3D TCAD simulation for CMOS nanoeletronic devices:
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Bibliographic Details
Main Authors: Wu, Yung-Chun (Author), Jhan, Yi-Ruei (Author)
Format: Book
Language:English
Published: Singapore Springer [2018]
Subjects:
Online Access:Inhaltstext
Physical Description:xiii, 330 Seiten Illustrationen, Diagramme
ISBN:9789811030659
9811030650

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection! Description