ISTFA 2001: proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California = Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Materials Park, OH
ASM International
2001
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| Schlagworte: | |
| Beschreibung: | Print version record |
| Beschreibung: | 1 online resource (xix, 485 pages) illustrations |
| ISBN: | 9781615030859 1615030859 |
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Datensatz im Suchindex
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| spelling | International Symposium for Testing and Failure Analysis < 2001, Santa Clara, Calif.> Verfasser aut ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California = Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis sponsored by EDFAS. Proceedings of the 27th International Symposium or Testing and Failure Analysis Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis Materials Park, OH ASM International 2001 1 online resource (xix, 485 pages) illustrations txt rdacontent c rdamedia cr rdacarrier Print version record TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Elektronik (DE-588)4014346-6 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf 1\p (DE-588)1071861417 Konferenzschrift gnd-content Elektronik (DE-588)4014346-6 s Prüftechnik (DE-588)4047610-8 s DE-604 ASM International Sonstige oth Electronic Device Failure Analysis Society Sonstige oth Erscheint auch als Druck-Ausgabe International Symposium for Testing and Failure Analysis (27th : 2001 : Santa Clara, Calif.) ISTFA 2001 Materials Park, Ohio : ASM International, 2001 0871707462 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California = Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Elektronik (DE-588)4014346-6 gnd Prüftechnik (DE-588)4047610-8 gnd |
| subject_GND | (DE-588)4014346-6 (DE-588)4047610-8 (DE-588)1071861417 |
| title | ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California = Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis |
| title_alt | Proceedings of the 27th International Symposium or Testing and Failure Analysis Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis |
| title_auth | ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California = Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis |
| title_exact_search | ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California = Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis |
| title_full | ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California = Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis sponsored by EDFAS. |
| title_fullStr | ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California = Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis sponsored by EDFAS. |
| title_full_unstemmed | ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California = Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis sponsored by EDFAS. |
| title_short | ISTFA 2001 |
| title_sort | istfa 2001 proceedings of the 27th international symposium for testing and failure analysis 11 15 november 2001 santa clara convention center santa clara california conference proceedings from the 27th international symposium for testing and failure analysis |
| title_sub | proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California = Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Elektronik (DE-588)4014346-6 gnd Prüftechnik (DE-588)4047610-8 gnd |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Circuits / General TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated Electronic apparatus and appliances / Testing Electronics / Materials / Testing Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Elektronik Prüftechnik Konferenzschrift |
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