An engineer's guide to automated testing of high-speed interfaces: = Automated testing of high-speed interfaces
Saved in:
| Main Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Norwood, MA
Artech House
[2016]
|
| Edition: | Second edition |
| Series: | Artech House microwave library
|
| Subjects: | |
| Online Access: | TUM01 |
| Physical Description: | 1 online resource (xxiv, 677 pages) illustrations |
| ISBN: | 9781608079865 |
Staff View
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| 505 | 8 | |a This second edition of An Engineer#x92;s Guide to Automated Testing of High-Speed Interfaces provides updates to reflect current state-of-the-art high-speed digital testing with automated test equipment technology (ATE). Featuring clear examples, this one-stop reference covers all critical aspects of automated testing, including an introduction to high-speed digital basics, a discussion of industry standards, ATE and bench instrumentation for digital applications, and test and measurement techniques for characterization and production environment. Engineers learn how to apply automated test equipment for testing high-speed digital I/O interfaces and gain a better understanding of PCI-Express 4, 100Gb Ethernet, and MIPI while exploring the correlation between phase noise and jitter. This updated resource provides expanded material on 28/32 Gbps NRZ testing and wireless testing that are becoming increasingly more pertinent for future applications. This book explores the current trend of merging high-speed digital testing within the fields of photonic and wireless testing | |
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| any_adam_object | |
| author | Moreira, José |
| author_GND | (DE-588)1048625214 |
| author_facet | Moreira, José |
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| contents | This second edition of An Engineer#x92;s Guide to Automated Testing of High-Speed Interfaces provides updates to reflect current state-of-the-art high-speed digital testing with automated test equipment technology (ATE). Featuring clear examples, this one-stop reference covers all critical aspects of automated testing, including an introduction to high-speed digital basics, a discussion of industry standards, ATE and bench instrumentation for digital applications, and test and measurement techniques for characterization and production environment. Engineers learn how to apply automated test equipment for testing high-speed digital I/O interfaces and gain a better understanding of PCI-Express 4, 100Gb Ethernet, and MIPI while exploring the correlation between phase noise and jitter. This updated resource provides expanded material on 28/32 Gbps NRZ testing and wireless testing that are becoming increasingly more pertinent for future applications. This book explores the current trend of merging high-speed digital testing within the fields of photonic and wireless testing |
| ctrlnum | (ZDB-4-ENC)ocn986606908 (OCoLC)986606908 (DE-599)BVBBV045346034 |
| dewey-full | 621.381548 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381548 |
| dewey-search | 621.381548 |
| dewey-sort | 3621.381548 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| edition | Second edition |
| format | Electronic eBook |
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| id | DE-604.BV045346034 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T08:15:34Z |
| institution | BVB |
| isbn | 9781608079865 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030732738 |
| oclc_num | 986606908 |
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| owner_facet | DE-91 DE-BY-TUM |
| physical | 1 online resource (xxiv, 677 pages) illustrations |
| psigel | ZDB-203-AHO ZDB-4-ENC ZDB-203-AHO TUM_Paketkauf |
| publishDate | 2016 |
| publishDateSearch | 2016 |
| publishDateSort | 2016 |
| publisher | Artech House |
| record_format | marc |
| series2 | Artech House microwave library |
| spelling | Moreira, José Verfasser aut An engineer's guide to automated testing of high-speed interfaces = Automated testing of high-speed interfaces Jose Moreira, Hubert Werkmann Guide to automated testing of high-speed interfaces Automated testing of high-speed interfaces Second edition Norwood, MA Artech House [2016] 2016 1 online resource (xxiv, 677 pages) illustrations txt rdacontent c rdamedia cr rdacarrier Artech House microwave library This second edition of An Engineer#x92;s Guide to Automated Testing of High-Speed Interfaces provides updates to reflect current state-of-the-art high-speed digital testing with automated test equipment technology (ATE). Featuring clear examples, this one-stop reference covers all critical aspects of automated testing, including an introduction to high-speed digital basics, a discussion of industry standards, ATE and bench instrumentation for digital applications, and test and measurement techniques for characterization and production environment. Engineers learn how to apply automated test equipment for testing high-speed digital I/O interfaces and gain a better understanding of PCI-Express 4, 100Gb Ethernet, and MIPI while exploring the correlation between phase noise and jitter. This updated resource provides expanded material on 28/32 Gbps NRZ testing and wireless testing that are becoming increasingly more pertinent for future applications. This book explores the current trend of merging high-speed digital testing within the fields of photonic and wireless testing TECHNOLOGY & ENGINEERING / Mechanical bisacsh Automatic test equipment fast Integrated circuits / Testing fast Very high speed integrated circuits fast Integrated circuits Testing Automatic test equipment Very high speed integrated circuits Werkmann, Hubert Sonstige (DE-588)1048625214 oth Erscheint auch als Druck-Ausgabe 978-1-60807-985-8 |
| spellingShingle | Moreira, José An engineer's guide to automated testing of high-speed interfaces = Automated testing of high-speed interfaces This second edition of An Engineer#x92;s Guide to Automated Testing of High-Speed Interfaces provides updates to reflect current state-of-the-art high-speed digital testing with automated test equipment technology (ATE). Featuring clear examples, this one-stop reference covers all critical aspects of automated testing, including an introduction to high-speed digital basics, a discussion of industry standards, ATE and bench instrumentation for digital applications, and test and measurement techniques for characterization and production environment. Engineers learn how to apply automated test equipment for testing high-speed digital I/O interfaces and gain a better understanding of PCI-Express 4, 100Gb Ethernet, and MIPI while exploring the correlation between phase noise and jitter. This updated resource provides expanded material on 28/32 Gbps NRZ testing and wireless testing that are becoming increasingly more pertinent for future applications. This book explores the current trend of merging high-speed digital testing within the fields of photonic and wireless testing TECHNOLOGY & ENGINEERING / Mechanical bisacsh Automatic test equipment fast Integrated circuits / Testing fast Very high speed integrated circuits fast Integrated circuits Testing Automatic test equipment Very high speed integrated circuits |
| title | An engineer's guide to automated testing of high-speed interfaces = Automated testing of high-speed interfaces |
| title_alt | Guide to automated testing of high-speed interfaces Automated testing of high-speed interfaces |
| title_auth | An engineer's guide to automated testing of high-speed interfaces = Automated testing of high-speed interfaces |
| title_exact_search | An engineer's guide to automated testing of high-speed interfaces = Automated testing of high-speed interfaces |
| title_full | An engineer's guide to automated testing of high-speed interfaces = Automated testing of high-speed interfaces Jose Moreira, Hubert Werkmann |
| title_fullStr | An engineer's guide to automated testing of high-speed interfaces = Automated testing of high-speed interfaces Jose Moreira, Hubert Werkmann |
| title_full_unstemmed | An engineer's guide to automated testing of high-speed interfaces = Automated testing of high-speed interfaces Jose Moreira, Hubert Werkmann |
| title_short | An engineer's guide to automated testing of high-speed interfaces |
| title_sort | an engineer s guide to automated testing of high speed interfaces automated testing of high speed interfaces |
| title_sub | = Automated testing of high-speed interfaces |
| topic | TECHNOLOGY & ENGINEERING / Mechanical bisacsh Automatic test equipment fast Integrated circuits / Testing fast Very high speed integrated circuits fast Integrated circuits Testing Automatic test equipment Very high speed integrated circuits |
| topic_facet | TECHNOLOGY & ENGINEERING / Mechanical Automatic test equipment Integrated circuits / Testing Very high speed integrated circuits Integrated circuits Testing Automatic test equipment Very high speed integrated circuits |
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