| 020 | |a 9781119287971 |9 978-1-119-28797-1 | ||
| 035 | |a (OCoLC)1121481381 | ||
| 035 | |a (DE-599)BVBBV046035896 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-83 | ||
| 084 | |a ZG 9270 |0 (DE-625)156055: |2 rvk | ||
| 100 | 1 | |a Liu, Yan |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Practical applications of Bayesian reliability |c Yan Liu (Principal Reliability Engineer, Medtronic PLC, Minneapolis, USA), Athula I. Abeyratne (Senior Principal Statistician, Medtronic PLC, Minneapolis, USA) |
| 250 | |a First edition | ||
| 264 | 1 | |a Hoboken |b Wiley |c 2019 | |
| 300 | |a xvii, 300 Seiten |b Diagramme | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Wiley series in quality & reliability engineering | |
| 650 | 0 | 7 | |a Bayes-Verfahren |0 (DE-588)4204326-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Zuverlässigkeitstheorie |0 (DE-588)4195525-0 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Zuverlässigkeitstheorie |0 (DE-588)4195525-0 |D s |
| 689 | 0 | 1 | |a Bayes-Verfahren |0 (DE-588)4204326-8 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Abeyratne, Athula I. |e Verfasser |4 aut | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-031417680 | ||
Record in the Search Index
| _version_ | 1804180290281668608 |
|---|---|
| any_adam_object | |
| author | Liu, Yan Abeyratne, Athula I. |
| author_facet | Liu, Yan Abeyratne, Athula I. |
| author_role | aut aut |
| author_sort | Liu, Yan |
| author_variant | y l yl a i a ai aia |
| building | Verbundindex |
| bvnumber | BV046035896 |
| classification_rvk | ZG 9270 |
| ctrlnum | (OCoLC)1121481381 (DE-599)BVBBV046035896 |
| discipline | Technik |
| edition | First edition |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01330nam a2200361 c 4500</leader><controlfield tag="001">BV046035896</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20190926 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">190705s2019 |||| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781119287971</subfield><subfield code="9">978-1-119-28797-1</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1121481381</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV046035896</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-83</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZG 9270</subfield><subfield code="0">(DE-625)156055:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Liu, Yan</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Practical applications of Bayesian reliability</subfield><subfield code="c">Yan Liu (Principal Reliability Engineer, Medtronic PLC, Minneapolis, USA), Athula I. Abeyratne (Senior Principal Statistician, Medtronic PLC, Minneapolis, USA)</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">First edition</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Hoboken</subfield><subfield code="b">Wiley</subfield><subfield code="c">2019</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xvii, 300 Seiten</subfield><subfield code="b">Diagramme</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Wiley series in quality & reliability engineering</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Bayes-Verfahren</subfield><subfield code="0">(DE-588)4204326-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Zuverlässigkeitstheorie</subfield><subfield code="0">(DE-588)4195525-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Zuverlässigkeitstheorie</subfield><subfield code="0">(DE-588)4195525-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Bayes-Verfahren</subfield><subfield code="0">(DE-588)4204326-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Abeyratne, Athula I.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-031417680</subfield></datafield></record></collection> |
| id | DE-604.BV046035896 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:33:24Z |
| institution | BVB |
| isbn | 9781119287971 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-031417680 |
| oclc_num | 1121481381 |
| open_access_boolean | |
| owner | DE-83 |
| owner_facet | DE-83 |
| physical | xvii, 300 Seiten Diagramme |
| publishDate | 2019 |
| publishDateSearch | 2019 |
| publishDateSort | 2019 |
| publisher | Wiley |
| record_format | marc |
| series2 | Wiley series in quality & reliability engineering |
| spelling | Liu, Yan Verfasser aut Practical applications of Bayesian reliability Yan Liu (Principal Reliability Engineer, Medtronic PLC, Minneapolis, USA), Athula I. Abeyratne (Senior Principal Statistician, Medtronic PLC, Minneapolis, USA) First edition Hoboken Wiley 2019 xvii, 300 Seiten Diagramme txt rdacontent n rdamedia nc rdacarrier Wiley series in quality & reliability engineering Bayes-Verfahren (DE-588)4204326-8 gnd rswk-swf Zuverlässigkeitstheorie (DE-588)4195525-0 gnd rswk-swf Zuverlässigkeitstheorie (DE-588)4195525-0 s Bayes-Verfahren (DE-588)4204326-8 s DE-604 Abeyratne, Athula I. Verfasser aut |
| spellingShingle | Liu, Yan Abeyratne, Athula I. Practical applications of Bayesian reliability Bayes-Verfahren (DE-588)4204326-8 gnd Zuverlässigkeitstheorie (DE-588)4195525-0 gnd |
| subject_GND | (DE-588)4204326-8 (DE-588)4195525-0 |
| title | Practical applications of Bayesian reliability |
| title_auth | Practical applications of Bayesian reliability |
| title_exact_search | Practical applications of Bayesian reliability |
| title_full | Practical applications of Bayesian reliability Yan Liu (Principal Reliability Engineer, Medtronic PLC, Minneapolis, USA), Athula I. Abeyratne (Senior Principal Statistician, Medtronic PLC, Minneapolis, USA) |
| title_fullStr | Practical applications of Bayesian reliability Yan Liu (Principal Reliability Engineer, Medtronic PLC, Minneapolis, USA), Athula I. Abeyratne (Senior Principal Statistician, Medtronic PLC, Minneapolis, USA) |
| title_full_unstemmed | Practical applications of Bayesian reliability Yan Liu (Principal Reliability Engineer, Medtronic PLC, Minneapolis, USA), Athula I. Abeyratne (Senior Principal Statistician, Medtronic PLC, Minneapolis, USA) |
| title_short | Practical applications of Bayesian reliability |
| title_sort | practical applications of bayesian reliability |
| topic | Bayes-Verfahren (DE-588)4204326-8 gnd Zuverlässigkeitstheorie (DE-588)4195525-0 gnd |
| topic_facet | Bayes-Verfahren Zuverlässigkeitstheorie |
| work_keys_str_mv | AT liuyan practicalapplicationsofbayesianreliability AT abeyratneathulai practicalapplicationsofbayesianreliability |