Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology
Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading f...
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| Main Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
San Diego
Elsevier Science
2018
|
| Edition: | 2nd ed |
| Series: | Micro & nano technologies
|
| Subjects: | |
| Online Access: | FAW01 FLA01 Volltext |
| Summary: | Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading for particular physical quantities measurements. Each chapter has been revised and updated for this new edition to reflect the progress that has been made in SPM techniques in recent years. New features for this edition include more step-by-step examples, better sample data and more links to related documentation in open source software. Scanning Probe Microscopy (SPM) techniques have the potential to produce information on various local physical properties. Unfortunately, there is still a large gap between what is measured by commercial devices and what could be considered as a quantitative result. This book determines to educate and close that gap. Associated data sets can be downloaded from http://gwyddion.net/qspm/ |
| Item Description: | Description based upon print version of record. - 12.2. Fundamental Phenomena Includes bibliographical references and index |
| Physical Description: | 1 online resource (422 pages) |
| ISBN: | 9780128133484 0128133481 |
Staff View
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| discipline | Allgemeine Naturwissenschaft |
| edition | 2nd ed |
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| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:16:38Z |
| institution | BVB |
| isbn | 9780128133484 0128133481 |
| language | English |
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| spelling | Klapetek, Petr Verfasser aut Quantitative Data Processing in Scanning Probe Microscopy SPM Applications for Nanometrology 2nd ed San Diego Elsevier Science 2018 1 online resource (422 pages) txt rdacontent c rdamedia cr rdacarrier Micro & nano technologies Description based upon print version of record. - 12.2. Fundamental Phenomena Includes bibliographical references and index Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading for particular physical quantities measurements. Each chapter has been revised and updated for this new edition to reflect the progress that has been made in SPM techniques in recent years. New features for this edition include more step-by-step examples, better sample data and more links to related documentation in open source software. Scanning Probe Microscopy (SPM) techniques have the potential to produce information on various local physical properties. Unfortunately, there is still a large gap between what is measured by commercial devices and what could be considered as a quantitative result. This book determines to educate and close that gap. Associated data sets can be downloaded from http://gwyddion.net/qspm/ SCIENCE / General bisacsh Scanning probe microscopy fast Scanning probe microscopy Nanostructures Measurement Rastersondenmikroskopie (DE-588)4330328-6 gnd rswk-swf Rastersondenmikroskopie (DE-588)4330328-6 s 1\p DE-604 Erscheint auch als Druck-Ausgabe 0128133473 Erscheint auch als Druck-Ausgabe 9780128133477 https://www.sciencedirect.com/science/book/9780128133477 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Klapetek, Petr Quantitative Data Processing in Scanning Probe Microscopy SPM Applications for Nanometrology SCIENCE / General bisacsh Scanning probe microscopy fast Scanning probe microscopy Nanostructures Measurement Rastersondenmikroskopie (DE-588)4330328-6 gnd |
| subject_GND | (DE-588)4330328-6 |
| title | Quantitative Data Processing in Scanning Probe Microscopy SPM Applications for Nanometrology |
| title_auth | Quantitative Data Processing in Scanning Probe Microscopy SPM Applications for Nanometrology |
| title_exact_search | Quantitative Data Processing in Scanning Probe Microscopy SPM Applications for Nanometrology |
| title_full | Quantitative Data Processing in Scanning Probe Microscopy SPM Applications for Nanometrology |
| title_fullStr | Quantitative Data Processing in Scanning Probe Microscopy SPM Applications for Nanometrology |
| title_full_unstemmed | Quantitative Data Processing in Scanning Probe Microscopy SPM Applications for Nanometrology |
| title_short | Quantitative Data Processing in Scanning Probe Microscopy |
| title_sort | quantitative data processing in scanning probe microscopy spm applications for nanometrology |
| title_sub | SPM Applications for Nanometrology |
| topic | SCIENCE / General bisacsh Scanning probe microscopy fast Scanning probe microscopy Nanostructures Measurement Rastersondenmikroskopie (DE-588)4330328-6 gnd |
| topic_facet | SCIENCE / General Scanning probe microscopy Nanostructures Measurement Rastersondenmikroskopie |
| url | https://www.sciencedirect.com/science/book/9780128133477 |
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