Advanced Measurement and Test IV:
Gespeichert in:
| Körperschaft: | |
|---|---|
| Weitere Verfasser: | , |
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Zurich
Trans Tech Publications
2015
|
| Schriftenreihe: | Advanced materials research
v. 1083 |
| Schlagworte: | |
| Beschreibung: | Print version record. - Testing Level Measurement Devices by Imitating Sensor Signals |
| Beschreibung: | 1 online resource (224 pages) illustrations (some color) |
| ISBN: | 9783038267591 3038267597 |
Internformat
MARC
| LEADER | 00000nmm a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV045345604 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 181206s2015 |||| o||u| ||||||eng d | ||
| 020 | |a 9783038267591 |9 978-3-03826-759-1 | ||
| 020 | |a 3038267597 |9 3-03826-759-7 | ||
| 035 | |a (ZDB-4-ENC)ocn903858618 | ||
| 035 | |a (OCoLC)903858618 | ||
| 035 | |a (DE-599)BVBBV045345604 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 082 | 0 | |a 620 | |
| 110 | 2 | |a International Conference on Advanced Measurement and Test < 2014, Wuhan, China> |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Advanced Measurement and Test IV |c edited by Ankdrew Parvel and Andy Wu |
| 264 | 1 | |a Zurich |b Trans Tech Publications |c 2015 | |
| 300 | |a 1 online resource (224 pages) |b illustrations (some color) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Advanced materials research |v v. 1083 | |
| 500 | |a Print version record. - Testing Level Measurement Devices by Imitating Sensor Signals | ||
| 505 | 8 | |a Collection of selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China. The 37 papers are grouped as follows: Chapter 1: Materials Science; Chapter 2: Material Processing and Testing Technology; Chapter 3: Monitoring, Detection, Testing and Measurement Systems and Technologies | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Engineering (General) |2 bisacsh | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Reference |2 bisacsh | |
| 650 | 7 | |a Engineering instruments |2 fast | |
| 650 | 7 | |a Materials / Testing |2 fast | |
| 650 | 7 | |a Measurement |2 fast | |
| 650 | 7 | |a Testing / Equipment and supplies |2 fast | |
| 650 | 4 | |a Engineering instruments |v Congresses |a Materials |x Testing |v Congresses |a Measurement |v Congresses |a Testing |x Equipment and supplies |v Congresses | |
| 700 | 1 | |a Parvel, Ankdrew |4 edt | |
| 700 | 1 | |a Wu, Andy |4 edt | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |a Parvel, Ankdrew |t Advanced Measurement and Test IV. |d Zurich : Trans Tech Publishers, 2015 |z 9783038353744 |
| 912 | |a ZDB-4-ENC | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030732307 | ||
Datensatz im Suchindex
| _version_ | 1804179166569955328 |
|---|---|
| any_adam_object | |
| author2 | Parvel, Ankdrew Wu, Andy |
| author2_role | edt edt |
| author2_variant | a p ap a w aw |
| author_corporate | International Conference on Advanced Measurement and Test < 2014, Wuhan, China> |
| author_corporate_role | aut |
| author_facet | Parvel, Ankdrew Wu, Andy International Conference on Advanced Measurement and Test < 2014, Wuhan, China> |
| author_sort | International Conference on Advanced Measurement and Test < 2014, Wuhan, China> |
| building | Verbundindex |
| bvnumber | BV045345604 |
| collection | ZDB-4-ENC |
| contents | Collection of selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China. The 37 papers are grouped as follows: Chapter 1: Materials Science; Chapter 2: Material Processing and Testing Technology; Chapter 3: Monitoring, Detection, Testing and Measurement Systems and Technologies |
| ctrlnum | (ZDB-4-ENC)ocn903858618 (OCoLC)903858618 (DE-599)BVBBV045345604 |
| dewey-full | 620 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620 |
| dewey-search | 620 |
| dewey-sort | 3620 |
| dewey-tens | 620 - Engineering and allied operations |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02185nmm a2200445zcb4500</leader><controlfield tag="001">BV045345604</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">181206s2015 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783038267591</subfield><subfield code="9">978-3-03826-759-1</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">3038267597</subfield><subfield code="9">3-03826-759-7</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-4-ENC)ocn903858618</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)903858618</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV045345604</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">620</subfield></datafield><datafield tag="110" ind1="2" ind2=" "><subfield code="a">International Conference on Advanced Measurement and Test < 2014, Wuhan, China></subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Advanced Measurement and Test IV</subfield><subfield code="c">edited by Ankdrew Parvel and Andy Wu</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Zurich</subfield><subfield code="b">Trans Tech Publications</subfield><subfield code="c">2015</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (224 pages)</subfield><subfield code="b">illustrations (some color)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Advanced materials research</subfield><subfield code="v">v. 1083</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Print version record. - Testing Level Measurement Devices by Imitating Sensor Signals</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">Collection of selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China. The 37 papers are grouped as follows: Chapter 1: Materials Science; Chapter 2: Material Processing and Testing Technology; Chapter 3: Monitoring, Detection, Testing and Measurement Systems and Technologies</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY & ENGINEERING / Engineering (General)</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY & ENGINEERING / Reference</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Engineering instruments</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Materials / Testing</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Measurement</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Testing / Equipment and supplies</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering instruments</subfield><subfield code="v">Congresses</subfield><subfield code="a">Materials</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield><subfield code="a">Measurement</subfield><subfield code="v">Congresses</subfield><subfield code="a">Testing</subfield><subfield code="x">Equipment and supplies</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Parvel, Ankdrew</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Wu, Andy</subfield><subfield code="4">edt</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="a">Parvel, Ankdrew</subfield><subfield code="t">Advanced Measurement and Test IV.</subfield><subfield code="d">Zurich : Trans Tech Publishers, 2015</subfield><subfield code="z">9783038353744</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-4-ENC</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030732307</subfield></datafield></record></collection> |
| id | DE-604.BV045345604 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T08:15:33Z |
| institution | BVB |
| isbn | 9783038267591 3038267597 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030732307 |
| oclc_num | 903858618 |
| open_access_boolean | |
| physical | 1 online resource (224 pages) illustrations (some color) |
| psigel | ZDB-4-ENC |
| publishDate | 2015 |
| publishDateSearch | 2015 |
| publishDateSort | 2015 |
| publisher | Trans Tech Publications |
| record_format | marc |
| series2 | Advanced materials research |
| spelling | International Conference on Advanced Measurement and Test < 2014, Wuhan, China> Verfasser aut Advanced Measurement and Test IV edited by Ankdrew Parvel and Andy Wu Zurich Trans Tech Publications 2015 1 online resource (224 pages) illustrations (some color) txt rdacontent c rdamedia cr rdacarrier Advanced materials research v. 1083 Print version record. - Testing Level Measurement Devices by Imitating Sensor Signals Collection of selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China. The 37 papers are grouped as follows: Chapter 1: Materials Science; Chapter 2: Material Processing and Testing Technology; Chapter 3: Monitoring, Detection, Testing and Measurement Systems and Technologies TECHNOLOGY & ENGINEERING / Engineering (General) bisacsh TECHNOLOGY & ENGINEERING / Reference bisacsh Engineering instruments fast Materials / Testing fast Measurement fast Testing / Equipment and supplies fast Engineering instruments Congresses Materials Testing Congresses Measurement Congresses Testing Equipment and supplies Congresses Parvel, Ankdrew edt Wu, Andy edt Erscheint auch als Druck-Ausgabe Parvel, Ankdrew Advanced Measurement and Test IV. Zurich : Trans Tech Publishers, 2015 9783038353744 |
| spellingShingle | Advanced Measurement and Test IV Collection of selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China. The 37 papers are grouped as follows: Chapter 1: Materials Science; Chapter 2: Material Processing and Testing Technology; Chapter 3: Monitoring, Detection, Testing and Measurement Systems and Technologies TECHNOLOGY & ENGINEERING / Engineering (General) bisacsh TECHNOLOGY & ENGINEERING / Reference bisacsh Engineering instruments fast Materials / Testing fast Measurement fast Testing / Equipment and supplies fast Engineering instruments Congresses Materials Testing Congresses Measurement Congresses Testing Equipment and supplies Congresses |
| title | Advanced Measurement and Test IV |
| title_auth | Advanced Measurement and Test IV |
| title_exact_search | Advanced Measurement and Test IV |
| title_full | Advanced Measurement and Test IV edited by Ankdrew Parvel and Andy Wu |
| title_fullStr | Advanced Measurement and Test IV edited by Ankdrew Parvel and Andy Wu |
| title_full_unstemmed | Advanced Measurement and Test IV edited by Ankdrew Parvel and Andy Wu |
| title_short | Advanced Measurement and Test IV |
| title_sort | advanced measurement and test iv |
| topic | TECHNOLOGY & ENGINEERING / Engineering (General) bisacsh TECHNOLOGY & ENGINEERING / Reference bisacsh Engineering instruments fast Materials / Testing fast Measurement fast Testing / Equipment and supplies fast Engineering instruments Congresses Materials Testing Congresses Measurement Congresses Testing Equipment and supplies Congresses |
| topic_facet | TECHNOLOGY & ENGINEERING / Engineering (General) TECHNOLOGY & ENGINEERING / Reference Engineering instruments Materials / Testing Measurement Testing / Equipment and supplies Engineering instruments Congresses Materials Testing Congresses Measurement Congresses Testing Equipment and supplies Congresses |
| work_keys_str_mv | AT internationalconferenceonadvancedmeasurementandtest2014wuhanchina advancedmeasurementandtestiv AT parvelankdrew advancedmeasurementandtestiv AT wuandy advancedmeasurementandtestiv |