APA (7th ed.) Citation

Lüpke, F. (2018). Scanning tunneling potentiometry at nanoscale defects in thin films. Universitätsbibliothek der RWTH Aachen.

Chicago Style (17th ed.) Citation

Lüpke, Felix. Scanning Tunneling Potentiometry at Nanoscale Defects in Thin Films. Aachen: Universitätsbibliothek der RWTH Aachen, 2018.

MLA (9th ed.) Citation

Lüpke, Felix. Scanning Tunneling Potentiometry at Nanoscale Defects in Thin Films. Universitätsbibliothek der RWTH Aachen, 2018.

Warning: These citations may not always be 100% accurate.