Secondary ion mass spectrometry: applications for depth profiling and surface characterization
Saved in:
| Main Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
New York, [New York] (222 East 46th Street, New York, NY 10017)
Momentum Press
2016
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| Series: | Materials characterization and analysis collection
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| Subjects: | |
| Online Access: | FWS01 FWS02 |
| Item Description: | Appendix -- Index Title from PDF title page (viewed on December 9, 2015) |
| Physical Description: | 1 online resource (1 PDF (xx, 262 pages) :) illustrations |
| ISBN: | 9781606505892 1606505890 |
Staff View
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| 505 | 8 | |a Secondary ion mass spectrometry (SIMS) is a mass spectrometric technique for solid materials that can provide elemental analysis at parts per million sensitivity and lateral resolution of 50 nm. When those capabilities are combined with the ability to provide that analysis as a function of depth, SIMS has proved to be a valued technique for a wide range of applications. This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace the development of SIMS and help understand the technique | |
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| contents | Secondary ion mass spectrometry (SIMS) is a mass spectrometric technique for solid materials that can provide elemental analysis at parts per million sensitivity and lateral resolution of 50 nm. When those capabilities are combined with the ability to provide that analysis as a function of depth, SIMS has proved to be a valued technique for a wide range of applications. This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace the development of SIMS and help understand the technique |
| ctrlnum | (ZDB-4-ENC)ocn932525902 (OCoLC)932525902 (DE-599)BVBBV045345778 |
| dewey-full | 543.0873 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 543 - Analytical chemistry |
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| dewey-search | 543.0873 |
| dewey-sort | 3543.0873 |
| dewey-tens | 540 - Chemistry and allied sciences |
| discipline | Chemie / Pharmazie |
| format | Electronic eBook |
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| id | DE-604.BV045345778 |
| illustrated | Illustrated |
| indexdate | 2025-02-20T06:58:58Z |
| institution | BVB |
| isbn | 9781606505892 1606505890 |
| language | English |
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| publishDate | 2016 |
| publishDateSearch | 2016 |
| publishDateSort | 2016 |
| publisher | Momentum Press |
| record_format | marc |
| series2 | Materials characterization and analysis collection |
| spellingShingle | Stevie, F. A. Secondary ion mass spectrometry applications for depth profiling and surface characterization Secondary ion mass spectrometry (SIMS) is a mass spectrometric technique for solid materials that can provide elemental analysis at parts per million sensitivity and lateral resolution of 50 nm. When those capabilities are combined with the ability to provide that analysis as a function of depth, SIMS has proved to be a valued technique for a wide range of applications. This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace the development of SIMS and help understand the technique SCIENCE / Chemistry / Analytic bisacsh Secondary ion mass spectrometry fast Secondary ion mass spectrometry |
| title | Secondary ion mass spectrometry applications for depth profiling and surface characterization |
| title_auth | Secondary ion mass spectrometry applications for depth profiling and surface characterization |
| title_exact_search | Secondary ion mass spectrometry applications for depth profiling and surface characterization |
| title_full | Secondary ion mass spectrometry applications for depth profiling and surface characterization Fred A. Stevie |
| title_fullStr | Secondary ion mass spectrometry applications for depth profiling and surface characterization Fred A. Stevie |
| title_full_unstemmed | Secondary ion mass spectrometry applications for depth profiling and surface characterization Fred A. Stevie |
| title_short | Secondary ion mass spectrometry |
| title_sort | secondary ion mass spectrometry applications for depth profiling and surface characterization |
| title_sub | applications for depth profiling and surface characterization |
| topic | SCIENCE / Chemistry / Analytic bisacsh Secondary ion mass spectrometry fast Secondary ion mass spectrometry |
| topic_facet | SCIENCE / Chemistry / Analytic Secondary ion mass spectrometry |
| work_keys_str_mv | AT steviefa secondaryionmassspectrometryapplicationsfordepthprofilingandsurfacecharacterization |