Model-based testing for embedded systems:
Saved in:
| Other Authors: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Boca Raton
CRC Press
2017
|
| Series: | Computational analysis, synthesis, and design of dynamic systems
|
| Subjects: | |
| Online Access: | Inhaltsverzeichnis |
| Physical Description: | XXVII, 660 Seiten Illustrationen, Diagramme |
| ISBN: | 9781138076457 9781439818459 |
Staff View
MARC
| LEADER | 00000nam a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV045422394 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | t | ||
| 008 | 190123s2017 xxua||| |||| 00||| eng d | ||
| 020 | |a 9781138076457 |c pbk |9 978-1-138-07645-7 | ||
| 020 | |a 9781439818459 |c hbk |9 978-1-4398-1845-9 | ||
| 035 | |a (OCoLC)1083296050 | ||
| 035 | |a (DE-599)BVBBV045422394 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 044 | |a xxu |c US | ||
| 049 | |a DE-473 | ||
| 050 | 0 | |a TK7895.E42 | |
| 082 | 0 | |a 004.1 |2 22 | |
| 084 | |a ST 153 |0 (DE-625)143597: |2 rvk | ||
| 084 | |a ZN 4030 |0 (DE-625)157339: |2 rvk | ||
| 084 | |a ZN 5680 |0 (DE-625)157475: |2 rvk | ||
| 245 | 1 | 0 | |a Model-based testing for embedded systems |c edited by Justyna Zander [und 2 weiteren] |
| 264 | 1 | |a Boca Raton |b CRC Press |c 2017 | |
| 300 | |a XXVII, 660 Seiten |b Illustrationen, Diagramme | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Computational analysis, synthesis, and design of dynamic systems | |
| 650 | 4 | |a Embedded computer systems |x Testing | |
| 650 | 0 | 7 | |a Eingebettetes System |0 (DE-588)4396978-1 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)4143413-4 |a Aufsatzsammlung |2 gnd-content | |
| 689 | 0 | 0 | |a Eingebettetes System |0 (DE-588)4396978-1 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Zander, Justyna |d 1980- |0 (DE-588)1017436118 |4 edt | |
| 856 | 4 | 2 | |m Digitalisierung UB Bamberg - ADAM Catalogue Enrichment |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=030808258&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030808258 | ||
Record in the Search Index
| _version_ | 1804179302990741504 |
|---|---|
| adam_text | Contents
Preface ix
Editors xi
MATLAB Statement xiv
Contributors xv
Technical Review Committee xix
Book Introduction xxi
Part I Introduction
1 A Taxonomy of Model-Based Testing for Embedded Systems
from Multiple Industry Domains 3
Justyna Zander, Ina Schieferdecker, and Pieter J. Mosterman
2 Behavioral System Models versus Models of Testing Strategies
in Functional Test Generation 23
Antti Huima
3 Test Framework Architectures for Model-Based Embedded
System Testing 49
Stephen P. Masticóla and Michael Gall
Part II Automatic Test Generation
4 Automatic Model-Based Test Generation from UML State Machines 77
Stephan Weifileder and Holger Schlingloff
5 Automated Statistical Testing for Embedded Systems 111
Jesse H. Poore, Lan Lin, Robert Eschbach,
and Thomas Bauer
6 How to Design Extended Finite State Machine Test Models in Java 147
Mark Utting
7 Automatic Testing of Lustre/Scade Programs 171
Virginia Papailiopoulou, Besnik Seljimi, and loannis Parissis
8 Test Generation Using Symbolic Animation of Models 195
Frédéric Dadeau, Fabien Peureux, Bruno Legeard, Régis Tissot,
Jacques Julliand, Pierre-Alain Masson, and Fabrice Bouquet
v
VI
Contents
Part III Integration and Multilevel Testing
9 Model-Based Integration Testing with Communication
Sequence Graphs 223
Fevzi Belli, Axel Hollmann, and Sascha Padberg
10 A Model-Based View onto Testing: Criteria for the Derivation
of Entry Tests for Integration Testing 245
Manfred Broy and Alexander Pretschner
11 Multilevel Testing for Embedded Systems 269
Abel Marrero Pérez and Stefan Kaiser
12 Model-Based X-in-the-Loop Testing 299
Jürgen Großmann, Philip Makedonski, Hans- Werner Wiesbrock,
Jaroslav Svacina, Ina Schieferdecker, and Jens Grabowski
Part IV Specific Approaches
13 A Survey of Model-Based Software Product Lines Testing 339
Sebastian Oster, Andreas Wübbeke, Gregor Engels, and Andy Schurr
14 Model-Based Testing of Hybrid Systems 383
Thao Dang
15 Reactive Testing of Nondeterministic Systems by Test Purpose-
Directed Tester 425
Jüri Vain, Andres Kuli, Marko Kääramees, Maili Markvardt,
and Kullo Raiend
16 Model-Based Passive Testing of Safety-Critical Components 453
Stefan Grüner and Bruce Watson
Part V Testing in Industry
17 Applying Model-Based Testing in the Telecommunication Domain 487
Fredrik Abhors, Veli-Matti Aho, Jani Koivulainen, Risto Teittinen,
and Dragos Truscan
18 Model-Based GUI Testing of Smartphone Applications:
Case S60™ and Linux® 525
Antti Jääskeläinen, Tommi Takala, and Mika Katara
19 Model-Based Testing in Embedded Automotive Systems 545
Pawel Skruch, Miroslaw Panek, and Bogdan Kowalczyk
Part VI Testing at the Lower Levels of Development
20 Testing-Based Translation Validation of Generated Code 579
Mirko Conrad
Contents vii
21 Model-Based Testing of Analog Embedded Systems Components 601
Lee Barford
22 Dynamic Verification of SystemC Transactional Models 619
Laurence Pierre and Luca Ferro
Index 639
|
| any_adam_object | 1 |
| author2 | Zander, Justyna 1980- |
| author2_role | edt |
| author2_variant | j z jz |
| author_GND | (DE-588)1017436118 |
| author_facet | Zander, Justyna 1980- |
| building | Verbundindex |
| bvnumber | BV045422394 |
| callnumber-first | T - Technology |
| callnumber-label | TK7895 |
| callnumber-raw | TK7895.E42 |
| callnumber-search | TK7895.E42 |
| callnumber-sort | TK 47895 E42 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ST 153 ZN 4030 ZN 5680 |
| ctrlnum | (OCoLC)1083296050 (DE-599)BVBBV045422394 |
| dewey-full | 004.1 |
| dewey-hundreds | 000 - Computer science, information, general works |
| dewey-ones | 004 - Computer science |
| dewey-raw | 004.1 |
| dewey-search | 004.1 |
| dewey-sort | 14.1 |
| dewey-tens | 000 - Computer science, information, general works |
| discipline | Informatik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01679nam a2200421zc 4500</leader><controlfield tag="001">BV045422394</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">190123s2017 xxua||| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781138076457</subfield><subfield code="c">pbk</subfield><subfield code="9">978-1-138-07645-7</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781439818459</subfield><subfield code="c">hbk</subfield><subfield code="9">978-1-4398-1845-9</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1083296050</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV045422394</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">xxu</subfield><subfield code="c">US</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-473</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7895.E42</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">004.1</subfield><subfield code="2">22</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ST 153</subfield><subfield code="0">(DE-625)143597:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4030</subfield><subfield code="0">(DE-625)157339:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 5680</subfield><subfield code="0">(DE-625)157475:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Model-based testing for embedded systems</subfield><subfield code="c">edited by Justyna Zander [und 2 weiteren]</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boca Raton</subfield><subfield code="b">CRC Press</subfield><subfield code="c">2017</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XXVII, 660 Seiten</subfield><subfield code="b">Illustrationen, Diagramme</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Computational analysis, synthesis, and design of dynamic systems</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Embedded computer systems</subfield><subfield code="x">Testing</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Eingebettetes System</subfield><subfield code="0">(DE-588)4396978-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)4143413-4</subfield><subfield code="a">Aufsatzsammlung</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Eingebettetes System</subfield><subfield code="0">(DE-588)4396978-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Zander, Justyna</subfield><subfield code="d">1980-</subfield><subfield code="0">(DE-588)1017436118</subfield><subfield code="4">edt</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">Digitalisierung UB Bamberg - ADAM Catalogue Enrichment</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=030808258&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030808258</subfield></datafield></record></collection> |
| genre | (DE-588)4143413-4 Aufsatzsammlung gnd-content |
| genre_facet | Aufsatzsammlung |
| id | DE-604.BV045422394 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T08:17:43Z |
| institution | BVB |
| isbn | 9781138076457 9781439818459 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030808258 |
| oclc_num | 1083296050 |
| open_access_boolean | |
| owner | DE-473 DE-BY-UBG |
| owner_facet | DE-473 DE-BY-UBG |
| physical | XXVII, 660 Seiten Illustrationen, Diagramme |
| publishDate | 2017 |
| publishDateSearch | 2017 |
| publishDateSort | 2017 |
| publisher | CRC Press |
| record_format | marc |
| series2 | Computational analysis, synthesis, and design of dynamic systems |
| spelling | Model-based testing for embedded systems edited by Justyna Zander [und 2 weiteren] Boca Raton CRC Press 2017 XXVII, 660 Seiten Illustrationen, Diagramme txt rdacontent n rdamedia nc rdacarrier Computational analysis, synthesis, and design of dynamic systems Embedded computer systems Testing Eingebettetes System (DE-588)4396978-1 gnd rswk-swf (DE-588)4143413-4 Aufsatzsammlung gnd-content Eingebettetes System (DE-588)4396978-1 s DE-604 Zander, Justyna 1980- (DE-588)1017436118 edt Digitalisierung UB Bamberg - ADAM Catalogue Enrichment application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=030808258&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Model-based testing for embedded systems Embedded computer systems Testing Eingebettetes System (DE-588)4396978-1 gnd |
| subject_GND | (DE-588)4396978-1 (DE-588)4143413-4 |
| title | Model-based testing for embedded systems |
| title_auth | Model-based testing for embedded systems |
| title_exact_search | Model-based testing for embedded systems |
| title_full | Model-based testing for embedded systems edited by Justyna Zander [und 2 weiteren] |
| title_fullStr | Model-based testing for embedded systems edited by Justyna Zander [und 2 weiteren] |
| title_full_unstemmed | Model-based testing for embedded systems edited by Justyna Zander [und 2 weiteren] |
| title_short | Model-based testing for embedded systems |
| title_sort | model based testing for embedded systems |
| topic | Embedded computer systems Testing Eingebettetes System (DE-588)4396978-1 gnd |
| topic_facet | Embedded computer systems Testing Eingebettetes System Aufsatzsammlung |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=030808258&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| work_keys_str_mv | AT zanderjustyna modelbasedtestingforembeddedsystems |