Backscattering from multiscale rough surfaces with application to wind scatterometry:
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Bibliographic Details
Main Author: Fung, Adrian K. (Author)
Format: Electronic eBook
Language:English
Published: Boston Artech House 2015
Series:Artech House remote sensing library
Subjects:
Online Access:TUM01
Volltext
Physical Description:1 Online-Ressource
ISBN:9781630810016

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