Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Cham
Springer International Publishing
2018
Cham Springer |
| Ausgabe: | 3rd ed. 2018 |
| Schriftenreihe: | Springer Series in Advanced Microelectronics
10 |
| Schlagworte: | |
| Online-Zugang: | TUM01 UBM01 UBT01 UER01 Volltext |
| Beschreibung: | 1 Online-Ressource (XXI, 321 p. 126 illus., 68 illus. in color) |
| ISBN: | 9783319998251 |
| ISSN: | 1437-0387 |
| DOI: | 10.1007/978-3-319-99825-1 |
Internformat
MARC
| LEADER | 00000nmm a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV045913033 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 190606s2018 |||| o||u| ||||||eng d | ||
| 020 | |a 9783319998251 |c Online |9 978-3-319-99825-1 | ||
| 024 | 7 | |a 10.1007/978-3-319-99825-1 |2 doi | |
| 035 | |a (ZDB-2-PHA)9783319998251 | ||
| 035 | |a (OCoLC)1104912213 | ||
| 035 | |a (DE-599)BVBBV045913033 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-29 |a DE-91 |a DE-19 |a DE-188 |a DE-703 | ||
| 082 | 0 | |a 621.36 |2 23 | |
| 084 | |a ZM 3700 |0 (DE-625)157028: |2 rvk | ||
| 084 | |a ZN 4032 |0 (DE-625)157341: |2 rvk | ||
| 084 | |a ZQ 3820 |0 (DE-625)158081: |2 rvk | ||
| 084 | |a PHY 000 |2 stub | ||
| 100 | 1 | |a Breitenstein, Otwin |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Lock-in Thermography |b Basics and Use for Evaluating Electronic Devices and Materials |c by Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert |
| 250 | |a 3rd ed. 2018 | ||
| 264 | 1 | |a Cham |b Springer International Publishing |c 2018 | |
| 264 | 1 | |a Cham |b Springer | |
| 300 | |a 1 Online-Ressource (XXI, 321 p. 126 illus., 68 illus. in color) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Springer Series in Advanced Microelectronics |v 10 |x 1437-0387 | |
| 650 | 4 | |a Optics, Lasers, Photonics, Optical Devices | |
| 650 | 4 | |a Characterization and Evaluation of Materials | |
| 650 | 4 | |a Microwaves, RF and Optical Engineering | |
| 650 | 4 | |a Structural Materials | |
| 650 | 4 | |a Surfaces (Physics) | |
| 650 | 4 | |a Microwaves | |
| 650 | 4 | |a Materials | |
| 650 | 0 | 7 | |a Infrarotthermographie |0 (DE-588)4242353-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Prüftechnik |0 (DE-588)4047610-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronisches Bauelement |0 (DE-588)4014360-0 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Elektronisches Bauelement |0 (DE-588)4014360-0 |D s |
| 689 | 0 | 1 | |a Prüftechnik |0 (DE-588)4047610-8 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 689 | 1 | 0 | |a Infrarotthermographie |0 (DE-588)4242353-3 |D s |
| 689 | 1 | |8 2\p |5 DE-604 | |
| 700 | 1 | |a Warta, Wilhelm |4 aut | |
| 700 | 1 | |a Schubert, Martin C. |4 aut | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-3-319-99824-4 |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-3-319-99826-8 |
| 856 | 4 | 0 | |u https://doi.org/10.1007/978-3-319-99825-1 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-2-PHA | ||
| 940 | 1 | |q ZDB-2-PHA_2018_Fremddaten | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-031295569 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 2\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 966 | e | |u https://doi.org/10.1007/978-3-319-99825-1 |l TUM01 |p ZDB-2-PHA |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-319-99825-1 |l UBM01 |p ZDB-2-PHA |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-319-99825-1 |l UBT01 |p ZDB-2-PHA |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-319-99825-1 |l UER01 |p ZDB-2-PHA |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804180085861777408 |
|---|---|
| any_adam_object | |
| author | Breitenstein, Otwin Warta, Wilhelm Schubert, Martin C. |
| author_facet | Breitenstein, Otwin Warta, Wilhelm Schubert, Martin C. |
| author_role | aut aut aut |
| author_sort | Breitenstein, Otwin |
| author_variant | o b ob w w ww m c s mc mcs |
| building | Verbundindex |
| bvnumber | BV045913033 |
| classification_rvk | ZM 3700 ZN 4032 ZQ 3820 |
| classification_tum | PHY 000 |
| collection | ZDB-2-PHA |
| ctrlnum | (ZDB-2-PHA)9783319998251 (OCoLC)1104912213 (DE-599)BVBBV045913033 |
| dewey-full | 621.36 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.36 |
| dewey-search | 621.36 |
| dewey-sort | 3621.36 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik Werkstoffwissenschaften / Fertigungstechnik Mess-/Steuerungs-/Regelungs-/Automatisierungstechnik / Mechatronik |
| doi_str_mv | 10.1007/978-3-319-99825-1 |
| edition | 3rd ed. 2018 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03009nmm a2200709zcb4500</leader><controlfield tag="001">BV045913033</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">190606s2018 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783319998251</subfield><subfield code="c">Online</subfield><subfield code="9">978-3-319-99825-1</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-3-319-99825-1</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-2-PHA)9783319998251</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1104912213</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV045913033</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-29</subfield><subfield code="a">DE-91</subfield><subfield code="a">DE-19</subfield><subfield code="a">DE-188</subfield><subfield code="a">DE-703</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.36</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZM 3700</subfield><subfield code="0">(DE-625)157028:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4032</subfield><subfield code="0">(DE-625)157341:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZQ 3820</subfield><subfield code="0">(DE-625)158081:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Breitenstein, Otwin</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Lock-in Thermography</subfield><subfield code="b">Basics and Use for Evaluating Electronic Devices and Materials</subfield><subfield code="c">by Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">3rd ed. 2018</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cham</subfield><subfield code="b">Springer International Publishing</subfield><subfield code="c">2018</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cham</subfield><subfield code="b">Springer</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XXI, 321 p. 126 illus., 68 illus. in color)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Springer Series in Advanced Microelectronics</subfield><subfield code="v">10</subfield><subfield code="x">1437-0387</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optics, Lasers, Photonics, Optical Devices</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Characterization and Evaluation of Materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microwaves, RF and Optical Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Structural Materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Surfaces (Physics)</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microwaves</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Materials</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Infrarotthermographie</subfield><subfield code="0">(DE-588)4242353-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronisches Bauelement</subfield><subfield code="0">(DE-588)4014360-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronisches Bauelement</subfield><subfield code="0">(DE-588)4014360-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Infrarotthermographie</subfield><subfield code="0">(DE-588)4242353-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Warta, Wilhelm</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Schubert, Martin C.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-319-99824-4</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-319-99826-8</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-3-319-99825-1</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-PHA</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-PHA_2018_Fremddaten</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-031295569</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-99825-1</subfield><subfield code="l">TUM01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-99825-1</subfield><subfield code="l">UBM01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-99825-1</subfield><subfield code="l">UBT01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-99825-1</subfield><subfield code="l">UER01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV045913033 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:30:10Z |
| institution | BVB |
| isbn | 9783319998251 |
| issn | 1437-0387 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-031295569 |
| oclc_num | 1104912213 |
| open_access_boolean | |
| owner | DE-29 DE-91 DE-BY-TUM DE-19 DE-BY-UBM DE-188 DE-703 |
| owner_facet | DE-29 DE-91 DE-BY-TUM DE-19 DE-BY-UBM DE-188 DE-703 |
| physical | 1 Online-Ressource (XXI, 321 p. 126 illus., 68 illus. in color) |
| psigel | ZDB-2-PHA ZDB-2-PHA_2018_Fremddaten |
| publishDate | 2018 |
| publishDateSearch | 2018 |
| publishDateSort | 2018 |
| publisher | Springer International Publishing Springer |
| record_format | marc |
| series2 | Springer Series in Advanced Microelectronics |
| spelling | Breitenstein, Otwin Verfasser aut Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials by Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert 3rd ed. 2018 Cham Springer International Publishing 2018 Cham Springer 1 Online-Ressource (XXI, 321 p. 126 illus., 68 illus. in color) txt rdacontent c rdamedia cr rdacarrier Springer Series in Advanced Microelectronics 10 1437-0387 Optics, Lasers, Photonics, Optical Devices Characterization and Evaluation of Materials Microwaves, RF and Optical Engineering Structural Materials Surfaces (Physics) Microwaves Materials Infrarotthermographie (DE-588)4242353-3 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf Elektronisches Bauelement (DE-588)4014360-0 gnd rswk-swf Elektronisches Bauelement (DE-588)4014360-0 s Prüftechnik (DE-588)4047610-8 s 1\p DE-604 Infrarotthermographie (DE-588)4242353-3 s 2\p DE-604 Warta, Wilhelm aut Schubert, Martin C. aut Erscheint auch als Druck-Ausgabe 978-3-319-99824-4 Erscheint auch als Druck-Ausgabe 978-3-319-99826-8 https://doi.org/10.1007/978-3-319-99825-1 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Breitenstein, Otwin Warta, Wilhelm Schubert, Martin C. Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials Optics, Lasers, Photonics, Optical Devices Characterization and Evaluation of Materials Microwaves, RF and Optical Engineering Structural Materials Surfaces (Physics) Microwaves Materials Infrarotthermographie (DE-588)4242353-3 gnd Prüftechnik (DE-588)4047610-8 gnd Elektronisches Bauelement (DE-588)4014360-0 gnd |
| subject_GND | (DE-588)4242353-3 (DE-588)4047610-8 (DE-588)4014360-0 |
| title | Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials |
| title_auth | Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials |
| title_exact_search | Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials |
| title_full | Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials by Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert |
| title_fullStr | Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials by Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert |
| title_full_unstemmed | Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials by Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert |
| title_short | Lock-in Thermography |
| title_sort | lock in thermography basics and use for evaluating electronic devices and materials |
| title_sub | Basics and Use for Evaluating Electronic Devices and Materials |
| topic | Optics, Lasers, Photonics, Optical Devices Characterization and Evaluation of Materials Microwaves, RF and Optical Engineering Structural Materials Surfaces (Physics) Microwaves Materials Infrarotthermographie (DE-588)4242353-3 gnd Prüftechnik (DE-588)4047610-8 gnd Elektronisches Bauelement (DE-588)4014360-0 gnd |
| topic_facet | Optics, Lasers, Photonics, Optical Devices Characterization and Evaluation of Materials Microwaves, RF and Optical Engineering Structural Materials Surfaces (Physics) Microwaves Materials Infrarotthermographie Prüftechnik Elektronisches Bauelement |
| url | https://doi.org/10.1007/978-3-319-99825-1 |
| work_keys_str_mv | AT breitensteinotwin lockinthermographybasicsanduseforevaluatingelectronicdevicesandmaterials AT wartawilhelm lockinthermographybasicsanduseforevaluatingelectronicdevicesandmaterials AT schubertmartinc lockinthermographybasicsanduseforevaluatingelectronicdevicesandmaterials |