Scanning tunneling potentiometry at nanoscale defects in thin films:
Gespeichert in:
| 1. Verfasser: | |
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| Format: | Abschlussarbeit Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Aachen
Universitätsbibliothek der RWTH Aachen
2018
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| Schlagworte: | |
| Online-Zugang: | Volltext Volltext Volltext |
| Beschreibung: | Online-Ressource |
| Format: | Langzeitarchivierung gewährleistet, LZA |
Internformat
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| 245 | 1 | 0 | |a Scanning tunneling potentiometry at nanoscale defects in thin films |c Felix Lüpke ; Bert Voigtländer, Markus Morgenstern |
| 246 | 1 | 3 | |a Rastertunnelpotentiometrie an nanoskaligen Defekten in dünnen Schichten |
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Datensatz im Suchindex
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| spelling | Lüpke, Felix Verfasser (DE-588)1150544570 aut Scanning tunneling potentiometry at nanoscale defects in thin films Felix Lüpke ; Bert Voigtländer, Markus Morgenstern Rastertunnelpotentiometrie an nanoskaligen Defekten in dünnen Schichten Aachen Universitätsbibliothek der RWTH Aachen 2018 Online-Ressource txt rdacontent c rdamedia cr rdacarrier Dissertation RWTH Aachen University 2017 Langzeitarchivierung gewährleistet, LZA Dünne Schicht (DE-588)4136925-7 gnd rswk-swf Potentiometrie (DE-588)4131212-0 gnd rswk-swf Rastertunnelmikroskopie (DE-588)4252995-5 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Dünne Schicht (DE-588)4136925-7 s Rastertunnelmikroskopie (DE-588)4252995-5 s Potentiometrie (DE-588)4131212-0 s DE-604 Voigtländer, Bert (DE-588)1069225231 dgs Morgenstern, Markus 1966- (DE-588)172893461 dgs https://nbn-resolving.org/urn:nbn:de:101:1-2018071209160394856122 Resolving-System Volltext http://d-nb.info/1162629592/34 Langzeitarchivierung Nationalbibliothek Volltext http://publications.rwth-aachen.de/record/712067 Verlag kostenfrei Volltext |
| spellingShingle | Lüpke, Felix Scanning tunneling potentiometry at nanoscale defects in thin films Dünne Schicht (DE-588)4136925-7 gnd Potentiometrie (DE-588)4131212-0 gnd Rastertunnelmikroskopie (DE-588)4252995-5 gnd |
| subject_GND | (DE-588)4136925-7 (DE-588)4131212-0 (DE-588)4252995-5 (DE-588)4113937-9 |
| title | Scanning tunneling potentiometry at nanoscale defects in thin films |
| title_alt | Rastertunnelpotentiometrie an nanoskaligen Defekten in dünnen Schichten |
| title_auth | Scanning tunneling potentiometry at nanoscale defects in thin films |
| title_exact_search | Scanning tunneling potentiometry at nanoscale defects in thin films |
| title_full | Scanning tunneling potentiometry at nanoscale defects in thin films Felix Lüpke ; Bert Voigtländer, Markus Morgenstern |
| title_fullStr | Scanning tunneling potentiometry at nanoscale defects in thin films Felix Lüpke ; Bert Voigtländer, Markus Morgenstern |
| title_full_unstemmed | Scanning tunneling potentiometry at nanoscale defects in thin films Felix Lüpke ; Bert Voigtländer, Markus Morgenstern |
| title_short | Scanning tunneling potentiometry at nanoscale defects in thin films |
| title_sort | scanning tunneling potentiometry at nanoscale defects in thin films |
| topic | Dünne Schicht (DE-588)4136925-7 gnd Potentiometrie (DE-588)4131212-0 gnd Rastertunnelmikroskopie (DE-588)4252995-5 gnd |
| topic_facet | Dünne Schicht Potentiometrie Rastertunnelmikroskopie Hochschulschrift |
| url | https://nbn-resolving.org/urn:nbn:de:101:1-2018071209160394856122 http://d-nb.info/1162629592/34 http://publications.rwth-aachen.de/record/712067 |
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